GABALLAH, AHMED EID HAMED

GABALLAH, AHMED EID HAMED  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A table top polarimetric facility for the EUV spectral range: implementations and characterization 2017 GABALLAH, AHMED EID HAMEDMALIK, NADEEM AHMEDJIMENEZ TEJEDA, KETY MAYELINNICOLOSI, PIERGIORGIO + - - Proceedings Volume 10235, EUV and X-ray Optics: Synergy between Laboratory and Space V; 102350X (2017)
EUV polarimetry for thin film and surface characterization and EUV phase retarder reflector development 2018 A. E. H. GaballahP. NicolosiNadeem AhmedK. JimenezP. Zuppella + REVIEW OF SCIENTIFIC INSTRUMENTS - -
Experimental Study of Few-Layer Graphene: Optical Anisotropy and Pseudo-Brewster Angle Shift in Vacuum Ultraviolet Spectral Range 2021 Nadeem Ahmed MalikPiergiorgio NicolosiKety JimenezAhmed Gaballah + ADVANCED PHOTONICS RESEARCH - -
Extreme ultraviolet free-standing transmittance filters for high brilliance sources, based on Nb/Zr and Zr/Nb thin films on Si3N4 membranes: Design, fabrication, optical and structural characterization 2019 Jimenez, K.Nicolosi, P.Juschkin, L.Ahmed, NadeemGaballah, A. E. H.Cattaruzza, E.Sertsu, M. G.Zuppella, P. + THIN SOLID FILMS - -
FUV- EUV Polarimetric System Development 2018 Gaballah, Ahmed - - -
Optical and structural characterization of Nb, Zr, Nb/Zr, Zr/Nb thin films on Si3N4 membranes windows 2017 JIMENEZ TEJEDA, KETY MAYELINGABALLAH, AHMED EID HAMEDMALIK, NADEEM AHMEDZUPPELLA, PAOLANICOLOSI, PIERGIORGIO PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - -