In this paper we present a detailed characterization of kink effects in AlGaN/GaN HEMTs. Our data suggest that kink is due to a shift in the device pinch-off voltages resulting from electron trapping in the GaN buffer layer. The presence of the kink is fully correlated with the appearance of the ???yellow luminescence??? broad peak in cathodolumine-scence spectra taken on the device active area, thus confirming that cathodoluminescence and photolumi-nescence spectroscopy may represent valuable techniques for the screening of this parasitic effect.

Kink and Cathodoluminescence in AlGaN/GaN HEMTs

MENEGHESSO, GAUDENZIO;STOCCO, ANTONIO;RONCHI, NICOLO';ZANONI, ENRICO;
2010

Abstract

In this paper we present a detailed characterization of kink effects in AlGaN/GaN HEMTs. Our data suggest that kink is due to a shift in the device pinch-off voltages resulting from electron trapping in the GaN buffer layer. The presence of the kink is fully correlated with the appearance of the ???yellow luminescence??? broad peak in cathodolumine-scence spectra taken on the device active area, thus confirming that cathodoluminescence and photolumi-nescence spectroscopy may represent valuable techniques for the screening of this parasitic effect.
2010
WOCSDICE 2010 34rd Workshop on Compound Semiconductor Devices and Integrated Circuits,
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2437618
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