DING, LILI
 Distribuzione geografica
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Continente #
NA - Nord America 1.090
AS - Asia 636
EU - Europa 362
SA - Sud America 102
AF - Africa 91
OC - Oceania 13
Continente sconosciuto - Info sul continente non disponibili 8
Totale 2.302
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Nazione #
US - Stati Uniti d'America 1.027
SG - Singapore 202
CN - Cina 143
VN - Vietnam 99
IT - Italia 81
BR - Brasile 60
HK - Hong Kong 45
SE - Svezia 35
DE - Germania 27
FI - Finlandia 24
PL - Polonia 22
FR - Francia 19
BD - Bangladesh 17
GB - Regno Unito 15
ES - Italia 13
GR - Grecia 13
IN - India 12
CA - Canada 10
JP - Giappone 10
NL - Olanda 10
UA - Ucraina 10
AR - Argentina 9
IE - Irlanda 9
IQ - Iraq 9
AE - Emirati Arabi Uniti 8
ID - Indonesia 8
RU - Federazione Russa 8
EC - Ecuador 7
PH - Filippine 7
TR - Turchia 7
VE - Venezuela 7
ET - Etiopia 6
JM - Giamaica 6
KR - Corea 6
NP - Nepal 6
SO - Somalia 6
CL - Cile 5
CU - Cuba 5
CZ - Repubblica Ceca 5
EE - Estonia 5
HU - Ungheria 5
MX - Messico 5
NZ - Nuova Zelanda 5
SI - Slovenia 5
XK - ???statistics.table.value.countryCode.XK??? 5
ZA - Sudafrica 5
AL - Albania 4
AO - Angola 4
AT - Austria 4
AU - Australia 4
AZ - Azerbaigian 4
BA - Bosnia-Erzegovina 4
BE - Belgio 4
BZ - Belize 4
CD - Congo 4
CH - Svizzera 4
DO - Repubblica Dominicana 4
GH - Ghana 4
HR - Croazia 4
JO - Giordania 4
LA - Repubblica Popolare Democratica del Laos 4
LC - Santa Lucia 4
MK - Macedonia 4
MN - Mongolia 4
NG - Nigeria 4
PR - Porto Rico 4
TN - Tunisia 4
UY - Uruguay 4
UZ - Uzbekistan 4
YE - Yemen 4
BJ - Benin 3
BY - Bielorussia 3
CG - Congo 3
CO - Colombia 3
CV - Capo Verde 3
CW - ???statistics.table.value.countryCode.CW??? 3
EG - Egitto 3
GP - Guadalupe 3
HT - Haiti 3
IS - Islanda 3
KH - Cambogia 3
KZ - Kazakistan 3
MA - Marocco 3
MD - Moldavia 3
MG - Madagascar 3
MZ - Mozambico 3
NC - Nuova Caledonia 3
PA - Panama 3
PS - Palestinian Territory 3
PT - Portogallo 3
RW - Ruanda 3
SA - Arabia Saudita 3
TJ - Tagikistan 3
TT - Trinidad e Tobago 3
UG - Uganda 3
BB - Barbados 2
BG - Bulgaria 2
BW - Botswana 2
DM - Dominica 2
DZ - Algeria 2
Totale 2.234
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Città #
Ashburn 127
Fairfield 127
Singapore 117
San Jose 104
Woodbridge 91
Houston 80
Seattle 51
Cambridge 50
Ann Arbor 46
Hong Kong 43
Beijing 35
Wilmington 35
Ho Chi Minh City 29
Hanoi 24
Padova 23
Bytom 17
Santa Clara 16
Los Angeles 15
Boardman 14
San Diego 14
Munich 13
Chandler 12
Jacksonville 12
Medford 11
Princeton 11
Chicago 10
Lauterbourg 10
Milan 9
New York 9
Des Moines 8
Dublin 8
Mestre 8
Tokyo 8
Da Nang 7
Guangzhou 7
Helsinki 7
Orem 7
Turku 7
Haiphong 6
Shanghai 6
Washington 6
Buffalo 5
Changsha 5
Denver 5
Dong Ket 5
Florence 5
Havana 5
Nanjing 5
Nuremberg 5
Rome 5
São Paulo 5
Tallinn 5
Abu Dhabi 4
Accra 4
Addis Ababa 4
Amman 4
Baku 4
Castries 4
Kinshasa 4
Luanda 4
Madrid 4
Montevideo 4
Rio de Janeiro 4
Sarajevo 4
Ulan Bator 4
Vientiane 4
Warsaw 4
Amsterdam 3
Antananarivo 3
Borama 3
Charlotte 3
Chisinau 3
Dallas 3
Dubai 3
Dushanbe 3
Guayaquil 3
Kampala 3
Kigali 3
London 3
Maputo 3
Maracaibo 3
Noumea 3
Phnom Penh 3
Port-au-Prince 3
Pristina 3
Reykjavik 3
Seoul 3
Tianjin 3
Tirana 3
Willemstad 3
Zagreb 3
Atlanta 2
Auburn Hills 2
Auckland 2
Awasa 2
Bangkok 2
Bengaluru 2
Brno 2
Brooklyn 2
Budapest 2
Totale 1.445
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Nome #
Investigation of total ionizing dose effect and displacement damage in 65nm CMOS transistors exposed to 3MeV protons 281
65 nm technology for HEP: Status and perspective 213
RD53 pixel chips for the ATLAS and CMS Phase-2 upgrades at HL-LHC 208
Recent progress of RD53 Collaboration towards next generation Pixel Read-Out Chip for HL-LHC 191
Radiation tolerance study of a commercial 65nm CMOS technology for high energy physics applications 189
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments 188
Radiation vulnerability in 65 nm CMOS I/O transistors after exposure to grad dose 167
Enhancement of Transistor-to-Transistor Variability Due to Total Dose Effects in 65-nm MOSFETs 165
Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs 161
Pan-cancer immune and stromal deconvolution predicts clinical outcomes and mutation profiles 160
Drain Current Collapse in 65 nm pMOS Transistors After Exposure to Grad Dose 159
Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors 130
Investigation of hot carrier stress and constant voltage stress in high-k Si-based TFETs 115
Totale 2.327
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Categoria #
all - tutte 6.550
article - articoli 4.813
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 11.363
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202133 0 0 0 0 0 0 0 0 0 0 22 11
2021/2022169 10 35 15 3 14 3 16 25 2 2 13 31
2022/202346 17 2 0 2 4 4 0 2 7 0 7 1
2023/202465 2 5 13 8 3 13 0 1 0 9 5 6
2024/2025285 0 4 3 13 36 13 12 32 24 11 72 65
2025/20261.159 56 95 179 221 113 39 153 91 90 65 57 0
Totale 2.327