MENEGHINI, MATTEO

MENEGHINI, MATTEO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 718 (tempo di esecuzione: 0.031 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Reliability of GaN-based LEDs 2004 MENEGHESSO, GAUDENZIOLEVADA, SIMONEMENEGHINI, MATTEOZANONI, ENRICO - - -
Study of short-term instabilities in InGaN/GaN light-emitting diodes by means of capacitance voltage measurements and deep-level transient spectroscopy 2004 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOLEVADA, SIMONEZANONI, ENRICO + - - -
Short-term instabilities of InGaN/GaN light-emitting diodes by capacitance-voltage characteristics and junction spectroscopy 2005 MENEGHINI, MATTEOLEVADA, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + PHYSICA STATUS SOLIDI C - -
Role of deep levels in DC current aging of GaN/InGaN Light-Emitting Diodes studied by Capacitance and Photocurrent Spectroscopy 2005 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOLEVADA, SIMONEZANONI, ENRICO + - - -
Failure mechanisms of gallium nitride LEDs related with passivation 2005 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOLEVADA, SIMONEMENEGHESSO, GAUDENZIOTAMIAZZO, GIANLUCAZANONI, ENRICO + - - -
Factors limiting the High Brightness InGaN LEDs performance at high injection current bias 2005 LEVADA, SIMONEMENEGHINI, MATTEOTAZZOLI, AUGUSTOBUSO, SIMONESPIAZZI, GIORGIOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Analysis of DC Current Accelerated Life Tests of GaN LEDs Using a Weibull-Based Statistical Model 2005 LEVADA, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes 2006 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
High-temperature failure of GaN LEDs related with passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + SUPERLATTICES AND MICROSTRUCTURES - -
Temperature and current dependence of the optical intensity and energy shift in blue InGaN-based light-emitting diodes: comparison between electroluminescence and cathodoluminescence 2006 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
High-temperature degradation of GaN LEDs related to passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Temperature dependence of the electrical activity of localized defects in InGaN-based light emitting diodes 2006 MENEGHINI, MATTEOZANONI, ENRICO + APPLIED PHYSICS LETTERS - -
High temperature instabilities of GaN LEDs related to passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High brightness GaN LEDs degradation during dc and pulsed stress 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
High Brightness InGaN LEDs Degradation at High Injection Current Bias 2006 BUSO, SIMONEMENEGHINI, MATTEOZANONI, ENRICOSPIAZZI, GIORGIOMENEGHESSO, GAUDENZIO + - - Proceeedings IEEE International Reliability Physics Symposium
Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions 2006 MENEGHINI, MATTEOZANONI, ENRICOBUSO, SIMONESPIAZZI, GIORGIOMENEGHESSO, GAUDENZIO + - - Proceedings of the Sixth International Conference on Solid State Lighting
Thermal degradation of InGaN/GaN LEDs ohmic contacts 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
An analysis of the compositional techniques in John Chowning's Stria 2007 MENEGHINI, MATTEO COMPUTER MUSIC JOURNAL - -
A review of failure modes and mechanisms of GaN-based HEMT's 2007 ZANONI, ENRICOMENEGHESSO, GAUDENZIODANESIN, FRANCESCAMENEGHINI, MATTEORAMPAZZO, FABIANATAZZOLI, AUGUSTOZANON, FRANCO + - - -
High temperature electro-optical degradation of InGaN/GaN HBLEDs 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -