CELLERE, GIORGIO

CELLERE, GIORGIO  

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Risultati 1 - 20 di 27 (tempo di esecuzione: 0.031 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Depassivation of Latent Plasma Damage in n-MOSFETs 2001 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Radiation-induced depassivation of latent plasma damage 2002 G. CELLEREPACCAGNELLA, ALESSANDRO + MICROELECTRONIC ENGINEERING - -
Plasma induced damage from via etching in pMOSFETs 2002 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + - - International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings
P2ID in a Modern CMOS Technology 2002 G. CELLEREPACCAGNELLA, ALESSANDRO + - - 7th International Symposium on Plasma- and Process-Induced Damage
Influence of dielectric breakdown on MOSFET drain current 2005 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
RF-MEMS Switches Reliability for Long Term Spatial Applications 2007 TAZZOLI, AUGUSTOPERETTI, VANNICELLERE, GIORGIOMENEGHESSO, GAUDENZIO - - -
Angular dependence of heavy ion effects in Floating Gate memory arrays 2007 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
TID sensitivity of NAND Flash memory building blocks 2008 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Key Contributions to the Cross Section of NAND Flash Memories Irradiated with Heavy Ions 2008 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Defect in thin and ultra-thin silicon dioxides 2008 CELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Defects in Microelectronic Materials and Devices
Space and time-resolved gene expression experiments on cultured mammalian cells by a single-cell electroporation microarray 2008 VASSANELLI, STEFANOBANDIERA, LEONARDOBORGO, MAUROCELLERE, GIORGIOSALAMON, MICHELAZACCOLO, MANUELAGIRARDI, STEFANOMASCHIETTO, MARTADAL MASCHIO MPACCAGNELLA, ALESSANDRO + NEW BIOTECHNOLOGY - -
Transfecting targeted adherent single cells 2008 BORGO, MAUROBANDIERA, LEONARDOVASSANELLI, STEFANOCELLERE, GIORGIO + BIO TECH INTERNATIONAL - -
ELECTRICAL DETECTION AND EQUIVALENT MODEL OF SINGLE CELL OVER GOLD MICROELECTRODE BIOCHIP USED FOR CELL STIMULATION 2009 DE TONI, ALESSANDROCELLERE, GIORGIOPACCAGNELLA, ALESSANDRODal Maschio MGIRARDI, STEFANO + - - PROCEEDINGS OF THE 13TH ITALIAN CONFERENCE ON SENSORS AND MICROSYSTEMS
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories? 2009 CELLERE, GIORGIOGERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE ELECTRON DEVICE LETTERS - -
Radiation Sensitivity of Ohmic RF-MEMS Switches for Spatial Applications 2009 TAZZOLI, AUGUSTOCELLERE, GIORGIOAUTIZI, ENRICOPERETTI, VANNIPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO - - -
Error Instability in Floating Gate Flash Memories Exposed to TID 2009 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
TID Sensitivity of NAND Flash Memory Building Blocks 2009 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Dosimetry method for use in treatment of brain tumor, involves determining changes in threshold value of cells which are exposed to ionizing radiation by correlating address of cell to corresponding position in two-dimensional array 2010 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + - - -
Impact of total dose on heavy-ion upsets in floating gate arrays 2010 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDROCELLERE, GIORGIO + MICROELECTRONICS RELIABILITY - -
Radiation Effects in NAND Flash Memories 2010 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Inside NAND Flash Memories