CELLERE, GIORGIO

CELLERE, GIORGIO  

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Risultati 1 - 20 di 27 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Angular dependence of heavy ion effects in Floating Gate memory arrays 2007 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence 2010 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories? 2009 CELLERE, GIORGIOGERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE ELECTRON DEVICE LETTERS - -
Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories 2010 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Defect in thin and ultra-thin silicon dioxides 2008 CELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Defects in Microelectronic Materials and Devices
Depassivation of Latent Plasma Damage in n-MOSFETs 2001 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Destructive events in NAND Flash memories irradiated with heavy ions 2010 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDROCELLERE, GIORGIO + MICROELECTRONICS RELIABILITY - -
Dosimetry method for use in treatment of brain tumor, involves determining changes in threshold value of cells which are exposed to ionizing radiation by correlating address of cell to corresponding position in two-dimensional array 2010 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + - - -
ELECTRICAL DETECTION AND EQUIVALENT MODEL OF SINGLE CELL OVER GOLD MICROELECTRODE BIOCHIP USED FOR CELL STIMULATION 2009 DE TONI, ALESSANDROCELLERE, GIORGIOPACCAGNELLA, ALESSANDRODal Maschio MGIRARDI, STEFANO + - - PROCEEDINGS OF THE 13TH ITALIAN CONFERENCE ON SENSORS AND MICROSYSTEMS
Error Instability in Floating Gate Flash Memories Exposed to TID 2009 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Heavy-Ion Induced Threshold Voltage Tails in Floating Gate Arrays 2010 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDROCELLERE, GIORGIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Impact of time and space evolution of ion tracks in nonvolatile memory cells approaching nanoscale 2010 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + JOURNAL OF APPLIED PHYSICS - -
Impact of total dose on heavy-ion upsets in floating gate arrays 2010 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDROCELLERE, GIORGIO + MICROELECTRONICS RELIABILITY - -
Increase in the Heavy-ion Upset Cross Section of Floating Gate Cells Previously Exposed to TID 2010 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDROCELLERE, GIORGIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Influence of dielectric breakdown on MOSFET drain current 2005 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Key Contributions to the Cross Section of NAND Flash Memories Irradiated with Heavy Ions 2008 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
P2ID in a Modern CMOS Technology 2002 G. CELLEREPACCAGNELLA, ALESSANDRO + - - 7th International Symposium on Plasma- and Process-Induced Damage
Plasma induced damage from via etching in pMOSFETs 2002 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + - - International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings
Potential High Resolution Dosimeters For MRT 2010 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + - AIP CONFERENCE PROCEEDINGS 6TH INTERNATIONAL CONFERENCE ON MEDICAL APPLICATIONS OF SYNCHROTRON RADIATION
Radiation Effects in NAND Flash Memories 2010 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Inside NAND Flash Memories