Ohmic RF-MEMS switches have been fully characterized regarding their robustness to Electro-Static Discharge events (ESD), Total Ionizing dose (TID) radiation, and long term actuation, obtaining important guidelines to improve the reliability of such devices. These tests, although very important for a complete device qualification for spatial applications, are in fact poorly investigated in literature.
RF-MEMS Switches Reliability for Long Term Spatial Applications
TAZZOLI, AUGUSTO;PERETTI, VANNI;CELLERE, GIORGIO;MENEGHESSO, GAUDENZIO
2007
Abstract
Ohmic RF-MEMS switches have been fully characterized regarding their robustness to Electro-Static Discharge events (ESD), Total Ionizing dose (TID) radiation, and long term actuation, obtaining important guidelines to improve the reliability of such devices. These tests, although very important for a complete device qualification for spatial applications, are in fact poorly investigated in literature.File in questo prodotto:
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