TREVISANELLO, LORENZO ROBERTO

TREVISANELLO, LORENZO ROBERTO  

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Risultati 1 - 20 di 31 (tempo di esecuzione: 0.043 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Failure mechanisms of gallium nitride LEDs related with passivation 2005 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOLEVADA, SIMONEMENEGHESSO, GAUDENZIOTAMIAZZO, GIANLUCAZANONI, ENRICO + - - -
High temperature instabilities of GaN LEDs related to passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High-temperature failure of GaN LEDs related with passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + SUPERLATTICES AND MICROSTRUCTURES - -
High-temperature degradation of GaN LEDs related to passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
High brightness GaN LEDs degradation during dc and pulsed stress 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
High temperature instabilities of ohmic contacts on Mg-doped gallium nitride 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High temperature instabilities of GaN LEDs related to passivation 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - -
High temperature instabilities of ohmic contacts on p-GaN 2007 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High temperature degradation of ohmic contacts on p-GaN 2007 TRIVELLIN, NICOLAMENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Reversible degradation of ohmic contacts on p-GaN for application in high-brightness LEDs 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
High temperature electro-optical degradation of InGaN/GaN HBLEDs 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Study of the reliability and degradation mechanisms of GaN LEDs 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - -
Thermal degradation of InGaN/GaN LEDs ohmic contacts 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 2007 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOBUSO, SIMONESPIAZZI, GIORGIOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. SPIE Vol. 6669-41
Reversible degradation of GaN LEDs related to passivation 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Reliability and Standardization of LED/Solid State Lighting
Analysis of the role of current in the degradation of InGaN-based laser diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Thermal-activated degradation mechanism on Phosphor-Converted Light Emitting Diode 2008 TREVISANELLO, LORENZO ROBERTOTRIVELLIN, NICOLAMENEGHINI, MATTEOZANONI, ENRICOMENEGHESSO, GAUDENZIO - - -
Combined Optical And Electrical Analysis of AlGaN-Based Deep-UV LEDs Reliability 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Thermal degradation of InGaN/GaN LEDs ohmic contacts 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + PHYSICA STATUS SOLIDI. C, CURRENT TOPICS IN SOLID STATE PHYSICS - -