PACCAGNELLA, ALESSANDRO

PACCAGNELLA, ALESSANDRO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 323 (tempo di esecuzione: 0.033 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
1GigaRad TID impact on 28 nm HEP analog circuits 2018 Gerardin, S.Mattiazzo, S.Paccagnella, A. + INTEGRATION - -
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories 2021 Gerardin S.Bagatin M.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Heavy-Ion Detector Based on 3-D NAND Flash Memories 2020 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A MODEL OF RADIATION INDUCED LEAKAGE CURRENT (RILC) IN ULTRA-THIN OXIDES 1999 PACCAGNELLA, ALESSANDROM. CESCHIA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A new experimental technique to evaluate the plasma induced damage at wafer level testing 1998 PACCAGNELLA, ALESSANDRO + MICROELECTRONICS RELIABILITY - -
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility 2007 MANUZZATO, ANDREAGERARDIN, SIMONERECH, PAOLOBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics 2022 Bonaldo S.Paccagnella A. + BIOSENSORS & BIOELECTRONICS - -
A SPICE model for Si microstrip detectors and read-out electronics 1996 BISELLO, DARIOCANDELORI, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A SPICE model of the ohmic side of double-sided Si microstrip detectors 1997 CANDELORI, ANDREAPACCAGNELLA, ALESSANDROBISELLO, DARIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Statistical Approach to Microdose Induced Degradation in FinFET Devices 2009 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 2003 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Alignment of the CMS silicon strip tracker during stand-alone commissioning 2009 BISELLO, DARIOGIUBILATO, PIEROMATTIAZZO, SERENAPACCAGNELLA, ALESSANDROPOZZOBON, NICOLATOSI M + JOURNAL OF INSTRUMENTATION - -
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications 2022 Tonello S.Bonaldo S.Giorgi G.Narduzzi C.Paccagnella A. + IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT - -
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation 2014 PACCAGNELLA, ALESSANDROGERARDIN, SIMONEBAGATIN, MARTA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs 2010 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Angular dependence of heavy ion effects in Floating Gate memory arrays 2007 CELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories 2011 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence 2010 BAGATIN, MARTAGERARDIN, SIMONECELLERE, GIORGIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Aspect ratio calculation in n-channel MOSFET with a gate-enclosed layout 2000 PACCAGNELLA, ALESSANDRO + SOLID-STATE ELECTRONICS - -
Atmospheric Neutron Soft Errors in 3D NAND Flash Memories 2019 Bagatin, M.Gerardin, S.Paccagnella, A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -