04.01 - Contributo in atti di convegno: [38401] Home page tipologia

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Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 21 a 40 di 38.401
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Local stress estimation in woven composites: a multiscale model 2022 Lamon FCarraro PAMaragoni LQuaresimin M - - ECCM20
Analysis of the multilayer effect on the fatigue behaviour of woven composites 2021 Lamon FCarraro PAMaragoni LQuaresimin M - - ICFC8
Analysis of multiple crack initiation and propagation in glass/epoxy woven fabrics under cyclic loadings 2021 Lamon FMaragoni LCarraro PAQuaresimin M - - ICFC8
Analysis of Ultra-High Bypass Ratio Turbofan Nacelle Geometries With Conventional and Short Intakes at Take-Off and Cruise 2022 Magrini A.Buosi D.Benini E. - - ASME Turbo Expo 2022: Turbomachinery Technical Conference and Exposition
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives 2022 M. Meneghini - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Probing carrier transport and recombination processes in dichromatic GaN-based LEDs: a nonequilibrium Green’s function study 2022 C. CasuN. RoccatoC. De SantiM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Effects of the generation and relocation of defects during the aging process of InGaN-based multi quantum well light emitting diodes 2022 C. CasuM. BuffoloA. CariaC. De SantiE. ZanoniG. MeneghessoM. Meneghini - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 2022 F. PivaN. RoccatoM. BuffoloC. De SantiM. PilatiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Reliability of commercial UV-C LEDs for disinfection purposes 2022 N. TrivellinF. PivaD. FiorimonteM. BuffoloC. De SantiE. ZanoniG. MeneghessoM. Meneghini - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Modeling of TAT-related forward leakage current in InGaN/GaN SQW LEDs based on experimentally-determined defects parameters 2022 M. BuffoloN. RoccatoFrancesco PivaCarlo De SantiG. VerzellesiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Deep levels effects and on-wafer reliability of 0.15 um InAlN/GaN and InAlGaN/GaN HEMTs with AlGaN backbarrier for RF applications 2022 Z. GaoF. ChiocchettaM. FornasierM. SaroE. StramareA. TonelloC. SharmaN. ModoloC. De SantiF. RampazzoG. MeneghessoM. MeneghiniE. Zanoni + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Modeling the EQE spectral shape of InGaN-GaN Multi-Quantum Wells Solar Cells 2022 A. CariaC. De SantiM. NicolettoM. BuffoloG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride semiconductors
Physics-based extraction of trap distribution in AlGaN/GaN HEMTs from stretched exponentials 2022 Carlo De SantiNicola ModoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Trap parameter extraction and compact modeling of non-ideal dynamic performance in AlGaN/GaN HEMTs 2022 Carlo De SantiNicola ModoloGiulio BaratellaMatteo BorgaGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Hot-electron trapping and electric field redistribution in 0.15 µm RF AlGaN/GaN HEMT with single or double layer AlGaN backbarrier 2022 F. ChiocchettaZ. GaoM. FornasierN. ModoloC. De SantiF. RampazzoM. MeneghiniG. MeneghessoE. Zanoni - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Trapping and reliability of wide bandgap devices 2022 Carlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini - - Proceedings of the 2022 European Solid-state Devices and Circuits Conference
Modeling Hot-Electron Trapping in GaN-based HEMTs 2022 Modolo N.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS IEEE International Reliability Physics Symposium Proceedings
Il filo che ricuce. Linee lente antifragilità per patrimoni rurali in scomparsa 2020 Catherine Dezio - - L'urbanistica italiana di fronte all'agenda 2030. Portare territori e comunità sulla strada della sostenibilità e della resilienza
Observatory of Resilience Practices: strategies and perspectives 2016 C. Dezio + - - Sustainability of Territories in the Context of Global Changes” 1st AMSR CONGRESS, 23rd APDR CONGRESS_30-31/5/2016, Marrakech (Morocco)
The role of local community for Resilience of Agrarian Cultural Landscape 2016 C. Dezio + - - Sustainability of Territories in the Context of Global Changes” 1st AMSR CONGRESS and 23rd APDR CONGRESS_30-31/5/2016, Marrakech (Morocco)
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 21 a 40 di 38.401
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Tipologia
  • 04 CONTRIBUTO IN ATTO DI CONVEGNO38401
Autore
  • MENEGHESSO, GAUDENZIO630
  • ZORZI, MICHELE602
  • ZANONI, ENRICO531
  • MENEGHINI, MATTEO383
  • MODENA, CLAUDIO333
  • MATTAVELLI, PAOLO328
  • NORBERTO, LORENZO282
  • MAIORANA, CARMELO243
  • VALLUZZI, MARIA ROSA237
  • PLEBANI, MARIO233
Data di pubblicazione
  • In corso di stampa95
  • 2020 - 20232228
  • 2010 - 201915109
  • 2000 - 200914877
  • 1990 - 19994375
  • 1980 - 19891519
  • 1970 - 1979192
  • 1967 - 19695
Editore
  • Institute of Electrical and Elect...1056
  • IEEE551
  • Springer304
  • SPIE213
  • Springer Verlag190
  • IEEE Computer Society151
  • Elsevier111
  • CLEUP101
  • Padova University Press92
  • Association for Computing Machinery89
Rivista
  • LECTURE NOTES IN COMPUTER SCIENCE187
  • PROCEEDINGS OF SPIE, THE INTERNAT...166
  • JOURNAL OF PHYSICS. CONFERENCE SE...108
  • AIP CONFERENCE PROCEEDINGS89
  • AIP CONFERENCE PROCEEDINGS80
  • PARASSITOLOGIA71
  • ACTA HORTICULTURAE62
  • BIOCHIMICA CLINICA55
  • ASTRONOMICAL SOCIETY OF THE PACIF...46
  • EPJ WEB OF CONFERENCES44
Serie
  • PROCEEDINGS OF SPIE, THE INTERNAT...141
  • LECTURE NOTES IN ARTIFICIAL INTEL...107
  • CEUR WORKSHOP PROCEEDINGS79
  • LECTURE NOTES IN COMPUTER SCIENCE37
  • SCIENCE ET TECHNIQUE DU FROID33
  • IFAC-PAPERSONLINE29
  • IEEE ENGINEERING IN MEDICINE AND ...26
  • LEIBNIZ INTERNATIONAL PROCEEDINGS...21
  • MECHANISMS AND MACHINE SCIENCE21
  • PROCEEDINGS OF THE IEEE CONFERENC...20
Keyword
  • Electrical and Electronic Enginee...409
  • Computer Networks and Communications241
  • reliability184
  • Control and Systems Engineering165
  • HEMT158
  • degradation154
  • Electronic153
  • Optical and Magnetic Materials153
  • Gallium Nitride142
  • Energy Engineering and Power Tech...135
Lingua
  • eng24004
  • ita7152
  • fre194
  • spa143
  • ger51
  • hun24
  • por23
  • rus23
  • und21
  • pol11
Accesso al fulltext
  • no fulltext37738
  • open659
  • embargoed2
  • partially open1
  • restricted1