PACCAGNELLA, ALESSANDRO

PACCAGNELLA, ALESSANDRO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 509 (tempo di esecuzione: 0.035 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
1GigaRad TID impact on 28nm HEP analog circuits 2017 Gerardin, S.Mattiazzo, S.Paccagnella, A.De Matteis, M. + - - PRIME 2017 - 13th Conference on PhD Research in Microelectronics and Electronics, Proceedings
1GigaRad TID impact on 28 nm HEP analog circuits 2018 Gerardin, S.Mattiazzo, S.Paccagnella, A. + INTEGRATION - -
65 nm technology for HEP: Status and perspective 2014 BAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENADING, LILIGERARDIN, SIMONEGIUBILATO, PIERONEVIANI, ANDREAPACCAGNELLA, ALESSANDROVOGRIG, DANIELE + POS PROCEEDINGS OF SCIENCE - Proceedings of Science
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories 2021 Gerardin S.Bagatin M.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Heavy-Ion Detector Based on 3-D NAND Flash Memories 2020 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A MODEL OF RADIATION INDUCED LEAKAGE CURRENT (RILC) IN ULTRA-THIN OXIDES 1999 PACCAGNELLA, ALESSANDROM. CESCHIA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Multi-Megarad, Radiation Hardened by Design 512 kbit SRAM in CMOS Technology 2010 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - 2010 INTERNATIONAL CONFERENCE ON MICROELECTRONICS
A new experimental technique to evaluate the plasma induced damage at wafer level testing 1998 PACCAGNELLA, ALESSANDRO + MICROELECTRONICS RELIABILITY - -
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility 2007 MANUZZATO, ANDREAGERARDIN, SIMONERECH, PAOLOBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A new model of tunnelling current and SILC in ultra-thin oxides 1998 PACCAGNELLA, ALESSANDRO + - - INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST
A Novel Approach to Quantum Point Contact for Post Soft Breakdown Conduction 2001 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - IEDM Technical Digest. International Electron Devices Meeting
A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics 2022 Bonaldo S.Paccagnella A. + BIOSENSORS & BIOELECTRONICS - -
A simple and accessible inkjet platform for ultra-short concept-to-prototype sEMG electrodes production 2019 Cisotto G.Paccagnella A. + - IEEE ENGINEERING IN MEDICINE AND BIOLOGY ... ANNUAL CONFERENCE PROCEEDINGS Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
A SPICE model for Si microstrip detectors and read-out electronics 1996 BISELLO, DARIOCANDELORI, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A SPICE model of the ohmic side of double-sided Si microstrip detectors 1997 CANDELORI, ANDREAPACCAGNELLA, ALESSANDROBISELLO, DARIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Statistical Approach to Microdose Induced Degradation in FinFET Devices 2009 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Study on the Short- and Long-Term Effects of X-Ray Exposure on NAND Flash Memories 2011 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + - - 2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
Accelerated testing of RF-MEMS contact degradation through radiation sources 2010 TAZZOLI, AUGUSTOBARBATO, MARCOGILIBERTO, VALENTINAGERARDIN, SIMONENICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 2002 CESTER, ANDREAA. Paccagnella + - - -
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 2003 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -