The aim of this paper is to propose a combined electro-optical method for a rapid evaluation of the trapping and hot-electron related characteristics of GaN-based HEMTs.

Combined electro-optical analysis of trapping effects in AlGaN/GaN HEMTs

MENEGHINI, MATTEO;RONCHI, NICOLO';STOCCO, ANTONIO;RAMPAZZO, FABIANA;MENEGHESSO, GAUDENZIO;ZANONI, ENRICO
2011

Abstract

The aim of this paper is to propose a combined electro-optical method for a rapid evaluation of the trapping and hot-electron related characteristics of GaN-based HEMTs.
2011
Proc. Of the 38th International Symposium on Compound Semiconductors – ISCS 2011
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2477599
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact