ZENARI, MICHELE
ZENARI, MICHELE
Università di Padova
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study
2022 Zenari, M; Buffolo, M; De Santi, C; Norman, J; Meneghesso, G; Bowers, Je; Zanoni, E; Meneghini, M
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate
2021 Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications
2021 Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Meneghesso, G.; Bowers, J. E.; Zanoni, E.; Meneghini, M.
Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon
2022 Zenari, M.; Buffolo, M.; De Santi, C.; Shang, C.; Hughes, E.; Wan, Y.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Optical Degradation of InAs Quantum-Dot lasers on Silicon: Dependence on Temperature and on Diffusion Processes
2022 Buffolo, M; Zenari, M; De Santi, C; Norman, J; Bowers, Je; Herrick, Rw; Meneghesso, G; Zanoni, E; Meneghini, M
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate
2022 Buffolo, M.; Lain, F.; Zenari, M.; Santi, C. D.; Norman, J.; Bowers, J. E.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Meneghini, M.