Failure modes and mechanisms of AlGaN/GaN HEMTs, observed during accelerated tests at various bias conditions are reviewed.
A review of failure modes and mechanisms of GaN-based HEMT's
ZANONI, ENRICO;MENEGHESSO, GAUDENZIO;DANESIN, FRANCESCA;MENEGHINI, MATTEO;RAMPAZZO, FABIANA;TAZZOLI, AUGUSTO;ZANON, FRANCO
2007
Abstract
Failure modes and mechanisms of AlGaN/GaN HEMTs, observed during accelerated tests at various bias conditions are reviewed.
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
