TRIVELLIN, NICOLA

TRIVELLIN, NICOLA  

Dipartimento di Ingegneria Industriale - DII  

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Risultati 1 - 20 di 148 (tempo di esecuzione: 0.036 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
High temperature degradation of ohmic contacts on p-GaN 2007 TRIVELLIN, NICOLAMENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Analysis of the Degradation of Blu-Ray Laser Diodes 2008 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Analysis of the role of current in the degradation of InGaN-based laser diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Role of non-radiative recombination in the degradation of InGaN-based laser diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Combined Optical And Electrical Analysis of AlGaN-Based Deep-UV LEDs Reliability 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Thermal-activated degradation mechanism on Phosphor-Converted Light Emitting Diode 2008 TREVISANELLO, LORENZO ROBERTOTRIVELLIN, NICOLAMENEGHINI, MATTEOZANONI, ENRICOMENEGHESSO, GAUDENZIO - - -
Extensive analysis of the degradation of blu-ray laser diodes 2008 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTRIVELLIN, NICOLAZANONI, ENRICO + IEEE ELECTRON DEVICE LETTERS - -
Electro-thermally Activated Degradation of Blu-Ray GaN-based Laser Diodes 2008 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Reliability of deep-UV light-emitting diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Analysis of the Diffusion Involved in the Degradation of InGaN-Based Laser Diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 2009 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICO + - - -
Leakage current and reverse-bias luminescence in InGaN-based light-emitting diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + APPLIED PHYSICS LETTERS - -
Non-Radiative lifetime variation during the degradation of Blu-Ray InGaN Laser Diode 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Degradation of InGaN-Based Leds Induced by Reverse Bias Stress 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Extensive analysis of the degradation of phosphor-converted LEDs 2009 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. SPIE 7422, 74220H, 2009, Ninth International Conference on Solid State Lighting
Effects of Electro-Thermal stress on AlGaN deep-ultraviolet LEDs 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEODAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Analysis of the role of current in the degradation of InGaN-based laser diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + PHYSICA STATUS SOLIDI. C, CURRENT TOPICS IN SOLID STATE PHYSICS - -
Analysis of the physical mechanisms responsible for leakage current and reverse-bias luminescence in green LEDs 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Reliability evaluation for Blu-Ray laser diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Reliability analysis of InGaN Blu-Ray laser diode 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -