BARBATO, MARCO

BARBATO, MARCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 70 (tempo di esecuzione: 0.029 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Impact of Continuous Actuation on the Reliability of Dielectric-less Ohmic RF-MEMS Switches 2009 TAZZOLI, AUGUSTOAUTIZI, ENRICOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Evolution of Electrical Parameters of Dielectric-less Ohmic RF-MEMS Switches during Continuous Actuation Stress 2009 TAZZOLI, AUGUSTOAUTIZI, ENRICOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Evidence of protons induced contact degradation on ohmic RF-MEMS switches 2009 TAZZOLI, AUGUSTOBARBATO, MARCOGERARDIN, SIMONEMONACO, GIANNINICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO - - 18th European Heterostructure Technology Workshop - HETECH 2009
A Comprehensive Study of MEMS Behavior under EOS/ESD Events: Breakdown, Dielectric Charging, and Realistic Cures 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Experimental Investigation of an Embedded Heating Mechanism to Improve RF-MEMS Switches Reliability 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - MEMS IN ITALY
Electro-Mechanical Characterization of the Dynamic Behavior of Ohmic RF MEMS Switches 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Accelerated testing of RF-MEMS contact degradation through radiation sources 2010 TAZZOLI, AUGUSTOBARBATO, MARCOGILIBERTO, VALENTINAGERARDIN, SIMONENICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
RF-MEMS Phase Shifters for Phased Array Antennas 2011 BARBATO, MARCOMENEGHESSO, GAUDENZIO + - - NanotechItaly 2011 - International Conference
Charge trap investigation methodology on RF-MEMS switches 2011 BARBATO, MARCOGILIBERTO, VALENTINAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - MEMSWAVE 2011, 12th International Symposium on RF MEMS and RF Microsystems
Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test 2011 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures 2011 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + JOURNAL OF ELECTROSTATICS - -
A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells 2012 MAGNONE, PAOLOBARBATO, MARCOMENEGHINI, MATTEOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + - - 27th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2012
Effect of Shunt Resistance on the Performance of mc-Silicon Solar Cells: A Combined Electro-Optical and Thermal Investigation 2012 BARBATO, MARCOMENEGHINI, MATTEOGILIBERTO, VALENTINAMAGNONE, PAOLOMENEGHESSO, GAUDENZIO + - - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation 2012 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
ESD characterization of multi-chip RGB LEDs 2013 VACCARI, SIMONEMENEGHINI, MATTEOBARBISAN, DAVIDEBARBATO, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Thermal And Electrical Characterization Of Catastrophic Degradation Of Silicon Solar Cells Submitted To Reverse Current Stress 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOGILIBERTO, VALENTINABARBATO, MARCOMARSILI, MARGHERITAZANONI, ENRICOMENEGHESSO, GAUDENZIO - - IEEE 39th Photovoltaic Specialists Conference (PVSC 2013)
A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches 2013 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO - - 2013 International Conference on Microelectronic Test Structures, ICMTS 2013
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOBARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments 2014 MAGNONE, PAOLOMENEGHINI, MATTEOBARBATO, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE JOURNAL OF PHOTOVOLTAICS - -