GERARDIN, SIMONE

GERARDIN, SIMONE  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 203 (tempo di esecuzione: 0.028 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
1GigaRad TID impact on 28nm HEP analog circuits 2017 Gerardin, S.Mattiazzo, S.Paccagnella, A.De Matteis, M. + - - PRIME 2017 - 13th Conference on PhD Research in Microelectronics and Electronics, Proceedings
1GigaRad TID impact on 28 nm HEP analog circuits 2018 Gerardin, S.Mattiazzo, S.Paccagnella, A. + INTEGRATION - -
65 nm technology for HEP: Status and perspective 2014 BAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENADING, LILIGERARDIN, SIMONEGIUBILATO, PIERONEVIANI, ANDREAPACCAGNELLA, ALESSANDROVOGRIG, DANIELE + POS PROCEEDINGS OF SCIENCE - Proceedings of Science
A comprehensive reliability evaluation of high-performance AlGaN/GaN HEMTs for space applications 2016 DE SANTI, CARLODALCANALE, STEFANOSTOCCO, ANTONIORAMPAZZO, FABIANAGERARDIN, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - proc. of the 8th Wide Bandgap Semiconductors and Components Workshop
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories 2021 Gerardin S.Bagatin M.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Heavy-Ion Detector Based on 3-D NAND Flash Memories 2020 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A low cost robust radiation hardened flip-flop circuit 2017 Gerardin, S.Bagatin, M. + - - IEEE Region 10 Annual International Conference, Proceedings/TENCON
A Multi-Megarad, Radiation Hardened by Design 512 kbit SRAM in CMOS Technology 2010 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - 2010 INTERNATIONAL CONFERENCE ON MICROELECTRONICS
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility 2007 MANUZZATO, ANDREAGERARDIN, SIMONERECH, PAOLOBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Statistical Approach to Microdose Induced Degradation in FinFET Devices 2009 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Study on the Short- and Long-Term Effects of X-Ray Exposure on NAND Flash Memories 2011 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + - - 2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
Accelerated testing of RF-MEMS contact degradation through radiation sources 2010 TAZZOLI, AUGUSTOBARBATO, MARCOGILIBERTO, VALENTINAGERARDIN, SIMONENICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology 2020 Abhishek JainS. GerardinM. Bagatin + - - Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology
Alpha-induced soft errors in Floating Gate flash memories 2012 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - Conference Proceedings
Analysis of TID failure modes in SRAM-based FPGA based on gamma-ray and synchrotron X-ray irradiation 2013 PACCAGNELLA, ALESSANDROGERARDIN, SIMONEBAGATIN, MARTA + - - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation 2014 PACCAGNELLA, ALESSANDROGERARDIN, SIMONEBAGATIN, MARTA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs 2010 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Angular and strain dependence of heavy-ions induced degradation in SOI FinFETs2009 European Conference on Radiation and Its Effects on Components and Systems 2009 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + - - Proceedings of 2009 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories 2011 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Annealing of heavy-ion induced floating gate errors: LET and feature size dependence 2009 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - 2009 European Conference on Radiation and Its Effects on Components and Systems