BONALDO, STEFANO

BONALDO, STEFANO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 30 (tempo di esecuzione: 0.033 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Mach-Zehnder interferometer for the fine control of the polarization status of a beam 2014 Enrico TessaroloAlain J. CorsoStefano BonaldoPaola ZuppellaMaria Guglielmina Pelizzo - - Proceeding SPIE
SEE Cross Section Calibration and Application to Quasi-Monoenergetic and Spallation Facilities 2017 S. Bonaldo + - - EPJ Web Conferences
Simulation and Experiment in Neutron Induced Single Event Effects in SRAM 2017 S. GerardinM. BagatinS. Bonaldo + - - RADECS conference proceedings
RadFET dose response in the CHARM mixed-field: FLUKA MC simulations 2017 Stefano Bonaldo + EPJ NUCLEAR SCIENCES & TECHNOLOGIES - -
Development of a Large Pixel Chip Demonstrator in RD53 for ATLAS and CMS Upgrades 2018 Bagatin, MartaBisello, DarioGerardin, SimoneMattiazzo, SerenaPaccagnella, AlessandroVogrig, DanieleBonaldo, Stefano + - - PoS(TWEPP-17)
Influence of LDD Spacers and H+Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses 2018 Gerardin, SimonePaccagnella, AlessandroBONALDO, STEFANO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Dose-rate sensitivity of 65-nm MOSFETs Exposed to ultrahigh doses 2018 Gerardin, SimonePaccagnella, AlessandroBONALDO, STEFANO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Design implementation and test results of the RD53A, a 65 nm large scale chip for next generation pixel detectors at the HL-LHC 2018 Marconi S.Stabile A.Bagatin M.Bisello D.Gerardin S.Mattiazzo S.Paccagnella A.Vogrig D.Bonaldo S. + - - 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings
Single Event Effect cross section calibration and application to quasi-monoenergetic and spallation facilities 2018 Bonaldo, Stefano + EPJ NUCLEAR SCIENCES & TECHNOLOGIES - -
RD53A: a large scale prototype for HL-LHC silicon pixel detector phase 2 upgrades 2019 Stabile, A.Bagatin, M.Bisello, D.Gerardin, S.Mattiazzo, S.Paccagnella, A.Vogrig, D.Bonaldo, S. + - - PoS
Low-frequency Noise and Defects in Copper and Ruthenium Resistors 2019 S. Bonaldo + APPLIED PHYSICS LETTERS - -
Pulsed Laser-Induced Single-Event Transients in InGaAs FinFETs with sub-10-nm Fin Widths 2019 Bonaldo S. + - - 2019 19th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2019
Charge buildup and spatial distribution of interface traps in 65-nm pMOSFETs irradiated to ultrahigh doses 2019 Stefano BonaldoSimone GerardinAlessandro Paccagnella + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Gate Bias and Length Dependences of Total-Ionizing-Dose Effects in InGaAs FinFETs on Bulk Si 2019 Stefano BonaldoSimone GerardinAlessandro Paccagnella + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Test results and prospects for RD53A, a large scale 65 nm CMOS chip for pixel readout at the HL-LHC 2019 M. BagatinD. BiselloS. GerardinS. MattiazzoA. PaccagnellaD. VogrigS. Bonaldo + NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT - -
Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses 2019 Bonaldo, StefanoMattiazzo, SerenaPaccagnella, AlessandroGerardin, Simone + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
RD53 analog front-end processors for the ATLAS and CMS experiments at the high-luminosity LHC 2019 Bagatin M.Gerardin S.Mattiazzo S.Paccagnella A.Bonaldo S. + POS PROCEEDINGS OF SCIENCE - Proceedings of Science
Total Ionizing Dose Degradation Mechanisms in Nanometer-scale Microelectronic Technologies 2019 Bonaldo, Stefano - - -
Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses 2020 Bonaldo S.Mattiazzo S.Paccagnella A.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs with HfO2/Al2O3 Dielectrics 2020 Bonaldo S.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -