PACCAGNELLA, ALESSANDRO

PACCAGNELLA, ALESSANDRO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Novel Approach to Quantum Point Contact for Post Soft Breakdown Conduction 2001 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - IEDM Technical Digest. International Electron Devices Meeting
Assessing SRAM sensitivity to ionizing radiation through a low-energy accelerator 2006 M. BagatinCESTER, ANDREAA. Paccagnella + - - Laboratori Nazionali di Legnaro – Annual Report 2006
Collapse of MOSFET Drain Current After Soft Breakdown and its Dependance on the Transistor Aspect Ratio W/L 2003 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - Proceedings, 2003. 41st Annual. 2003 IEEE International Reliability Physics Symposium
Conductive atomic force microscope characterization of weak spots in irradiated ultra-thin gate oxides 2004 CESTER, ANDREAA. Paccagnella + - - LNL Annual Report 2004
Defect in thin and ultra-thin silicon dioxides 2008 CELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Defects in Microelectronic Materials and Devices
Effect of Heavy Ion irradiation and Electrical Stress on Ultra-Thin Gate Oxide SOI MOSFET 2005 CESTER, ANDREAA. Paccagnella + - - LNL Annual Report 2005
Electrical modifications induced by heavy-ion strikes on minimum-size MOSFETs 2006 M. BagatinCESTER, ANDREAA. Paccagnella + - - LNL Annual Report 2006
Hot electron induced impact ionization and light emission in GaAs based MESFETs, HEMTs, PM-HEMTs and HBTs 1993 ZANONI, ENRICOPACCAGNELLA, ALESSANDRO + - - Negative Differential Resistance and Instabilities in 2D semiconductors
Ionising Radiation Effects on MOSFET Drain Current 2002 CESTER, ANDREAA. Paccagnella + - - LNL Annual Report 2002
Ionizing radiation effects on MOSFET thin and ultra-thin gate oxides 2004 PACCAGNELLA, ALESSANDROCESTER, ANDREA + - - IEEE International Electron Devices Meeting, 2004. IEDM Technical Digest.
IONIZING RADIATION EFFECTS ON ULTRA-THIN OXIDE MOS STRUCTURES 2004 CESTER, ANDREAPACCAGNELLA, ALESSANDRO - - RADIATION EFFECTS AND SOFT ERRORS IN INTEGRATED CIRCUITS AND ELECTRONIC DEVICES
Leakage current in ultra thin oxides: SILC or Soft Breakdown? 2001 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - Proceeding of the 31st European Solid-State Device Research Conference
Leaky spots in irradiated SiO2 gate oxides observed with C-AFM 2005 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - 2005 Spanish Conference on Electron Devices
Logistic Modeling of Progressive Breakdown in Ultrathin Gate Oxides 2003 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - Proceedings of the 33rd European Solid-state Device Research Conference
New Issues in Radiation Effects on Semiconductor Devices 2005 PACCAGNELLA, ALESSANDROCESTER, ANDREA - - Emerging applications of
Radiation Effects in NAND Flash Memories 2010 BAGATIN, MARTACELLERE, GIORGIOGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Inside NAND Flash Memories
Radiation Effects on Electronic Devices 2011 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO - - Nano-semiconductors, Devices & Technology
Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics 2007 GASPERIN, ALBERTOCESTER, ANDREAWRACHIEN, NICOLAPACCAGNELLA, ALESSANDRO + - - Proceedings of IEEE - International Reliability Physics Symposium - IRPS 2007
Statistical Model for Radiation Induced Wear-Out of Ultra-Thin Gate Oxides after Exposure to Heavy Ion Irradiation 2003 CESTER, ANDREAA. Paccagnella + - - LNL Annual Report 2003
Switching Behaviour and Noise of Soft Breakdown Current in Ultra-Thin Gate Oxide 2000 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - Proceeding of the 30th European Solid-State Device Research Conference