DE SANTI, CARLO

DE SANTI, CARLO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 294 (tempo di esecuzione: 0.041 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Degradation analysis of Violet high power LEDs 2010 TRIVELLIN, NICOLAMENEGHINI, MATTEODE SANTI, CARLOVACCARI, SIMONEZANONI, ENRICOMENEGHESSO, GAUDENZIO - - HETECH 2010
Time and field-dependent trapping in AlGaN/GaN E-mode transistors 2011 MENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 9th International Conference on Nitride Semiconductors (ICNS-9)
Gate material - dependent degradation of reverse biased GaN HEMTs 2011 DE SANTI, CARLOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 20th European Heterostructure Technology meeting (HeTech 2011)
Electro-Optical analysis of the degradation of advanced InGaN-laser structures 2011 DE SANTI, CARLOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 35th Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2011
Identification of the deep level involved in InGaN-laser degradation by means of Deep-Level Transient Spectroscopy 2011 MENEGHINI, MATTEODE SANTI, CARLOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 9th International Conference on Nitride Semiconductors (ICNS-9)
Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency 2011 TRIVELLIN, NICOLAMENEGHINI, MATTEODE SANTI, CARLOVACCARI, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Investigation of the deep level involved in InGaN laser degradation by deep level transient spectroscopy 2011 MENEGHINI, MATTEODE SANTI, CARLOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + APPLIED PHYSICS LETTERS - -
Defect generation in blue InGaN-based LEDs induced by proton irradiation 2012 Carlo De SantiMatteo MeneghiniNicola TrivellinSimone GerardinMarta BagatinAlessandro PaccagnellaGaudenzio MeneghessoEnrico Zanoni - - Proceedings of the 3rd International Symposium on Reliability of Optoelectronics for Space
Proton irradiation and generation of defects in blue InGaN-based LEDs 2012 DE SANTI, CARLOMENEGHINI, MATTEOTRIVELLIN, NICOLAGERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIOZANONI, ENRICO - - 21th European workshop on Heterostructure Technology, HeTech 2012
Degradation of AlGaN/GaN HEMTs below the “critical voltage”: a time-dependent analysis 2012 MENEGHINI, MATTEOSTOCCO, ANTONIOBERTIN, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICODE SANTI CARLO + - - The International Conference of Compound Semiconductor Manufacturing Technology CS-MANTECH
Time- and Field-Dependent Trapping in GaN-Based Enhancement-Mode Transistors With p-Gate 2012 MENEGHINI, MATTEOC. d. SantiZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE ELECTRON DEVICE LETTERS - -
Analysis of the deep level responsible for the degradation of InGaN-based laser diodes by DLTS 2012 MENEGHINI, MATTEODE SANTI, CARLOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proceedings of SPIE
Generation of defects and thermal recovery of blue InGaN-based LEDs after proton irradiation 2013 DE SANTI, CARLOMENEGHINI, MATTEOTRIVELLIN, NICOLAGERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIOZANONI, ENRICO - - 37th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe (WOCSDICE 2013)
Deep-Level Characterization in GaN HEMTs-Part I: Advantages and Limitations of Drain Current Transient Measurements 2013 BISI, DAVIDEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
GaN-HEMTs devices with single- and double-heterostructure for power switching applications 2013 MENEGHESSO, GAUDENZIOZANANDREA, ALBERTOSTOCCO, ANTONIOROSSETTO, ISABELLADE SANTI, CARLORAMPAZZO, FABIANAMENEGHINI, MATTEOZANONI, ENRICO + - - 2013 IEEE International Reliability Physics Symposium, IRPS 2013
Degradation of AlGaN/GaN HEMT devices: Role of reverse-bias and hot electron stress 2013 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOSTOCCO, ANTONIOBISI, DAVIDEDE SANTI, CARLOROSSETTO, ISABELLAZANANDREA, ALBERTORAMPAZZO, FABIANAZANONI, ENRICO MICROELECTRONIC ENGINEERING - -
Degradation of AlGaN/GaN HET devices: role of reverse vias and hot electron stress 2013 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOSTOCCO, ANTONIOBISI, DAVIDEDE SANTI, CARLOROSSETTO, ISABELLAZANANDREA, ALBERTOCESTER, ANDREARAMPAZZO, FABIANAZANONI, ENRICO - - 18th Conference of "Insulating Films on Semiconductors" (INFOS2013)
Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes 2013 DE SANTI, CARLOMENEGHINI, MATTEOCARRARO, SIMONEVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Physical effects limiting performance and reliability of GaN High Electron Mobility Transistors 2014 ZANONI, ENRICOMENEGHESSO, GAUDENZIOMENEGHINI, MATTEOBISI, DAVIDEDE SANTI, CARLORAMPAZZO, FABIANAROSSETTO, ISABELLASTOCCO, ANTONIO + - - Proc. of 2014 International Conference on Solid State Devices and Materials SSDM-2014
Thermal droop in InGaN-based LEDs: an analysis based on temperature-dependent L-I characterization 2014 LA GRASSA, MARCOMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proceedings of the 23rd European Workshop on Heterostructure Technology - HETECH 2014