CELLERE, GIORGIO
CELLERE, GIORGIO
Depassivation of Latent Plasma Damage in n-MOSFETs
2001 Cellere, Giorgio; L., Pantisano; Paccagnella, Alessandro; M. G., Valentini
Radiation-induced depassivation of latent plasma damage
2002 Cellere, G.; Paccagnella, Alessandro; Pantisano, L.; Valentini, M. G.; Flament, O.; Mosseau, O.; Fuochi, P. G.
Plasma induced damage from via etching in pMOSFETs
2002 Cellere, Giorgio; M. G., Valentini; A., Baraldo; Paccagnella, Alessandro
P2ID in a Modern CMOS Technology
2002 Cellere, G.; Valentini, M. G.; Caminati, M.; Paccagnella, Alessandro
Influence of dielectric breakdown on MOSFET drain current
2005 Cellere, Giorgio; Paccagnella, Alessandro; Mazzocchi, A; Valentini, Mg
RF-MEMS Switches Reliability for Long Term Spatial Applications
2007 Tazzoli, Augusto; Peretti, Vanni; Cellere, Giorgio; Meneghesso, Gaudenzio
Angular dependence of heavy ion effects in Floating Gate memory arrays
2007 Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Bonanomi, M; HARBOE SORENSEN, R; Virtanen, A.
TID sensitivity of NAND Flash memory building blocks
2008 Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro; Visconti, A.; Beltrami, S.
Key Contributions to the Cross Section of NAND Flash Memories Irradiated with Heavy Ions
2008 Bagatin, Marta; Gerardin, Simone; Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Beltrami, S; HARBOE SORENSEN, R; Virtanen, A.
Defect in thin and ultra-thin silicon dioxides
2008 Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro
Space and time-resolved gene expression experiments on cultured mammalian cells by a single-cell electroporation microarray
2008 Vassanelli, Stefano; Bandiera, Leonardo; Borgo, Mauro; Cellere, Giorgio; Santoni, L; Bersani, C; Salamon, Michela; Zaccolo, Manuela; Lorenzelli, L; Girardi, Stefano; Maschietto, Marta; DAL MASCHIO, M; Paccagnella, Alessandro
Transfecting targeted adherent single cells
2008 Borgo, Mauro; L., Santoni; Bandiera, Leonardo; Vassanelli, Stefano; Cellere, Giorgio
ELECTRICAL DETECTION AND EQUIVALENT MODEL OF SINGLE CELL OVER GOLD MICROELECTRODE BIOCHIP USED FOR CELL STIMULATION
2009 DE TONI, Alessandro; Cellere, Giorgio; Paccagnella, Alessandro; Bandiera, L; Borgo, M; Santoni, L; Dal Maschio, M; Girardi, Stefano; Lorenzelli, L.
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories?
2009 Cellere, Giorgio; Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Visconti, A; Bonanomi, M; Beltrami, S; HARBOE SORENSEN, R; Virtanen, A; Roche, P.
Radiation Sensitivity of Ohmic RF-MEMS Switches for Spatial Applications
2009 Tazzoli, Augusto; Cellere, Giorgio; Autizi, Enrico; Peretti, Vanni; Paccagnella, Alessandro; Meneghesso, Gaudenzio
Error Instability in Floating Gate Flash Memories Exposed to TID
2009 Bagatin, Marta; Gerardin, Simone; Cellere, Giorgio; Paccagnella, Alessandro; A., Visconti; M., Bonanomi; S., Beltrami
TID Sensitivity of NAND Flash Memory Building Blocks
2009 Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro; Visconti, A; Beltrami, S.
Dosimetry method for use in treatment of brain tumor, involves determining changes in threshold value of cells which are exposed to ionizing radiation by correlating address of cell to corresponding position in two-dimensional array
2010 Bonanomi, M; Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A.
Impact of total dose on heavy-ion upsets in floating gate arrays
2010 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Cellere, Giorgio; Visconti, A; Bonanomi, M.
Radiation Effects in NAND Flash Memories
2010 Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro