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TAZZOLI, AUGUSTO

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 96 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autori	Rivista	Titolo libro
1	K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability	2012	A. Persano; TAZZOLI, AUGUSTO ; P. Farinelli; MENEGHESSO, GAUDENZIO ; P. Siciliano; F. Quaranta	MICROELECTRONICS RELIABILITY
2	An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches	2011	Iannacci J; Faes A; Repchankova A; TAZZOLI, AUGUSTO ; MENEGHESSO, GAUDENZIO	MICROELECTRONICS RELIABILITY
3	A Positive Exploitation of ESD Events: Micro-welding Induction on Ohmic MEMS Contacts	2011	TAZZOLI, AUGUSTO ; J. Iannacci; MENEGHESSO, GAUDENZIO		33rd Annual EOS/ESD Symposium, EOSESD2011
4	A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures	2011	TAZZOLI, AUGUSTO ; BARBATO, MARCO ; Ritrovato V; MENEGHESSO, GAUDENZIO	JOURNAL OF ELECTROSTATICS
5	An Insight into effects Induced by Heavy-Ion Strikes in SCR ESD Protection Structures	2011	GRIFFONI, ALESSIO ; S. Thijs; S. H. Chen; TAZZOLI, AUGUSTO ; M. Cordoni; P. Colombo; PACCAGNELLA, ALESSANDRO ; D. Linten; MENEGHESSO, GAUDENZIO ; G. Groeseneken		IEW2011, 2011 International Electrostatic Discharge Workshop
6	Modeling and characterization of a circular-shaped energy scavenger in MEMS surface micromachining technology	2011	F. Solazzi; J. Iannacci; A. Faes; F. Giacomozzi; B. Margesin; TAZZOLI, AUGUSTO ; MENEGHESSO, GAUDENZIO
7	Design and Characterization of an Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches	2011	F. Solazzi; TAZZOLI, AUGUSTO ; P. Farinelli; A. Faes; V. Mulloni; B. Margesin; MENEGHESSO, GAUDENZIO	INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES
8	ESD sensitivity of a GaAs MMIC microwave power amplifier	2011	TAZZOLI, AUGUSTO ; ROSSETTO, ISABELLA ; ZANONI, ENRICO ; Dai YF; Tomasi T; MENEGHESSO, GAUDENZIO	MICROELECTRONICS RELIABILITY
9	Acceleration of Microwelding on Ohmic RF-MEMS Switches	2011	TAZZOLI, AUGUSTO ; MENEGHESSO, GAUDENZIO	JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
10	Reverse-bias and ESD instabilities of InGaN-based LEDs	2010	MENEGHINI, MATTEO ; TAZZOLI, AUGUSTO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		Proc. of WOCSDICE 2010, 34th Workshop on Compound semiconductors and integrated circuits
11	Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches	2010	TAZZOLI, AUGUSTO ; BARBATO, MARCO ; MATTIUZZO F; RITROVATO V; MENEGHESSO, GAUDENZIO	MICROELECTRONICS RELIABILITY
12	A study on the reverse-bias and ESD instabilities of InGaN-based green LEDs	2010	MENEGHINI, MATTEO ; TAZZOLI, AUGUSTO ; TRIVELLIN, NICOLA ; E. RANZATO; DAL LAGO, MATTEO ; B. HAHN; U. ZEHNDER; R. BUTENDEICH; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		Proc. SPIE Vol. 7617, 76170M
13	Design of mm-wave 5-bit phase shifters for Satellite On The Move terminals	2010	F. CASINI; F. DI MAGGIO; M. DISPENZA; P. FARINELLI; B. MARGESIN; E. CARPENTIERI; U. D'ELIA; R. VITIELLO; I. POMONA; TAZZOLI, AUGUSTO ; MENEGHESSO, GAUDENZIO ; M. TULUI; R. SORRENTINO
14	New reliability understanding on GaN-HEMTs	2010	MENEGHESSO, GAUDENZIO ; STOCCO, ANTONIO ; RONCHI, NICOLO' ; MENEGHINI, MATTEO ; TAZZOLI, AUGUSTO ; ZANONI, ENRICO		The Workshop on Compound Semiconductor Materials and Devices, WOCSEMMAD 2010,
15	Influence of Geometrical Parameters on Time-to-Latch-Up of SCR-Based ESD Protection Structures	2010	TAZZOLI, AUGUSTO ; M. CORDONI; P. COLOMBO; MENEGHESSO, GAUDENZIO
16	A study of Failure of GaN-based LEDs submitted to reverse-bias stress and ESD events	2010	MENEGHINI, MATTEO ; TAZZOLI, AUGUSTO ; E. RANZATO; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; M. Pavesi; M. Manfredi; R. BUTENDEICH; U. ZEHNDER; B. HAHN		IRPS2010, International Reliability Physics Symposium
17	A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs	2010	MENEGHINI, MATTEO ; TAZZOLI, AUGUSTO ; MURA G; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	IEEE TRANSACTIONS ON ELECTRON DEVICES
18	Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs	2010	PINATO, ALESSANDRO ; CESTER, ANDREA ; MENEGHINI, MATTEO ; WRACHIEN, NICOLA ; TAZZOLI, AUGUSTO ; S. XIA; V. ADAMOVICH; M. S. WEAVER; J. J. BROWN; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO	IEEE TRANSACTIONS ON ELECTRON DEVICES
19	Accelerated testing of RF-MEMS contact degradation through radiation sources	2010	TAZZOLI, AUGUSTO ; BARBATO, MARCO ; GILIBERTO, VALENTINA ; G. MONACO; GERARDIN, SIMONE ; NICOLOSI, PIERGIORGIO ; PACCAGNELLA, ALESSANDRO ; MENEGHESSO, GAUDENZIO		IRPS2010, International Reliability Physics Symposium
20	Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches	2010	F. SOLAZZI; TAZZOLI, AUGUSTO ; P. FARINELLI; A. FAES; V. MULLONI; MENEGHESSO, GAUDENZIO ; B. MARGESIN		EuMIC 2010, European Microwave Week

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TAZZOLI, AUGUSTO