MAGGIPINTO, MARCO

MAGGIPINTO, MARCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Computer Vision-inspired Deep Learning Architecture for Virtual Metrology modeling with 2-Dimensional Data 2018 Marco MaggipintoMatteo TerziA. BeghiG. A. Susto + IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING - -
A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology 2018 Marco MaggipintoChiara MasieroA. BeghiG. A. Susto PROCEDIA MANUFACTURING - -
A Deep Convolutional Autoencoder-Based Approach for Anomaly Detection With Industrial, Non-Images, 2-Dimensional Data: A Semiconductor Manufacturing Case Study 2022 Maggipinto, MarcoBeghi, AlessandroSusto, Gian Antonio IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING - -
A deep learning-based approach to anomaly detection with 2-dimensional data in manufacturing 2019 Maggipinto M.Beghi A.Susto G. A. - IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS IEEE International Conference on Industrial Informatics (INDIN)
A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing 2018 G. A. SustoM. Maggipinto + PROCEDIA MANUFACTURING - -
Adversarial training reduces information and improves transferability 2021 Matteo TerziMarco MaggipintoGian Antonio Susto + - - AAAI Conference on Artificial Intelligence
Deep learning for virtual metrology: Modeling with optical emission spectroscopy data 2017 Terzi, MatteoMasiero, ChiaraBeghi, AlessandroMAGGIPINTO, MARCOSusto, Gian Antonio - - RTSI 2017 - IEEE 3rd International Forum on Research and Technologies for Society and Industry, Conference Proceedings
DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology 2019 Maggipinto M.Beghi A.Susto G. A. + JOURNAL OF PROCESS CONTROL - -
Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images 2021 Carletti M.Gentner N.Maggipinto M.Beghi A.Susto G. A. + IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING - -
Induced Start Dynamic Sampling for Wafer Metrology Optimization 2020 Susto G. A.Maggipinto M. + IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING - -
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing 2020 Carletti M.Maggipinto M.Beghi A.Susto G.Gentner N. + - PROCEEDINGS - WINTER SIMULATION CONFERENCE Proceedings - Winter Simulation Conference
IntroVAC: Introspective Variational Classifiers for learning interpretable latent subspaces 2022 Maggipinto, MarcoTerzi, MatteoSusto, Gian Antonio ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE - -
Laundry Fabric Classification in Vertical Axis Washing Machines Using Data-Driven Soft Sensors 2019 Marco MaggipintoGiuliano ZamboninAlessandro BeghiGian Antonio Susto. + ENERGIES - -
Machine Learning-based Laundry Weight Estimation for Vertical Axis Washing Machines 2018 G. A. SustoMAGGIPINTO, MARCOA. Beghi + - - Proceedings of the 2018 European Control Conference (ECC)
On Optimising Spatial Sampling Plans for Wafer Profile Reconstruction 2018 M. MaggipintoG. A. Susto + - - IFAC-PapersOnLine
Probabilistic Word Embeddings in Neural IR: A Promising Model That Does Not Work as Expected (For Now) 2019 Purpura, AlbertoMaggipinto, MarcoSilvello, GianmariaSusto, Gian Antonio - - Proceedings of the 2019 ACM SIGIR International Conference on Theory of Information Retrieval
Proximal Deterministic Policy Gradient 2020 Marco MaggipintoGian Antonio Susto + - - IEEE International Conference on Intelligent Robots and Systems
What are the most informative data for virtual metrology? a use case on multi-stage processes fault prediction 2019 Maggipinto M.Susto G. A. + - IEEE INTERNATIONAL CONFERENCE ON AUTOMATION SCIENCE AND ENGINEERING IEEE International Conference on Automation Science and Engineering
ß-variational classifiers under attack 2020 Maggipinto M.Terzi M.Susto G. A. - IFAC-PAPERSONLINE IFAC-PapersOnLine