BONALDO, STEFANO
BONALDO, STEFANO
Dipartimento di Ingegneria dell'Informazione - DEI
A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics
2022 Rosati, G.; Urban, M.; Zhao, L.; Yang, Q.; de Carvalho Castro e Silva, C.; Bonaldo, S.; Parolo, C.; Nguyen, E. P.; Ortega, G.; Fornasiero, P.; Paccagnella, A.; Merkoci, A.
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications
2022 Tonello, S.; Fapanni, T.; Bonaldo, S.; Giorgi, G.; Narduzzi, C.; Paccagnella, A.; Serpelloni, M.; Sardini, E.; Carrara, S.
Charge buildup and spatial distribution of interface traps in 65-nm pMOSFETs irradiated to ultrahigh doses
2019 Bonaldo, S.; Gerardin, S.; Jin, X.; Paccagnella, A.; Faccio, F.; Borghello, G.; Fleetwood, D. M.
DC response, low-frequency noise, and TID-induced mechanisms in 16-nm FinFETs for high-energy physics experiments
2022 Bonaldo, S.; Ma, T.; Mattiazzo, S.; Baschirotto, A.; Enz, C.; Fleetwood, D. M.; Paccagnella, A.; Gerardin, S.
Dose-rate sensitivity of 65-nm MOSFETs Exposed to ultrahigh doses
2018 Borghello, G.; Faccio, F.; Lerario, E.; Michelis, S.; Kulis, S.; Fleetwood, D. M.; Schrimpf, R. D.; Gerardin, S.; Paccagnella, A.; Bonaldo, S.
Electrochemical Biosensor for the Monitoring of Phages of in Milk-Based Samples
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Paccagnella, A.
Gate Bias and Length Dependences of Total-Ionizing-Dose Effects in InGaAs FinFETs on Bulk Si
2019 Zhao, S. E.; Bonaldo, S.; Wang, P.; Jiang, R.; Gong, H.; Zhang, E. X.; Waldron, N.; Kunert, B.; Mitard, J.; Collaert, N.; Sioncke, S.; Linten, D.; Schrimpf, R. D.; Reed, R. A.; Gerardin, S.; Paccagnella, A.; Fleetwood, D. M.
Impedimetric Screen-Printed Immunosensor for the Rapid Detection of Chagas Disease
2024 Chain, C. Y.; Franchin, L.; Cisneros, J. S.; Villagra, A. P. M.; Labriola, C. A.; Paccagnella, A.; Bonaldo, S.
Increased Device Variability Induced by Total Ionizing Dose in 16-nm Bulk nFinFETs
2022 Ma, T; Bonaldo, S; Mattiazzo, S; Baschirotto, A; Enz, C; Paccagnella, A; Gerardin, S
Influence of BSA Protein on Electrochemical Response of Genosensors
2023 Bonaldo, S.; Franchin, L.; Pasqualotto, E.; Cretaio, E.; Losasso, C.; Peruzzo, A.; Paccagnella, A.
Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs
2023 Bonaldo, S.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Margutti, G.; Gerardin, S.
Influence of Fin- and Finger-Number on TID Degradation of 16 nm Bulk FinFETs Irradiated to Ultra-High Doses
2022 Ma, T.; Bonaldo, S.; Mattiazzo, S.; Baschirotto, A.; Enz, C.; Paccagnella, A.; Gerardin, S.
Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses
2019 Bonaldo, S.; Mattiazzo, S.; Enz, C.; Baschirotto, A.; Paccagnella, A.; Jin, X.; Gerardin, S.
Influence of LDD Spacers and H+Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses
2018 Faccio, F.; Borghello, G.; Lerario, E.; Fleetwood, D. M.; Schrimpf, R. D.; Gong, H.; Zhang, E. X.; Wang, P.; Michelis, S.; Gerardin, S.; Paccagnella, A.; Bonaldo, S.
Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses
2020 Bonaldo, S.; Mattiazzo, S.; Enz, C.; Baschirotto, A.; Fleetwood, D. M.; Paccagnella, A.; Gerardin, S.
Low-frequency Noise and Defects in Copper and Ruthenium Resistors
2019 Fleetwood, D. M.; Beyne, S.; Jiang, R.; Zhao, S. E.; Wang, P.; Bonaldo, S.; Mccurdy, M. W.; Tokei, Zs.; Dewolf, I.; Croes, K.; Zhang, E. X.; Alles, M. L.; Schrimpf, R. D.; Reed, R. A.; Linten, D.
Multiphysics Modeling of Electrochemical Impedance Spectroscopy Responses of SAM-Modified Screen-Printed Electrodes
2024 Franchin, L.; Bonaldo, S.
Optical System Based on Nafion Membrane for the Detection of Ammonia in Blood Serum Samples
2022 Pasqualotto, E.; Cretaio, E.; Scaramuzza, M.; De Toni, A.; Franchin, L.; Paccagnella, A.; Bonaldo, S.
RadFET dose response in the CHARM mixed-field: FLUKA MC simulations
2017 Marzo, M.; Bonaldo, S.; Brugger, M.; Danzeca, S.; Alia, R. G.; Infantino, A.; Thornton, A.
Random telegraph noise in nanometer-scale CMOS transistors exposed to ionizing radiation
2023 Bonaldo, S.; Fleetwood, D. M.