TAZZOLI, AUGUSTO

TAZZOLI, AUGUSTO  

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Risultati 1 - 20 di 96 (tempo di esecuzione: 0.029 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures 2011 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + JOURNAL OF ELECTROSTATICS - -
A Comprehensive Study of MEMS Behavior under EOS/ESD Events: Breakdown, Dielectric Charging, and Realistic Cures 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
A novel fast and versatile temperature measurement system for LDMOS transistors 2005 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
A Positive Exploitation of ESD Events: Micro-welding Induction on Ohmic MEMS Contacts 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - 33rd Annual EOS/ESD Symposium, EOSESD2011
A review of failure modes and mechanisms of GaN-based HEMT's 2007 ZANONI, ENRICOMENEGHESSO, GAUDENZIODANESIN, FRANCESCAMENEGHINI, MATTEORAMPAZZO, FABIANATAZZOLI, AUGUSTOZANON, FRANCO + - - -
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A study of Failure of GaN-based LEDs submitted to reverse-bias stress and ESD events 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - IRPS2010, International Reliability Physics Symposium
A study on the reverse-bias and ESD instabilities of InGaN-based green LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOTRIVELLIN, NICOLADAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. SPIE Vol. 7617, 76170M
Accelerated testing of RF-MEMS contact degradation through radiation sources 2010 TAZZOLI, AUGUSTOBARBATO, MARCOGILIBERTO, VALENTINAGERARDIN, SIMONENICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium
Acceleration of Microwelding on Ohmic RF-MEMS Switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO JOURNAL OF MICROELECTROMECHANICAL SYSTEMS - -
Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches 2010 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - EuMIC 2010, European Microwave Week
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
An Insight into effects Induced by Heavy-Ion Strikes in SCR ESD Protection Structures 2011 GRIFFONI, ALESSIOTAZZOLI, AUGUSTOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IEW2011, 2011 International Electrostatic Discharge Workshop
Analysis of DC and rf degradation of AlGaN/GaN High Electron Mobility Transistors based on pulsed measurements and spectroscopic techniques 2010 ZANONI, ENRICOSTOCCO, ANTONIOMENEGHINI, MATTEORAMPAZZO, FABIANARONCHI, NICOLO'TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - 5th Space Agency - MOD Round Table Workshop on GaN Component Technologies
Analysis of triggering behavior of low voltage BCD single and multi-finger gc-NMOS ESD protection devices 2006 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - -
Breakdown characterization of gate oxides in 35 and 70 angstrom BCD8 smart power technology 2009 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Breakdown Investigation on AlGaN/GaN-HEMT Devices 2009 TAZZOLI, AUGUSTOMONACO, GIANNINICOLOSI, PIERGIORGIOZANONI, ENRICOMENEGHESSO, GAUDENZIO - - -
CDM circuit simulation of a HV Operational Amplifier realized in 0.35μm Smart Power technology 2007 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - -
Characterization Issues and Charge Trapping Effects on RF-MEMS switches 2007 TAZZOLI, AUGUSTOPERETTI, VANNIMENEGHESSO, GAUDENZIO - - -
Characterization Issues and ESD Sensitivity of RF-MEMS Switches 2006 TAZZOLI, AUGUSTOPERETTI, VANNIZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -