Single event gate rupture in 130-nm CMOS transistor arrays subjected to X-ray irradiation

Silvestri, Marco; Gerardin, Simone; Faccio, Federico; Paccagnella, Alessandro

doi:10.1109/RADECS.2009.5994565

Single event gate rupture in 130-nm CMOS transistor arrays subjected to X-ray irradiation

SILVESTRI, MARCO;GERARDIN, SIMONE;Faccio, Federico;PACCAGNELLA, ALESSANDRO

2009

Scheda breve

Scheda completa

Scheda completa (DC)

	Anno
	
				2009
			
	Titolo del Libro
	
				Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
			
	Titolo convegno
	
				2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
			
	Codice DOI
	
				https://dx.doi.org/10.1109/RADECS.2009.5994565
			
	Codice WOS
	
				WOS:000283074500015
			
	Codice Scopus
	
				2-s2.0-80052759328
			
	Codice ISBN
	
				9781457704932
9781457704932
			
	Appare nelle tipologie:
	
				04.01 - Contributo in atti di convegno