GERARDIN, SIMONE

GERARDIN, SIMONE  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 201 (tempo di esecuzione: 0.031 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Degradation of Low Frequency Noise and DC characteristics on MOSFETs and its correlation with SILC 2003 CESTER, ANDREAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - European Solid-state Device Research Conference - ESSDERC 2003
MOSFET drain current reduction under Fowler-Nordheim and channel hot carrier injection before gate oxide breakdown 2004 GERARDIN, SIMONECESTER, ANDREAA. PACCAGNELLA + MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING - -
Drain Current Decrease in MOSFETs After Heavy Ion Irradiation 2004 CESTER, ANDREAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Role of SILC related traps on channel degradation and drain current noise 2004 CESTER, ANDREAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - Proceedings of the 5th European Workshop on ULtimate Integration of Silicon - ULIS 2004
Impact of 24-GeV proton irradiation on 0.13-µm CMOS devices 2005 GERARDIN, SIMONECESTER, ANDREAPACCAGNELLA, ALESSANDROBISELLO, DARIO + - ESA SP Radiation and Its Effects on Components and Systems, 2005.
Electrical Stresses on Ultra-Thin Gate Oxide SOI MOSFETs after Irradiation 2005 CESTER, ANDREAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Heavy Ion Damage in Ultra-Thin Gate Oxide SOI MOSFETs 2005 CESTER, ANDREAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - ESA SP Radiation and Its Effects on Components and Systems, 2005.
Modeling MOSFET and circuit degradation through SPICE 2005 CESTER, ANDREAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - Proceedings of 35th European Solid-State Device Research Conference
Impact of Fowler-Nordheim and channel hot carrier stresses on MOSFETs with 2.2nm gate oxide 2005 GERARDIN, SIMONECESTER, ANDREAPACCAGNELLA, ALESSANDRO + MICROELECTRONIC ENGINEERING - -
ESD induced damage on ultra-thin gate oxide MOSFETs and its impact on device reliability 2005 CESTER, ANDREAGERARDIN, SIMONETAZZOLI, AUGUSTOPACCAGNELLA, ALESSANDROZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - 2005 IEEE International Reliability Physics Symposium Proceedings
Radiation-Induced Breakdown in 1.7 nm Oxynitrided Gate Oxides 2005 GERARDIN, SIMONECESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Impact of 2-MeV Alpha Irradiation on AlGaN/GaN High Electron Mobility Transistors 2006 ZANON, FRANCODANESIN, FRANCESCAGERARDIN, SIMONERAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICOPACCAGNELLA, ALESSANDRO - - 30th Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2006
Impact of Heavy-Ion Strikes on Minimum-Size MOSFETs With Ultra-Thin Gate Oxide 2006 GERARDIN, SIMONEBAGATIN, MARTACESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Degradation induced by 2-MeV alpha particles on AlGaN/GaN High Electron Mobility Transistors 2006 DANESIN, FRANCESCAZANON, FRANCOGERARDIN, SIMONERAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICOPACCAGNELLA, ALESSANDRO MICROELECTRONICS RELIABILITY - -
Impact of 24-GeV proton irradiation on 0.13-um CMOS devices 2006 GERARDIN, SIMONECESTER, ANDREAPACCAGNELLA, ALESSANDROBISELLO, DARIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Electrostatic discharge effects in ultrathin gate oxide MOSFETs 2006 CESTER, ANDREAGERARDIN, SIMONETAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress 2006 GERARDIN, SIMONECESTER, ANDREAPACCAGNELLA, ALESSANDRO + MICROELECTRONICS RELIABILITY - -
Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques 2007 GERARDIN, SIMONECESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs With Ultra-Thin Gate Oxide 2007 GERARDIN, SIMONEGRIFFONI, ALESSIOTAZZOLI, AUGUSTOCESTER, ANDREAMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO - - 44th IEEE - Nuclear and Space radiation Effects Conference - NSREC 2007
Total Ionizing Dose Effects in 130-nm commercial CMOS technologies for HEP experiments 2007 SILVESTRI, MARCOGERARDIN, SIMONE + NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT - -