BARBATO, MARCO

BARBATO, MARCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autore(i) Rivista Serie Titolo libro
Impact of Continuous Actuation on the Reliability of Dielectric-less Ohmic RF-MEMS Switches 2009 TAZZOLI, AUGUSTOAUTIZI, ENRICOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Evidence of protons induced contact degradation on ohmic RF-MEMS switches 2009 TAZZOLI, AUGUSTOBARBATO, MARCOGERARDIN, SIMONEMONACO, GIANNINICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO - - 18th European Heterostructure Technology Workshop - HETECH 2009
Evolution of Electrical Parameters of Dielectric-less Ohmic RF-MEMS Switches during Continuous Actuation Stress 2009 TAZZOLI, AUGUSTOAUTIZI, ENRICOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Experimental Investigation of an Embedded Heating Mechanism to Improve RF-MEMS Switches Reliability 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - MEMS IN ITALY
Electro-Mechanical Characterization of the Dynamic Behavior of Ohmic RF MEMS Switches 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Accelerated testing of RF-MEMS contact degradation through radiation sources 2010 TAZZOLI, AUGUSTOBARBATO, MARCOGILIBERTO, VALENTINAGERARDIN, SIMONENICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium
A Comprehensive Study of MEMS Behavior under EOS/ESD Events: Breakdown, Dielectric Charging, and Realistic Cures 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + - - -
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches 2010 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Charge trap investigation methodology on RF-MEMS switches 2011 BARBATO, MARCOGILIBERTO, VALENTINAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - MEMSWAVE 2011, 12th International Symposium on RF MEMS and RF Microsystems
RF-MEMS Phase Shifters for Phased Array Antennas 2011 BARBATO, MARCOMENEGHESSO, GAUDENZIO + - - NanotechItaly 2011 - International Conference
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures 2011 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + JOURNAL OF ELECTROSTATICS - -
Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test 2011 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Effect of Shunt Resistance on the Performance of mc-Silicon Solar Cells: A Combined Electro-Optical and Thermal Investigation 2012 BARBATO, MARCOMENEGHINI, MATTEOGILIBERTO, VALENTINAMAGNONE, PAOLOMENEGHESSO, GAUDENZIO + - - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells 2012 MAGNONE, PAOLOBARBATO, MARCOMENEGHINI, MATTEOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + - - 27th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2012
Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation 2012 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
ESD characterization of multi-chip RGB LEDs 2013 VACCARI, SIMONEMENEGHINI, MATTEOBARBISAN, DAVIDEBARBATO, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Thermal And Electrical Characterization Of Catastrophic Degradation Of Silicon Solar Cells Submitted To Reverse Current Stress 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOGILIBERTO, VALENTINABARBATO, MARCOMARSILI, MARGHERITAZANONI, ENRICOMENEGHESSO, GAUDENZIO - - IEEE 39th Photovoltaic Specialists Conference (PVSC 2013)
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOBARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches 2013 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO - - 2013 International Conference on Microelectronic Test Structures, ICMTS 2013
High Efficiency Ultra-Thin CdTe Absorbers by Physical Vapor Deposition 2014 BARBATO, MARCOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIO + - - Proc. Of. 29th European Photovoltaic Solar Energy Conference and Exhibition EUPVSEC 2014