The aim of this work is to present the results of an extensive reliability analysis carried out on two different types of commercial white LEDs. In order to analyze the effects of operating current and storage temperature on the electro-optical properties of these devices, isothermal, iso-current and pure thermal stress tests were performed for several thousands hours; we used storage and junction temperatures in the range 60-200°C, and current levels in the range 0.5 A - 1.5 A. The two types of LEDs showed marked differences in the degradation kinetics especially for the electro-optical modifications of the chip.

The role of operating conditions in the chip-level degradation of white LEDs

DAL LAGO, MATTEO;MENEGHINI, MATTEO;TRIVELLIN, NICOLA;MENEGHESSO, GAUDENZIO;ZANONI, ENRICO
2011

Abstract

The aim of this work is to present the results of an extensive reliability analysis carried out on two different types of commercial white LEDs. In order to analyze the effects of operating current and storage temperature on the electro-optical properties of these devices, isothermal, iso-current and pure thermal stress tests were performed for several thousands hours; we used storage and junction temperatures in the range 60-200°C, and current levels in the range 0.5 A - 1.5 A. The two types of LEDs showed marked differences in the degradation kinetics especially for the electro-optical modifications of the chip.
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11577/2477596
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact