ZENARI, MICHELE
ZENARI, MICHELE
Dipartimento di Ingegneria dell'Informazione - DEI
Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations
2023 Zenari, M.; Buffolo, M.; De Santi, C.; Goyvaerts, J.; Grabowski, A.; Gustavsson, J.; Baets, R.; Larsson, A.; Roelkens, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization
2023 Zenari, Michele; Buffolo, Matteo; De Santi, Carlo; Norman, Justin; Hughes, Eamonn T.; Bowers, John E.; Herrick, Robert; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Advanced Characterization and Modeling of Laser Diodes for Silicon Photonics
2024 Zenari, Michele
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
2023 Zenari, M.; Buffolo, M.; Fornasier, M.; De Santi, C.; Goyvaerts, J.; Grabowsky, A.; Gustavsson, J.; Kumari, S.; Stassren, A.; Baets, R.; Larsson, A.; Roelkens, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study
2022 Zenari, M; Buffolo, M; De Santi, C; Norman, J; Meneghesso, G; Bowers, Je; Zanoni, E; Meneghini, M
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate
2021 Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Degradation mechanisms of laser diodes for silicon photonics applications
2023 De Santi, C.; Buffolo, M.; Zenari, M.; Shang, C.; Bowers, J. E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Degradation Processes and Aging in Quantum Dot Lasers on Silicon
2023 Meneghini, Matteo; Buffolo, Matteo; Zenari, Michele; DE SANTI, Carlo; Herrick, Robert W.; Shang, Chen; Wan, Yating; Feng, Kaiyin; Hughes, Eamonn; Bowers, John; Meneghesso, Gaudenzio; Zanoni, Enrico
Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications
2021 Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Meneghesso, G.; Bowers, J. E.; Zanoni, E.; Meneghini, M.
Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon
2022 Zenari, M.; Buffolo, M.; De Santi, C.; Shang, C.; Hughes, E.; Wan, Y.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Improving the Reliability of InAs Quantum-Dot Laser Diodes for Silicon Photonics: the Role of Trapping Layers and Misfit-Dislocation Density
2023 Buffolo, M.; Zenari, M.; De Santi, C.; Shang, C.; Hughes, E.; Wan, Y.; Bowers, J. E.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
2023 Buffolo, M.; Zenari, M.; Fornasier, M.; De Santi, C.; Goyvaerts, J.; Grabowski, A.; Gustavsson, J.; Kumari, S.; Stassen, A.; Morthier, Geert; Baets, R.; Larsson, A.; Roelkens, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics
2024 Zenari, Michele; Buffolo, Matteo; Santi, Carlo De; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan; Baets, Roel; Larsson, Anders; Roelkens, Günther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Optical Degradation of InAs Quantum-Dot lasers on Silicon: Dependence on Temperature and on Diffusion Processes
2022 Buffolo, M; Zenari, M; De Santi, C; Norman, J; Bowers, Je; Herrick, Rw; Meneghesso, G; Zanoni, E; Meneghini, M
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate
2022 Buffolo, M.; Lain, F.; Zenari, M.; Santi, C. D.; Norman, J.; Bowers, J. E.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
2023 Zenari, M; Buffolo, M; Fornasier, M; De Santi, C; Goyvaerts, J; Grabowski, A; Gustavsson, J; Kumari, S; Stassren, A; Baets, R; Larsson, A; Roelkens, G; Meneghesso, G; Zanoni, E; Meneghini, M