statistiche ricercatore

Nome	#
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs	59
Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications	34
Degradation Processes and Aging in Quantum Dot Lasers on Silicon	29
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate	26
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate	24
Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon	17
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study	11
Optical Degradation of InAs Quantum-Dot lasers on Silicon: Dependence on Temperature and on Diffusion Processes	11
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits	10
Advanced Characterization and Modeling of Laser Diodes for Silicon Photonics	9
Degradation mechanisms of laser diodes for silicon photonics applications	7
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits	7
Improving the Reliability of InAs Quantum-Dot Laser Diodes for Silicon Photonics: the Role of Trapping Layers and Misfit-Dislocation Density	5
Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations	1
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization	1
Totale	251

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2020/2021	13	0	0	0	0	0	0	0	0	0	0	0	13
2021/2022	37	0	0	0	0	0	3	11	7	3	0	6	7
2022/2023	109	7	1	1	0	6	5	4	2	8	0	55	20
2023/2024	92	19	11	6	5	8	2	18	2	13	8	0	0
Totale													251