PISTOLLATO, SIMONE

PISTOLLATO, SIMONE  

Università di Padova  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Low Complexity Algorithm for Efficiency Optimization of Dual Active Bridge Converters 2021 Pistollato, SimoneZanatta, NicolaCaldognetto, TommasoMattavelli, Paolo IEEE OPEN JOURNAL OF POWER ELECTRONICS - -
A Low Complexity Algorithm for Efficiency Optimization of Dual Active Bridge Converters 2021 Pistollato, SimoneZanatta, NicolaMattavelli, Paolo + IEEE OPEN JOURNAL OF POWER ELECTRONICS - -
Analysis and Performance Evaluation of the DAB and IBCI DC-DC Converter Topologies 2019 S. PistollatoT. CaldognettoP. MattavelliG. Spiazzi + - - IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
Bidirectional DC-DC Converter Topologies for Low-Voltage Battery Interface: Comparative Assessment 2018 Ahmed AbdelhakimP. MattavelliPISTOLLATO, SIMONEG. Spiazzi - - 2018 IEEE 4th International Forum on Research and Technology for Society and Industry (RTSI)
Implementation and Experimental Evaluation of an Efficiency-Improved Modulation Technique for IBCI DC-DC Converters 2020 Pistollato S.Caldognetto T.Buso S.Spiazzi G.Mattavelli P. + - - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Reduction of Output Capacitance for DAB DC-DC Converters in DC Microgrids by Shaping Resistive Output Impedance 2019 Liu G.Mattavelli P.Pistollato S.Petucco A. - - 2019 AEIT International Annual Conference, AEIT 2019
TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors 2020 Magnone P.Pistollato S. + MICROELECTRONICS RELIABILITY - -
Triple-Phase Shift Modulation and Tuning Technique to Improve the Efficiency of the Dual Active Bridge Converter 2020 Zanatta N.Pistollato S.Caldognetto T.Mattavelli P. - - 12th AEIT International Annual Conference, AEIT 2020
Triple-Phase Shift Modulation for Dual Active Bridge based on Simplified Switching Loss Model 2019 Pistollato S.Caldognetto T.Mattavelli P.Magnone P. - - 2019 AEIT International Annual Conference, AEIT 2019
Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation 2021 Magnone P.Pistollato S. + SOLID-STATE ELECTRONICS - -