BAGATIN, MARTA

BAGATIN, MARTA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 131 (tempo di esecuzione: 0.068 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
65 nm technology for HEP: Status and perspective 2014 BAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENADING, LILIGERARDIN, SIMONEGIUBILATO, PIERONEVIANI, ANDREAPACCAGNELLA, ALESSANDROVOGRIG, DANIELE + POS PROCEEDINGS OF SCIENCE - Proceedings of Science
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories 2021 Gerardin S.Bagatin M.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Heavy-Ion Detector Based on 3-D NAND Flash Memories 2020 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A low cost robust radiation hardened flip-flop circuit 2017 Gerardin, S.Bagatin, M. + - - IEEE Region 10 Annual International Conference, Proceedings/TENCON
A Multi-Megarad, Radiation Hardened by Design 512 kbit SRAM in CMOS Technology 2010 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - 2010 INTERNATIONAL CONFERENCE ON MICROELECTRONICS
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility 2007 MANUZZATO, ANDREAGERARDIN, SIMONERECH, PAOLOBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Study on the Short- and Long-Term Effects of X-Ray Exposure on NAND Flash Memories 2011 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + - - 2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology 2020 Abhishek JainS. GerardinM. Bagatin + - - Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology
Alpha-induced soft errors in Floating Gate flash memories 2012 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - Conference Proceedings
Analysis of TID failure modes in SRAM-based FPGA based on gamma-ray and synchrotron X-ray irradiation 2013 PACCAGNELLA, ALESSANDROGERARDIN, SIMONEBAGATIN, MARTA + - - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation 2014 PACCAGNELLA, ALESSANDROGERARDIN, SIMONEBAGATIN, MARTA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories 2011 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Annealing of heavy-ion induced floating gate errors: LET and feature size dependence 2009 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - 2009 European Conference on Radiation and Its Effects on Components and Systems
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence 2010 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Assessing SRAM sensitivity to ionizing radiation through a low-energy accelerator 2006 M. BagatinCESTER, ANDREAA. Paccagnella + - - Laboratori Nazionali di Legnaro – Annual Report 2006
Atmospheric Neutron Soft Errors in 3D NAND Flash Memories 2019 Bagatin, M.Gerardin, S.Paccagnella, A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Atmospheric-like neutron attenuation during accelerated neutron testing with multiple printed circuit boards 2018 Bagatin, MartaGerardin, Simone + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories? 2009 CELLERE, GIORGIOGERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE ELECTRON DEVICE LETTERS - -
Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories 2010 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Characterizing High-Energy Ion Beams with PIPS Detectors 2020 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -