BARI, DANIELE

BARI, DANIELE  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Characterization and Reliability of Dye-sensitized Solar Cells: Temperature, Illumination, and Bias Effects 2014 Bari, Daniele - - -
Comparison between positive and negative constant current stress on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Comparison Between Uniform and CHC Stress on III-V MOSFETs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 21st European Workshop on Heterostructure Technology - HETECH 2012
Effects of Channel Hot Carrier Stress on III-V Bulk Planar MOSFETs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - IEEE IRPS2012, International Reliability Physics Symposium
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Effects of positive and negative constant voltage stress on organic TFTs 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 2013 IEEE International Reliability Physics Symposium, IRPS 2013
Enhanced Permanent Degradation of Organic TFT under electrical stress and visible light exposure 2012 WRACHIEN, NICOLABARI, DANIELEMENEGHESSO, GAUDENZIOCESTER, ANDREA + - - 23st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure 2012 WRACHIEN, NICOLABARI, DANIELEMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Improved Tolerance against UV and Alpha Irradiation of Encapsulated Organic TFTs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 2012 IEEE Nuclear and Space Radiation Effects Conference - NSREC 2012
Improved Tolerance Against UV and Alpha Irradiation of Encapsulated Organic TFTs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Low-Energy UV Effects on Organic Thin-Film-Transistors 2011 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - Proceedings of IEEE International Reliability Physics Symposium
Near-Uv Irradiation Effects On Pentacene Based Organic Thin Film Transistors 2011 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 2011 IEEE Nuclear and Space Radiation Effects Conference, NSREC2011
Near-UV Irradiation Effects on Pentacene-Based Organic Thin Film Transistors 2011 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Organic Thin Film Transistor Degradation Under Sunlight Exposure 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - IEEE IRPS2012, International Reliability Physics Symposium
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED 2012 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Reliability Study of Dye-Sensitized Solar Cells by means of Solar Simulator and White LED 2012 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + - - -
Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs) 2012 BARI, DANIELECESTER, ANDREAWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + IEEE JOURNAL OF PHOTOVOLTAICS - -
Study of the effect of stress-induced trap level on OLED characteristics by numerical model 2012 CESTER, ANDREABARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO - - IEEE IRPS2012, International Reliability Physics Symposium
Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells 2012 BARI, DANIELECESTER, ANDREAWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + - - 2012 IEEE Nuclear and Space Radiation Effects Conference - NSREC 2012
Study of the effects of UV-exposure on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + - - 2013 IEEE International Reliability Physics Symposium, IRPS 2013