BONALDO, STEFANO

BONALDO, STEFANO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Mach-Zehnder interferometer for the fine control of the polarization status of a beam 2014 Bonaldo S.Pelizzo M. G. + - - Proceeding SPIE
A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics 2022 Bonaldo S.Paccagnella A. + BIOSENSORS & BIOELECTRONICS - -
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications 2022 Tonello S.Bonaldo S.Giorgi G.Narduzzi C.Paccagnella A. + IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT - -
An Electrochemical Biosensor for the Detection of Bacteriophage of Lactococcus Lactis 2023 Bonaldo S.Cretaio E.Scaramuzza M.Franchin L.Poggi S.Paccagnella A. + - LECTURE NOTES IN ELECTRICAL ENGINEERING Lecture Notes in Electrical Engineering
Charge buildup and spatial distribution of interface traps in 65-nm pMOSFETs irradiated to ultrahigh doses 2019 Bonaldo S.Gerardin S.Jin X.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
DC response, low-frequency noise, and TID-induced mechanisms in 16-nm FinFETs for high-energy physics experiments 2022 Bonaldo S.Ma T.Mattiazzo S.Paccagnella A.Gerardin S. + NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT - -
Design implementation and test results of the RD53A, a 65 nm large scale chip for next generation pixel detectors at the HL-LHC 2018 Marconi S.Bagatin M.Bisello D.Gerardin S.Mattiazzo S.Paccagnella A.Vogrig D.Bonaldo S. + - - 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings
Development of a Large Pixel Chip Demonstrator in RD53 for ATLAS and CMS Upgrades 2018 Bagatin, MartaBisello, DarioGerardin, SimoneMattiazzo, SerenaPaccagnella, AlessandroVogrig, DanieleBonaldo, Stefano + - - PoS(TWEPP-17)
Dose-rate sensitivity of 65-nm MOSFETs Exposed to ultrahigh doses 2018 Gerardin S.Paccagnella A.Bonaldo S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Electrochemical Biosensor for Timely Detection of Lactococcus Lactis Bacteriophage in Milk Samples 2023 Bonaldo S.Franchin L.Paccagnella A. + - PROCEEDINGS OF IEEE SENSORS ... Proceedings of IEEE Sensors
Gate Bias and Length Dependences of Total-Ionizing-Dose Effects in InGaAs FinFETs on Bulk Si 2019 Bonaldo S.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Increased Device Variability Induced by Total Ionizing Dose in 16-nm Bulk nFinFETs 2022 Ma, TBonaldo, SMattiazzo, SPaccagnella, AGerardin, S + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Influence of BSA Protein on Electrochemical Response of Genosensors 2023 Bonaldo S.Franchin L.Cretaio E.Losasso C.Paccagnella A. + IEEE SENSORS JOURNAL - -
Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs 2023 Bonaldo S.Mattiazzo S.Bagatin M.Paccagnella A.Gerardin S. + ELECTRONICS - -
Influence of Fin- and Finger-Number on TID Degradation of 16 nm Bulk FinFETs Irradiated to Ultra-High Doses 2022 Ma T.Bonaldo S.Mattiazzo S.Paccagnella A.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses 2019 Bonaldo S.Mattiazzo S.Paccagnella A.Jin X.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Influence of LDD Spacers and H+Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses 2018 Gerardin S.Paccagnella A.Bonaldo S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses 2020 Bonaldo S.Mattiazzo S.Paccagnella A.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Low-frequency Noise and Defects in Copper and Ruthenium Resistors 2019 Bonaldo S. + APPLIED PHYSICS LETTERS - -
Multiphysics simulations of screen-printed electrodes for electrochemical biosensing 2023 Bonaldo S.Tonello S.Franchin L.Paccagnella A. + - - 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings