ZENARI, MICHELE

ZENARI, MICHELE  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 16 di 16 (tempo di esecuzione: 0.028 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations 2023 Zenari, M.Buffolo, M.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. + - - Proceedings of 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization 2023 Zenari, MicheleBuffolo, MatteoDe Santi, CarloMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + ACS PHOTONICS - -
Advanced Characterization and Modeling of Laser Diodes for Silicon Photonics 2024 ZENARI, MICHELE - - -
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits 2023 Zenari M.Buffolo M.Fornasier M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study 2022 Zenari, MBuffolo, MDe Santi, CMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 11990, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2022
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate 2021 Zenari M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Degradation mechanisms of laser diodes for silicon photonics applications 2023 De Santi C.Buffolo M.Zenari M.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Degradation Processes and Aging in Quantum Dot Lasers on Silicon 2023 Matteo MeneghiniMatteo BuffoloMichele ZenariCarlo De SantiGaudenzio MeneghessoEnrico Zanoni + - - Proceeding of CLEO, Conference on Lasers and Electro-Optics, 2023
Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications 2021 Zenari M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon 2022 Zenari M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Improving the Reliability of InAs Quantum-Dot Laser Diodes for Silicon Photonics: the Role of Trapping Layers and Misfit-Dislocation Density 2023 Buffolo M.Zenari M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs 2023 M. BuffoloM. ZenariM. FornasierC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceeding of CLEO, Conference on Lasers and Electro-Optics, 2023
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics 2024 Zenari, MicheleBuffolo, MatteoSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Optical Degradation of InAs Quantum-Dot lasers on Silicon: Dependence on Temperature and on Diffusion Processes 2022 Buffolo, MZenari, MDe Santi, CMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12021, Novel In-Plane Semiconductor Lasers XXI
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate 2022 Buffolo M.Zenari M.Santi C. D.Meneghesso G.Zanoni E.Meneghini M. + IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS - -
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits 2023 Zenari, MBuffolo, MFornasier, MDe Santi, CMeneghesso, GZanoni, EMeneghini, M + IEEE JOURNAL OF QUANTUM ELECTRONICS - -