MAGNONE, PAOLO

MAGNONE, PAOLO  

Dipartimento di Tecnica e Gestione dei Sistemi Industriali - DTG  

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Risultati 1 - 20 di 69 (tempo di esecuzione: 0.06 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
EMI-Silent Operation of Triple Active Bridge Converters With Online Model-Free ZVS Optimization and RMS Current Reduction 2025 Darisi M.Caldognetto T.Biadene D.Magnone P.Mattavelli P. + IEEE OPEN JOURNAL OF INDUSTRY APPLICATIONS - -
Low-Frequency Voltage-Ripple Minimization of Asymmetric Multiport Y-Converter 2025 Farag Ahmed YahiaBiadene D.Caldognetto T.Magnone P.Mattavelli P. IEEE TRANSACTIONS ON POWER ELECTRONICS - -
Experimental analysis of variability in WS2-based devices for hardware security 2023 Magnone P. + SOLID-STATE ELECTRONICS - -
Influence of Power Cycling Test Methodology on the Applicability of the Linear Damage Accumulation Rule for the Lifetime Estimation in Power Devices 2023 Vaccaro A.Magnone P. IEEE TRANSACTIONS ON POWER ELECTRONICS - -
Predicting Lifetime of Semiconductor Power Devices under Power Cycling Stress using Artificial Neural Network 2023 Vaccaro A.Magnone P.Zilio A.Mattavelli P. IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS - -
Remaining Useful Lifetime Prediction of Discrete Power Devices by Means of Artificial Neural Networks 2023 Vaccaro A.Biadene D.Magnone P. IEEE OPEN JOURNAL OF POWER ELECTRONICS - -
Assessment of paper-based MoS2 FET for Physically Unclonable Functions 2022 Magnone P. + SOLID-STATE ELECTRONICS - -
Impact of Field-Plate Insulating Layer on Junction Breakdown Instability in OFT-Pw.MOSFET Devices 2022 Magnone P. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Enhanced Level-Shifted Modulation for a Three-Phase Five-level Modified Modular Multilevel Converter (MMC) 2021 Younis T.Mattavelli P.Magnone P. + IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS - -
Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation 2021 Magnone P.Pistollato S. + SOLID-STATE ELECTRONICS - -
Limiting power cycling stress in power MOSFETs by active thermal control 2020 Magnone P.Abedini H.Petucco A. MICROELECTRONICS RELIABILITY - -
Performance improvement of pulse width-amplitude modulation-based quasi-Z-source inverters: Analysis and implementation 2020 Mohammadi M.Mirzaee A.Magnone P.Mattavelli P. + INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS - -
Suppression of Second-Order Harmonic Current for Droop-Controlled Distributed Energy Resource Converters in DC Microgrids 2020 Liu, GuangyuanCaldognetto, TommasoMattavelli, PaoloMagnone, Paolo IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS - -
TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors 2020 Magnone P.Pistollato S. + MICROELECTRONICS RELIABILITY - -
Analysis of an On-Line Stability Monitoring Approach for DC Microgrid Power Converters 2019 Khodamoradi, AramLiu, GuangyuanMattavelli, PaoloCaldognetto, TommasoMagnone, Paolo IEEE TRANSACTIONS ON POWER ELECTRONICS - -
Power-Based Droop Control in DC Microgrids Enabling Seamless Disconnection From Upstream Grids 2019 G. LiuT. CaldognettoP. MattavelliP. Magnone IEEE TRANSACTIONS ON POWER ELECTRONICS - -
Investigation of degradation mechanisms in low-voltage p-channel power MOSFETs under High Temperature Gate Bias stress 2018 Magnone, P. + MICROELECTRONICS RELIABILITY - -
PBTI in GaN-HEMTs With p-Type Gate: Role of the Aluminum Content on $Δ VTH and Underlying Degradation Mechanisms 2018 Magnone, Paolo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices 2017 MAGNONE, PAOLO + MEASUREMENT - -
Impact of AlN layer sandwiched between the GaN and the Al2O3layers on the performance and reliability of recessed AlGaN/GaN MOS-HEMTs 2017 Magnone, P. + MICROELECTRONIC ENGINEERING - -