We studied the secondary byproducts created by high-energy protons inside an SEU detector based on 3D NAND Flash memories, extending the previously developed methodology used for detecting heavy ions. The radiation response of the SEU monitor was discussed as a function of proton energy, analyzing parameters such as the number of clusters per particle, the cluster size, and the angle of the generated secondaries. The results provide interesting insight into the nuclear reactions occurring in state-of-the-art electronic chips, in addition to showing the usefulness of 3D NAND Flash memories for monitoring proton beams.

Secondary Particles Generated by Protons in 3D NAND Flash Memories

Bagatin M.;Gerardin S.;Paccagnella A.;
2022

Abstract

We studied the secondary byproducts created by high-energy protons inside an SEU detector based on 3D NAND Flash memories, extending the previously developed methodology used for detecting heavy ions. The radiation response of the SEU monitor was discussed as a function of proton energy, analyzing parameters such as the number of clusters per particle, the cluster size, and the angle of the generated secondaries. The results provide interesting insight into the nuclear reactions occurring in state-of-the-art electronic chips, in addition to showing the usefulness of 3D NAND Flash memories for monitoring proton beams.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/3450190
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