TAZZOLI, AUGUSTO
TAZZOLI, AUGUSTO
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures
2011 Tazzoli, Augusto; Barbato, Marco; Ritrovato, V; Meneghesso, Gaudenzio
A Comprehensive Study of MEMS Behavior under EOS/ESD Events: Breakdown, Dielectric Charging, and Realistic Cures
2010 Tazzoli, Augusto; Barbato, Marco; V., Ritrovato; Meneghesso, Gaudenzio
A novel fast and versatile temperature measurement system for LDMOS transistors
2005 Tazzoli, Augusto; Meneghesso, Gaudenzio; Zanoni, Enrico
A Positive Exploitation of ESD Events: Micro-welding Induction on Ohmic MEMS Contacts
2011 Tazzoli, Augusto; J., Iannacci; Meneghesso, Gaudenzio
A review of failure modes and mechanisms of GaN-based HEMT's
2007 Zanoni, Enrico; Meneghesso, Gaudenzio; G., Verzellesi; Danesin, Francesca; Meneghini, Matteo; Rampazzo, Fabiana; Tazzoli, Augusto; Zanon, Franco
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs
2010 Meneghini, Matteo; Tazzoli, Augusto; Mura, G; Meneghesso, Gaudenzio; Zanoni, Enrico
A study of Failure of GaN-based LEDs submitted to reverse-bias stress and ESD events
2010 Meneghini, Matteo; Tazzoli, Augusto; E., Ranzato; Meneghesso, Gaudenzio; Zanoni, Enrico; M., Pavesi; M., Manfredi; R., Butendeich; U., Zehnder; B., Hahn
A study on the reverse-bias and ESD instabilities of InGaN-based green LEDs
2010 Meneghini, Matteo; Tazzoli, Augusto; Trivellin, Nicola; E., Ranzato; DAL LAGO, Matteo; B., Hahn; U., Zehnder; R., Butendeich; Meneghesso, Gaudenzio; Zanoni, Enrico
Accelerated testing of RF-MEMS contact degradation through radiation sources
2010 Tazzoli, Augusto; Barbato, Marco; Giliberto, Valentina; G., Monaco; Gerardin, Simone; Nicolosi, Piergiorgio; Paccagnella, Alessandro; Meneghesso, Gaudenzio
Acceleration of Microwelding on Ohmic RF-MEMS Switches
2011 Tazzoli, Augusto; Meneghesso, Gaudenzio
Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches
2010 F., Solazzi; Tazzoli, Augusto; P., Farinelli; A., Faes; V., Mulloni; Meneghesso, Gaudenzio; B., Margesin
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches
2011 Iannacci, J; Faes, A; Repchankova, A; Tazzoli, Augusto; Meneghesso, Gaudenzio
An Insight into effects Induced by Heavy-Ion Strikes in SCR ESD Protection Structures
2011 Griffoni, Alessio; S., Thijs; S. H., Chen; Tazzoli, Augusto; M., Cordoni; P., Colombo; Paccagnella, Alessandro; D., Linten; Meneghesso, Gaudenzio; G., Groeseneken
Analysis of DC and rf degradation of AlGaN/GaN High Electron Mobility Transistors based on pulsed measurements and spectroscopic techniques
2010 Zanoni, Enrico; A., Chini; Stocco, Antonio; I., Rossetto; Meneghini, Matteo; Rampazzo, Fabiana; Ronchi, Nicolo'; Tazzoli, Augusto; G., Verzellesi; Meneghesso, Gaudenzio
Analysis of triggering behavior of low voltage BCD single and multi-finger gc-NMOS ESD protection devices
2006 M., Heer; S., Bychikhin; V., Dubec; D., Pogany; E., Gornik; M., Dissegna; L., Cerati; L., Zullino; A., Andreini; Tazzoli, Augusto; Meneghesso, Gaudenzio
Breakdown characterization of gate oxides in 35 and 70 angstrom BCD8 smart power technology
2009 Tazzoli, Augusto; Cerati, L; Andreini, A; Meneghesso, Gaudenzio
Breakdown Investigation on AlGaN/GaN-HEMT Devices
2009 Tazzoli, Augusto; Monaco, Gianni; Nicolosi, Piergiorgio; Zanoni, Enrico; Meneghesso, Gaudenzio
CDM circuit simulation of a HV Operational Amplifier realized in 0.35μm Smart Power technology
2007 M., Dissegna; L., Cerati; L., Cecchetto; E., Gevinti; A., Andreini; Tazzoli, Augusto; Meneghesso, Gaudenzio
Characterization Issues and Charge Trapping Effects on RF-MEMS switches
2007 Tazzoli, Augusto; Peretti, Vanni; Meneghesso, Gaudenzio
Characterization Issues and ESD Sensitivity of RF-MEMS Switches
2006 Tazzoli, Augusto; Peretti, Vanni; D., Bozzato; Zanoni, Enrico; Meneghesso, Gaudenzio