ZANON, FRANCO

ZANON, FRANCO  

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Risultati 1 - 20 di 26 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Degradation induced by 2-MeV alpha particles on AlGaN/GaN High Electron Mobility Transistors 2006 DANESIN, FRANCESCAZANON, FRANCOGERARDIN, SIMONERAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICOPACCAGNELLA, ALESSANDRO MICROELECTRONICS RELIABILITY - -
Impact of 2-MeV Alpha Irradiation on AlGaN/GaN High Electron Mobility Transistors 2006 ZANON, FRANCODANESIN, FRANCESCAGERARDIN, SIMONERAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICOPACCAGNELLA, ALESSANDRO - - 30th Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2006
Degradation of GaN HEMT at high drain voltages 2007 MENEGHESSO, GAUDENZIODANESIN, FRANCESCAMENEGHINI, MATTEORAMPAZZO, FABIANATAZZOLI, AUGUSTOZANON, FRANCOZANONI, ENRICO + - - -
High Voltage Electrical Characterization of Field-Plate Gate HEMT Devices 2007 TAZZOLI, AUGUSTODANESIN, FRANCESCARAMPAZZO, FABIANAZANON, FRANCOMENEGHESSO, GAUDENZIO + - - -
Investigation on charge trapping phenomena leading to kink effect on AlGaN/GaN HEMTs 2007 ZANON, FRANCODANESIN, FRANCESCAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
A review of failure modes and mechanisms of GaN-based HEMT's 2007 ZANONI, ENRICOMENEGHESSO, GAUDENZIODANESIN, FRANCESCAMENEGHINI, MATTEORAMPAZZO, FABIANATAZZOLI, AUGUSTOZANON, FRANCO + - - -
An investigation of reliability on hybrid substrates GaN-HEMTs 2008 ZANON, FRANCORONCHI, NICOLO'DANESIN, FRANCESCASTOCCO, ANTONIOMENEGHESSO, GAUDENZIO + - - -
Influence of Device Self-Heating on the Activation Energy Extraction During Current-DLTS Measurement 2008 ZANON, FRANCOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Failure mechanisms of GaN-based transistors in on- and off-state 2008 ZANONI, ENRICOMENEGHESSO, GAUDENZIODANESIN, FRANCESCAMENEGHINI, MATTEORAMPAZZO, FABIANATAZZOLI, AUGUSTOZANON, FRANCO + - - -
High power performances of GaN HEMT on SopSiC substrate 2008 ZANON, FRANCODANESIN, FRANCESCATAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields 2008 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANON, FRANCODANESIN, FRANCESCAZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Reliability aspects of GaN-HEMTs on composite substrates 2008 ZANON, FRANCODANESIN, FRANCESCATAZZOLI, AUGUSTOMENEGHINI, MATTEORONCHI, NICOLO'ZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Hybrid substrates employment for the development of Gallium Nitride HEMTs: study of reliability and failure modes 2008 Zanon, Franco - - -
Thermal storage effects on AlGaN/GaN HEMT 2008 DANESIN, FRANCESCATAZZOLI, AUGUSTOZANON, FRANCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives 2008 MENEGHESSO, GAUDENZIODANESIN, FRANCESCARAMPAZZO, FABIANAZANON, FRANCOTAZZOLI, AUGUSTOMENEGHINI, MATTEOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Light emission in GaN HEMTs: a powerful characterization and reliability tool 2008 MENEGHESSO, GAUDENZIODANESIN, FRANCESCARAMPAZZO, FABIANAZANON, FRANCOTAZZOLI, AUGUSTOMENEGHINI, MATTEOZANONI, ENRICO - - -
Passivation degradation induced by thermal storage on AlGaN/GaN HEMTs 2008 DANESIN, FRANCESCAMARINO, FABIO ALESSIOTAZZOLI, AUGUSTOZANON, FRANCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test 2009 RONCHI, NICOLO'ZANON, FRANCOSTOCCO, ANTONIOTAZZOLI, AUGUSTOZANONI, ENRICOMENEGHESSO, GAUDENZIO MICROELECTRONICS RELIABILITY - -
False Surface Trap Signatures Induced by Buffer Traps in AlGaN/GaN HEMTs 2009 MENEGHESSO, GAUDENZIOZANONI, ENRICODANESIN, FRANCESCAZANON, FRANCORAMPAZZO, FABIANAMARINO, FABIO ALESSIO + - - -
Correlation between DC and rf degradation due to deep levels in AlGaN/GaN HEMTs 2009 STOCCO, ANTONIORONCHI, NICOLO'ZANON, FRANCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -