TID sensitivity of NAND Flash memory building blocks

Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro; Visconti, A.; Beltrami, S.

doi:10.1109/RADECS.2008.5782680

TID sensitivity of NAND Flash memory building blocks

BAGATIN, MARTA;CELLERE, GIORGIO;GERARDIN, SIMONE;PACCAGNELLA, ALESSANDRO;Visconti, A.;Beltrami, S.

2008

Scheda breve

Scheda completa

Scheda completa (DC)

	Anno
	
				2008
			
	Titolo del Libro
	
				Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
			
	Titolo convegno
	
				8th European Workshop on Radiation and Its Effects on Components and Systems, RADECS 2008
			
	Codice DOI
	
				https://dx.doi.org/10.1109/RADECS.2008.5782680
			
	Codice WOS
	
				WOS:000269154900004
			
	Codice Scopus
	
				2-s2.0-79960633423
			
	Codice ISBN
	
				9781457704819
9781457704819
			
	Appare nelle tipologie:
	
				04.01 - Contributo in atti di convegno