DAL LAGO, MATTEO

DAL LAGO, MATTEO  

Mostra records
Risultati 1 - 20 di 29 (tempo di esecuzione: 0.03 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
"Hot-plugging" of LED modules: Electrical characterization and device degradation 2013 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
A study on the reverse-bias and ESD instabilities of InGaN-based green LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOTRIVELLIN, NICOLADAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. SPIE Vol. 7617, 76170M
Analysis of the mechanisms limiting the reliability of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - 2015 IEEE 1st International Forum on Research and Technologies for Society and Industry, RTSI 2015 - Proceedings
Characterization and endurance study of aluminate/silicate/garnet/nitride phosphors for high-performance SSLLight-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVII 2013 TRIVELLIN, NICOLAMENEGHINI, MATTEODAL LAGO, MATTEOBARBISAN, DIEGOFERRETTI, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVIILight-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVII
Chip and package-related degradation of high power white LEDs 2012 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Degradation mechanisms of high power LEDs 2013 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proc. of the LED Professional Symposium LpS 2013
Degradation Mechanisms of High Power LEDs for Lighting Applications: an overview 2014 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
Degradation mechanisms of high-power white LEDs activated by current and temperature 2011 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
Degradation Mechanisms of white LEDs for lighting applications 2010 MENEGHINI, MATTEODAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - ISROS 2010, 2nd International Symposium on Reliability of Optoelectronics For Space
Design of tunable white LED systems to improve physical and emotional wellness 2014 TRIVELLIN, NICOLADAL LAGO, MATTEOMENEGHINI, MATTEOFERRETTI, MARCOBARBISAN, DIEGOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proceedings of LED Professional Symposium LpS 2014
Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting 2015 TRIVELLIN, NICOLAMENEGHINI, MATTEOFERRETTI, MARCOBARBISAN, DIEGODAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - 2015 IEEE 1st International Forum on Research and Technologies for Society and Industry, RTSI 2015 - Proceedings
Effects of Electro-Thermal stress on AlGaN deep-ultraviolet LEDs 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEODAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements 2014 MENEGHINI, MATTEOVACCARI, SIMONEDAL LAGO, MATTEOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms 2014 DAL LAGO, MATTEOMENEGHINI, MATTEODE SANTI, CARLOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
ESD Performances of state-of-the-art RGB LEDs and modules 2014 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLABARBATO, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proceedings of LED Professional Symposium LpS 2014
Failure causes and mechanisms of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMONTI, DESIREEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
GaN-based LEDs: State of the art and reliability-limiting mechanisms 2014 ZANONI, ENRICOMENEGHINI, MATTEOTRIVELLIN, NICOLADAL LAGO, MATTEOMENEGHESSO, GAUDENZIO - - Proc. of 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (KEYNOTE)
High-Temperature Reliability of Retrofit LED Bulbs 2015 M. Dal LagoM. BuffoloC. De SantiN. TrivellinM. MeneghiniG. MeneghessoE. Zanoni - - Proceedings of the 5th International LED professional Symposium, LpS 2015
Innovative methodology for testing the reliability of LED based systems 2012 TRIVELLIN, NICOLAMENEGHINI, MATTEODAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - -
Mechanisms Limiting the Performance and the Reliability of White LEDs 2014 TRIVELLIN, NICOLAMENEGHINI, MATTEODAL LAGO, MATTEOBARBISAN, DIEGOFERRETTI, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proc. of FOTONICA 2014 Convegno Italiano delle Tecnologie Fotoniche 16° edizione