RECH, PAOLO

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RECH, PAOLO

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Risultati 1 - 7 di 7 (tempo di esecuzione: 0.014 secondi).

A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility

2007 Violante, M; Sterpone, L.; Manuzzato, Andrea; Gerardin, Simone; Rech, Paolo; Bagatin, Marta; Paccagnella, Alessandro; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Pontarelli, S.; Frost, C.

DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study

2009 Appello, D; Bernardi, P; Gerardin, Simone; Grosso, M.; Paccagnella, Alessandro; Rech, Paolo; Reorda, Ms

Evaluating Alpha-induced Soft Errors in Embedded Microprocessors

2009 Rech, Paolo; Gerardin, Simone; Paccagnella, Alessandro; Bernardi, P; Grosso, M; Reorda, Ms; Appello, D.

Evaluating the Impact of DfM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core

2010 Rech, Paolo; Paccagnella, Alessandro; Grosso, M; Reorda, Ms; Melchiori, F; Loparco, D; Appello, D.

Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs

2007 Manuzzato, Andrea; Rech, Paolo; Gerardin, Simone; Paccagnella, Alessandro; L., Sterpone; M., Violante

Soft Errors Induced By Neutrons and Alpha Particles in System on Chips

2010 Rech, Paolo

Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs

2014 L. L., Pilla; Rech, Paolo; Silvestri, Francesco; C., Frost; P. O. A., Navaux; M., Sonza Reorda; L., Carro

Titolo	Data di pubblicazione	Autori	Rivista	Serie	Titolo libro
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility	2007	Violante, MSterpone, L.MANUZZATO, ANDREAGERARDIN, SIMONERECH, PAOLOBAGATIN, MARTAPACCAGNELLA, ALESSANDROAndreani, C.Gorini, G.Pietropaolo, A.Cardarilli, G.Pontarelli, S.Frost, C. + -	IEEE TRANSACTIONS ON NUCLEAR SCIENCE	-	-
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study	2009	Appello DBernardi PGERARDIN, SIMONEGrosso M.PACCAGNELLA, ALESSANDRORECH, PAOLOReorda MS + -	-	-	2009 27TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors	2009	RECH, PAOLOGERARDIN, SIMONEPACCAGNELLA, ALESSANDROBernardi PGrosso MReorda MSAppello D. + -	-	-	2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
Evaluating the Impact of DfM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core	2010	RECH, PAOLOPACCAGNELLA, ALESSANDROGROSSO MREORDA MSMELCHIORI FLOPARCO DAPPELLO D. + -	IEEE TRANSACTIONS ON NUCLEAR SCIENCE	-	-
Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs	2007	MANUZZATO, ANDREARECH, PAOLOGERARDIN, SIMONEPACCAGNELLA, ALESSANDROL. STERPONEM. VIOLANTE + -	-	-	Defect and Fault Tolerance in VLSI Systems - VLSI 2007
Soft Errors Induced By Neutrons and Alpha Particles in System on Chips	2010	Rech, Paolo	-	-	-
Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs	2014	L. L. PillaRECH, PAOLOSILVESTRI, FRANCESCOC. FrostP. O. A. NavauxM. Sonza ReordaL. Carro + -	IEEE TRANSACTIONS ON NUCLEAR SCIENCE	-	-