BONALDO, STEFANO
BONALDO, STEFANO
Dipartimento di Ingegneria dell'Informazione - DEI
COTS BJT Radiation Qualification Methodology for Highly Distributed Systems in Mixed-Field Environments
2025 Andreetta, G.; Ferraro, R.; Zimmaro, A.; Bonaldo, S.; Paccagnella, A.; Thurel, Y.; Masi, A.; Danzeca, S.
Dynamic Voltage-Dependent Modeling of Single Event Transients in CMOS Ring Oscillators
2025 Kampati, V. S.; Bonaldo, S.; Leroux, P.; Prinzie, J.
Flexible microfluidics-integrated electrochemical system for detection of tumor necrosis factor-alpha under continuous flow of sweat
2025 Ploner, M.; Shkodra, B.; Franchin, L.; Altana, A.; Petrelli, M.; Costa Angeli, M. A.; Ciccone, G.; Antrack, T.; Vanzetti, L.; Nair, R. R.; Canteri, R.; Bonaldo, S.; Paccagnella, A.; Kleemann, H.; Resnati, D.; Lugli, P.; Erten, A.; Petti, L.
Impact of Cryogenic Temperatures on Radiation-Induced Parameter Shifts in RADFETs
2025 Neuendank, J.; Kirby, T.; Barnaby, H. J.; Bonaldo, S.; Greer, E.; Wallace, T.; Vaidyam, L. N. N.; Spear, M.; Muscat, P.; Chen, J.; Giorno, Z.; Macabou, E.
Plasmonic Biosensor of Cruzipain-Antibody Complexes Based on Gold Nano-gratings for Chagas Disease Screening
2025 Chain, C. Y.; Prieto, E. D.; Cisneros, J. S.; Daza Millone, M. A.; Ramirez, E. A.; Labriola, C. A.; Aniasi, V.; Villagra, A. P. M.; Franchin, L.; Paccagnella, A.; Bonaldo, S.
Single-Event Upset Characterization of a Shift Register in 16 nm FinFET Technology
2025 D'Aniello, F.; Tettamanti, M.; Shah, S. A. A.; Mattiazzo, S.; Bonaldo, S.; Vadalà, V.; Baschirotto, A.
The Effect of Number of Fins per Transistor on the TID Response of 12LP FinFET Technology
2025 Wallace, T.; Dodds, N. A.; Vidana, A. I.; Nathan Nowlin, R.; Dodd, B.; Barnaby, H. J.; Spear, M.; Neuendank, J.; Kauppila, J. S.; Haeffner, T. D.; Poe, G. D.; Vibbert, S. T.; Massengill, L. W.; Taggart, J. L.; Foran, B.; Bonaldo, S.
Total Ionizing Dose in nano-scaled CMOS technologies
2025 Faccio, F.; Borghello, G.; Bonaldo, S.
Bacteria-Based Biosensor for the Detection of Lactococcus Lactis Bacteriophage in Agrifood Industry
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Bertozzi, T.; Paccagnella, A.
Displacement Damage and Total Ionizing Dose induced by 3-MeV Protons in SiC Vertical Power MOSFETs
2024 Martinella, C.; Bonaldo, S.; Bagatin, M.; Gerardin, S.; Fur, N.; Gassenmeier, V.; Goncalves De Medeiros, H.; Paccagnella, A.; Grossner, U.
Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices
2024 Fleetwood, D. M.; Zhang, E. X.; Schrimpf, R. D.; Pantelides, S. T.; Bonaldo, S.
Electrochemical Biosensor for the Monitoring of Phages of in Milk-Based Samples
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Paccagnella, A.
Impedimetric Screen-Printed Immunosensor for the Rapid Detection of Chagas Disease
2024 Chain, C. Y.; Franchin, L.; Cisneros, J. S.; Villagra, A. P. M.; Labriola, C. A.; Paccagnella, A.; Bonaldo, S.
Influence of Surface Passivation on Campylobacter jejuni Specificity of an Impedimetric Genosensor for Poultry Infection Monitoring in Agri-food Industry
2024 Franchin, L.; Paccagnella, A.; Bonaldo, S.
Monitoring of Lactococcus lactis growth based on Reduced-Graphene Oxide TFT for Dairy Industry Applications
2024 Franchin, L.; Casalini, S.; Cester, A.; Paccagnella, A.; Bonaldo, S.
Multiphysics Modeling of Electrochemical Impedance Spectroscopy Responses of SAM-Modified Screen-Printed Electrodes
2024 Franchin, L.; Bonaldo, S.
Multiphysics modeling of the electrochemical response of screen-printed electrodes for sensing applications
2024 Bonaldo, S.; Franchin, L.; Rosati, G.; Merkoci, A.; Paccagnella, A.
Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs
2024 Bonaldo, S.; Wallace, T.; Barnaby, H.; Borghello, G.; Termo, G.; Faccio, F.; Fleetwood, D. M.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Gerardin, S.
Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh Doses
2024 Bonaldo, S.; Martinella, C.; Race, S.; Fur, N.; Mattiazzo, S.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Grossner, U.
RD53 pixel chips for the ATLAS and CMS Phase-2 upgrades at HL-LHC
2024 Loddo, F.; Andreazza, A.; Arteche, F.; Barbero, M. B.; Barillon, P.; Beccherle, R.; Bilei, G. M.; Bjalas, W.; Bonaldo, S.; Bortoletto, D.; Calderini, G.; Caratelli, A.; Christian, D. C.; Christiansen, J.; Conti, E.; Crescioli, F.; Daas, M.; De Robertis, G.; Demaria, N.; Deptuch, G. C.; Dieter, Y.; Dimitrievska, A.; Ding, L.; Esposito, S.; Exarchou, D.; Fahim, F.; Fioriti, A.; Fougeron, D.; Gaioni, L.; Garcia-Sciveres, M.; Gerardin, S.; Gnani, D.; Grippo, M.; Gromov, V.; Hamer, M.; Havranek, M.; Heim, T.; Hemperek, T.; Hinterkeuser, F.; Hoff, J.; Huiberts, S.; Janssen, J.; Jara Casas, L. M.; Jirsa, J.; John, J. J.; Kampkotter, J.; Karagounis, M.; Khwaira, Y.; Kluit, R.; Krieger, A.; Krueger, H.; Lalic, J.; Lauritzen, M.; Licciulli, F.; Lipton, R.; Liu, T.; Lopez Morillo, E.; Lounis, A.; Luongo, F.; Magazzu, G.; Marcisovsky, M.; Marconi, S.; Marquez Lasso, F.; Marzocca, C.; Mattiazzo, S.; Menouni, M.; Minuti, M.; Mironova, M.; Miryala, S.; Monteil, E.; Moustakas, K.; Muõz Chavero, F.; Neue, G.; Orfanelli, S.; Paccagnella, A.; Pacher, L.; Palla, F.; Palomo Pinto, F. R.; Papadopoulou, A.; Paterno, A.; Petri, A.; Placidi, P.; Pohl, D.; Pradas, A.; Prydderch, M. L.; Pulli, A.; Ratti, L.; Re, V.; Rehman, A.; Rymaszewski, P.; Solal, M. C.; Standke, M.; Stiller, A.; Strebler, T.; Stugu, B.; Thomas, S.; Traversi, G.; Vogrig, D.; Vogt, M.; Wang, T.; Yang, H.; Zdenko, J.; Zimmerman, T.