Padua Research Archive, l’archivio istituzionale della produzione scientifica dell’Università degli Studi di Padova, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ateneo. Padua Research Archive utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

CELLERE, GIORGIO

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 22 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autori	Rivista	Titolo libro
1	Transfecting targeted adherent single cells	2008	BORGO, MAURO ; L. Santoni; BANDIERA, LEONARDO ; VASSANELLI, STEFANO ; CELLERE, GIORGIO	BIO TECH INTERNATIONAL
2	TID Sensitivity of NAND Flash Memory Building Blocks	2009	BAGATIN, MARTA ; CELLERE, GIORGIO ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO ; VISCONTI A; BELTRAMI S.	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
3	TID sensitivity of NAND Flash memory building blocks	2008	BAGATIN, MARTA ; CELLERE, GIORGIO ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO ; Visconti, A.; Beltrami, S.		Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
4	Space and time-resolved gene expression experiments on cultured mammalian cells by a single-cell electroporation microarray	2008	VASSANELLI, STEFANO ; BANDIERA, LEONARDO ; BORGO, MAURO ; CELLERE, GIORGIO ; SANTONI L; BERSANI C; SALAMON, MICHELA ; ZACCOLO, MANUELA ; LORENZELLI L; GIRARDI, STEFANO ; MASCHIETTO, MARTA ; DAL MASCHIO, MARCO ; PACCAGNELLA, ALESSANDRO	NEW BIOTECHNOLOGY
5	RF-MEMS Switches Reliability for Long Term Spatial Applications	2007	TAZZOLI, AUGUSTO ; PERETTI, VANNI ; CELLERE, GIORGIO ; MENEGHESSO, GAUDENZIO
6	Radiation Sensitivity of Ohmic RF-MEMS Switches for Spatial Applications	2009	TAZZOLI, AUGUSTO ; CELLERE, GIORGIO ; AUTIZI, ENRICO ; PERETTI, VANNI ; PACCAGNELLA, ALESSANDRO ; MENEGHESSO, GAUDENZIO
7	Radiation Effects in NAND Flash Memories	2010	BAGATIN, MARTA ; CELLERE, GIORGIO ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO		Inside NAND Flash Memories
8	Potential High Resolution Dosimeters For MRT	2010	Brauer Krisch E; Rosenfeld A; Lerch M; Petasecca M; Akselrod M; Sykora J; Bartz, J; Ptaszkiewicz M; Olko P; Berg A; Wieland M; Doran S; Brochard T; Kamlowski A; CELLERE, GIORGIO ; PACCAGNELLA, ALESSANDRO ; Siegbahn EA; Prezado Y; Martinez Rovira I; Bravin A; Dusseau L; Berkvens P.		6TH INTERNATIONAL CONFERENCE ON MEDICAL APPLICATIONS OF SYNCHROTRON RADIATION
9	Key Contributions to the Cross Section of NAND Flash Memories Irradiated with Heavy Ions	2008	BAGATIN, MARTA ; GERARDIN, SIMONE ; CELLERE, GIORGIO ; PACCAGNELLA, ALESSANDRO ; VISCONTI A; BELTRAMI S; HARBOE SORENSEN R; VIRTANEN A.	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
10	Increase in the Heavy-ion Upset Cross Section of Floating Gate Cells Previously Exposed to TID	2010	BAGATIN, MARTA ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO ; CELLERE, GIORGIO ; A. VISCONTI; M. BONANOMI	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
11	Impact of total dose on heavy-ion upsets in floating gate arrays	2010	GERARDIN, SIMONE ; BAGATIN, MARTA ; PACCAGNELLA, ALESSANDRO ; CELLERE, GIORGIO ; VISCONTI A; BONANOMI M.	MICROELECTRONICS RELIABILITY
12	Impact of time and space evolution of ion tracks in nonvolatile memory cells approaching nanoscale	2010	CELLERE, GIORGIO ; PACCAGNELLA, ALESSANDRO ; M. Murat; J. Barak; A. Akkerman; R. Harboe Sorensen; A. Virtanen; A. Visconti; M. Bonanomi	JOURNAL OF APPLIED PHYSICS
13	Heavy-Ion Induced Threshold Voltage Tails in Floating Gate Arrays	2010	GERARDIN, SIMONE ; BAGATIN, MARTA ; PACCAGNELLA, ALESSANDRO ; CELLERE, GIORGIO ; A. VISCONTI; M. BONANOMI; A. HJALMARSSON; A. V. PROKOFIEV	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
14	Error Instability in Floating Gate Flash Memories Exposed to TID	2009	BAGATIN, MARTA ; GERARDIN, SIMONE ; CELLERE, GIORGIO ; PACCAGNELLA, ALESSANDRO ; A. Visconti; M. Bonanomi; S. Beltrami	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
15	ELECTRICAL DETECTION AND EQUIVALENT MODEL OF SINGLE CELL OVER GOLD MICROELECTRODE BIOCHIP USED FOR CELL STIMULATION	2009	DE TONI, ALESSANDRO ; CELLERE, GIORGIO ; PACCAGNELLA, ALESSANDRO ; Bandiera L; Borgo M; Santoni L; DAL MASCHIO, MARCO ; GIRARDI, STEFANO ; Lorenzelli L.		PROCEEDINGS OF THE 13TH ITALIAN CONFERENCE ON SENSORS AND MICROSYSTEMS
16	Dosimetry method for use in treatment of brain tumor, involves determining changes in threshold value of cells which are exposed to ionizing radiation by correlating address of cell to corresponding position in two-dimensional array	2010	BONANOMI M; CELLERE, GIORGIO ; PACCAGNELLA, ALESSANDRO ; VISCONTI A.
17	Destructive events in NAND Flash memories irradiated with heavy ions	2010	BAGATIN, MARTA ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO ; CELLERE, GIORGIO ; IROM F; NGUYEN DN	MICROELECTRONICS RELIABILITY
18	Defect in thin and ultra-thin silicon dioxides	2008	CELLERE, GIORGIO ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO		Defects in Microelectronic Materials and Devices
19	Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories	2010	IROM F; NGUYEN DN; BAGATIN, MARTA ; CELLERE, GIORGIO ; GERARDIN, SIMONE ; PACCAGNELLA, ALESSANDRO	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
20	Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories?	2009	CELLERE, GIORGIO ; GERARDIN, SIMONE ; BAGATIN, MARTA ; PACCAGNELLA, ALESSANDRO ; VISCONTI A; BONANOMI M; BELTRAMI S; HARBOE SORENSEN R; VIRTANEN A; ROCHE P.	IEEE ELECTRON DEVICE LETTERS

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CELLERE, GIORGIO