GENTNER, NATALIE

GENTNER, NATALIE  

Università di Padova  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Scalable Deep Learning-Based Approach for Anomaly Detection in Semiconductor Manufacturing 2021 Susto G. A.Gentner N. + - PROCEEDINGS - WINTER SIMULATION CONFERENCE Proceedings - Winter Simulation Conference
DBAM: Making Virtual Metrology/Soft sensing with time series data scalable through Deep Learning 2021 Gentner N.Carletti M.Susto G. A. + CONTROL ENGINEERING PRACTICE - -
Deep Learning-based Sequence Modeling for Advanced Process Control in Semiconductor Manufacturing 2023 Gentner, NatalieSusto, Gian Antonio + IFAC PAPERSONLINE - -
Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation 2024 N. GentnerG. A. Susto + - - Proceeding of the 2024 10th International Conference on Control, Decision and Information Technologies (CoDIT)
Enhancing Scalability of Deep Learning Based Approaches in Semiconductor Manufacturing 2023 GENTNER, NATALIE - - -
Enhancing Scalability of Virtual Metrology: A Deep Learning-Based Approach for Domain Adaptation 2020 Gentner N.Carletti M.Susto G. A. + - PROCEEDINGS - WINTER SIMULATION CONFERENCE Proceedings - Winter Simulation Conference
Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images 2021 Carletti M.Gentner N.Maggipinto M.Beghi A.Susto G. A. + IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING - -
Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS) 2024 Gentner, NatalieSusto, Gian Antonio COMPUTERS & INDUSTRIAL ENGINEERING - -
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing 2020 Carletti M.Maggipinto M.Beghi A.Susto G.Gentner N. + - PROCEEDINGS - WINTER SIMULATION CONFERENCE Proceedings - Winter Simulation Conference
Predictive Maintenance in the Industry: A Comparative Study on Deep Learning-based Remaining Useful Life Estimation 2023 Lorenti, LucianoPezze, Davide DalleAndreoli, JacopoMasiero, ChiaraGentner, NatalieSusto, Gian Antonio + - - Proceeding of the 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)