The aim of this work is to analyze the modifications created by proton irradiation on the performances of InGaN based LEDs, in order to understand the underlying physical mechanisms causing the degradation. We found that exposure to higher fluences can cause (i) an increase in the forward current of the devices, in the series resistance and in the ideality factor, and a slight decrease of the reverse current; (ii) a strong and distributed drop of the optical power; (iii) a slight reduction of the capacitance of the devices; those results are evidence for (iv) the creation of non-radiative recombination centres localized in the active region and of (v) a possible variation of electrical mobility.
Proton irradiation and generation of defects in blue InGaN-based LEDs
DE SANTI, CARLO;MENEGHINI, MATTEO;TRIVELLIN, NICOLA;GERARDIN, SIMONE;BAGATIN, MARTA;PACCAGNELLA, ALESSANDRO;MENEGHESSO, GAUDENZIO;ZANONI, ENRICO
2012
Abstract
The aim of this work is to analyze the modifications created by proton irradiation on the performances of InGaN based LEDs, in order to understand the underlying physical mechanisms causing the degradation. We found that exposure to higher fluences can cause (i) an increase in the forward current of the devices, in the series resistance and in the ideality factor, and a slight decrease of the reverse current; (ii) a strong and distributed drop of the optical power; (iii) a slight reduction of the capacitance of the devices; those results are evidence for (iv) the creation of non-radiative recombination centres localized in the active region and of (v) a possible variation of electrical mobility.Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.