Sfoglia per Autore
Atmospheric-like neutron attenuation during accelerated neutron testing with multiple printed circuit boards
2018 Cazzaniga, Carlo; Bhuva, Bharat; Bagatin, Marta; Gerardin, Simone; Marchese, Nicolo; Frost, Christopher D.
Dose-rate sensitivity of 65-nm MOSFETs Exposed to ultrahigh doses
2018 Borghello, G.; Faccio, F.; Lerario, E.; Michelis, S.; Kulis, S.; Fleetwood, D. M.; Schrimpf, R. D.; Gerardin, S.; Paccagnella, A.; Bonaldo, S.
Experimental characterization of multi-layer 3D-printed shields for microsatellites
2018 Olivieri, Lorenzo; Finozzi, Antonio; Giacomuzzo, Cinzia; Francesconi, Alessandro; Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Stokes, Hedley; Romei, Federico; Walker, Scott; Rossi, Alessandro
Dynamic-ron control via proton irradiation in AlGaN/GaN transistors
2018 Tajalli, Alaleh; Stockman, A.; Meneghini, M.; Mouhoubi, S.; Banerjee, A.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Zanoni, E.; Tack, M.; Bakeroot, B.; Moens, P.; Meneghesso, G.
1GigaRad TID impact on 28 nm HEP analog circuits
2018 Resta, F.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; De Matteis, M.; Enz, C.; Baschirotto, A.
Effects of Heavy-Ion Irradiation on Vertical 3-D NAND Flash Memories
2018 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Camerlenghi, Ettore; Bertuccio, M.; Costantino, Alessandro; Zadeh, A.; Ferlet-Cavrois, V.; Santin, G.; Daly, E.
First tests of a new facility for device-level, board-level and system-level neutron irradiation of microelectronics
2018 Cazzaniga, Carlo; Bagatin, Marta; Gerardin, Simone; Costantino, Alessandra; Frost, Christopher David
Design implementation and test results of the RD53A, a 65 nm large scale chip for next generation pixel detectors at the HL-LHC
2018 Marconi, S.; Barbero, M. B.; Fougeron, D.; Godiot, S.; Menouni, M.; Pangaud, P.; Rozanov, A.; Breugnon, P.; Bomben, M.; Calderini, G.; Crescioli, F.; Dortz, O. L.; Marchiori, G.; Dzahini, D.; Rarbi, F. E.; Gaglione, R.; Kruger, H.; Daas, M.; Dieter, Y.; Hemperek, T.; Hugging, F.; Moustakas, K.; Pohl, D.; Rymaszewski, P.; Standke, M.; Vogt, M.; Wang, T.; Wermes, N.; Karagounis, M.; Stiller, A.; Marzocca, C.; De Robertis, G.; Loddo, F.; Licciulli, F.; Andreazza, A.; Liberali, V.; Stabile, A.; Frontini, L.; Bagatin, M.; Bisello, D.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; Vogrig, D.; Bonaldo, S.; Bacchetta, N.; Gaioni, L.; De Canio, F.; Manghisoni, M.; Re, V.; Riceputi, E.; Traversi, G.; Ratti, L.; Vacchi, C.; Androsov, K.; Beccherle, R.; Magazzu, G.; Minuti, M.; Morsani, F.; Palla, F.; Poulios, S.; Bilei, G. M.; Menichelli, M.; Placidi, P.; Dellacasa, G.; Demaria, N.; Mazza, G.; Monteil, E.; Pacher, L.; Paterno, A.; Rivetti, A.; Da Rocha Rolo, M. D.; Gajanana, D.; Gromov, V.; Van Eijk, B.; Kluit, R.; Vitkovskiy, A.; Benka, T.; Havranek, M.; Janoska, Z.; Marcisovsky, M.; Neue, G.; Tomasek, L.; Kafka, V.; Vrba, V.; Lopez-Morillo, E.; Palomo, F. R.; Munoz, F.; Vila, I.; Jimenez, E. M. S.; Abbaneo, D.; Christiansen, J.; Orfanelli, S.; Jara Casas, L. M.; Conti, E.; Bell, S.; Prydderch, M. L.; Thomas, S.; Christian, D. C.; Deptuch, G.; Fahim, F.; Hoff, J.; Lipton, R.; Liu, T.; Zimmerman, T.; Miryala, S.; Garcia-Sciveres, M.; Gnani, D.; Krieger, A.; Papadopoulou, K.; Heim, T.; Carney, R.; Nachman, B.; Renteira, C.; Wallangen, V.; Hoeferkamp, M.; Seidel, S.
Space and terrestrial radiation effects in flash memories
2017 Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro
Total Ionizing Dose effects on a 28 nm Hi-K metal-gate CMOS technology up to 1 Grad
2017 Mattiazzo, Serena; Bagatin, Marta; Bisello, Dario; Gerardin, Simone; Marchioro, A.; Paccagnella, Alessandro; Pantano, Devis; Pezzotta, A.; Zhang, C. M.; Baschirotto, A.
Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells
2017 Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Visconti, Angelo; Virtanen, Ari; Kettunen, Heikki; Costantino, Alessandra; Ferlet Cavrois, Veronique; Zadeh, Ali
Experimental and Simulation Study of the Effects of Heavy-ion Irradiation on HfO2-based RRAM Cells
2017 Alayan, M.; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Larcher, L.; Vianello, E.; Nowak, E.; De Salvo, B.; Perniola, L.
Total Suppression of Dynamic-Ron in AlGaN/GaN-HEMTs Through Proton Irradiation
2017 Meneghini, M; Tajalli, A; Moens, P; Baneree, A; Stockman, A; Tack, M; Gerardin, S; Bagatin, M; Paccagnella, A; Zanoni, E; Meneghesso, G
A low cost robust radiation hardened flip-flop circuit
2017 Jain, A.; Gupta, A.; Garg, S.; Veggetti, A.; Castelnovo, A.; Crippa, D.; Gerardin, S.; Bagatin, M.; Cazzaniga, C.
Simulation and Experiment in Neutron Induced Single Event Effects in SRAM
2017 Jin, X.; Wang, C.; Guo, X.; Qi, C.; Yang, S.; Liu, Y.; Chen, W.; Gerardin, S.; Bagatin, M.; Bonaldo, S.; Paccagnella, A.
1GigaRad TID impact on 28nm HEP analog circuits
2017 Resta, F.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; De Matteis, M.; Enz, C.; Baschirotto, A.
Heavy-ion upset immunity of RRAM cells based on thin HfO2layers
2017 Alayan, M.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Vianello, E.; Nowak, E.; De Salvo, B.; Larcher, Luca; Perniola, L.
Space Environment Effects on Flexible, Low-Voltage Organic Thin-Film Transistors
2017 Basiricò, Laura; Basile, Alberto Francesco; Cosseddu, Piero; Gerardin, Simone; Cramer, Tobias; Bagatin, Marta; Ciavatti, Andrea; Paccagnella, Alessandro; Bonfiglio, Annalisa; Fraboni, Beatrice
Effects of high-energy electrons in advanced NAND flash memories
2017 Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Costantino, Alessandra; Ferlet-Cavrois, Veronique; Virtanen, Ari; Kettunen, Heikki; Wang, Pierre
Complete loss of functionality and permanent page fails in NAND flash memories
2017 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Voss, K.; Grürmann, K.; Ferlet-Cavrois, V.
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile