WRACHIEN, NICOLA

WRACHIEN, NICOLA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A General Equivalent Circuit Model for a Metal/Organic/Liquid/Metal System 2018 Lago, NicoloBuonomo, MarcoWrachien, NicolaCester, Andrea + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A physical-based equivalent circuit model for an organic/electrolyte interface 2016 LAGO, NICOLO'CESTER, ANDREAWRACHIEN, NICOLABARBATO, MARCORIZZO, ANTONIOMENEGHESSO, GAUDENZIO + ORGANIC ELECTRONICS - -
ADVANCED MEMORIES TO OVERCOME THE FLASH MEMORY WEAKNESSES: A RADIATION VIEWPOINT RELIABILITY STUDY 2010 Wrachien, Nicola - - -
Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling 2017 TORTO, LORENZORIZZO, ANTONIOCESTER, ANDREAWRACHIEN, NICOLA + - - IEEE International Reliability Physics Symposium Proceedings
Analysis of ESD effects on organic thin-film-transistors by means of TLP technique 2016 WRACHIEN, NICOLABARBATO, MARCOCESTER, ANDREARIZZO, ANTONIOMENEGHESSO, GAUDENZIO + - - IEEE International Reliability Physics Symposium Proceedings
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 2018 Buonomo, M.Torto, L.Barbato, M.Wrachien, N.Rizzo, A.Cester, A. + MICROELECTRONICS RELIABILITY - -
Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells 2018 TORTO, LORENZOCester, AndreaWrachien, NicolaRizzo, Antonio + IEEE JOURNAL OF PHOTOVOLTAICS - -
Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress 2016 RIZZO, ANTONIOTORTO, LORENZOWRACHIEN, NICOLACESTER, ANDREA + IEEE JOURNAL OF PHOTOVOLTAICS - -
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination 2016 RIZZO, ANTONIOCESTER, ANDREAWRACHIEN, NICOLALAGO, NICOLO'BARBATO, MARCO + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Charge Trapping in Organic Thin Film Transistors 2008 WRACHIEN, NICOLACESTER, ANDREAPINATO, ALESSANDROMENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - -
Comparison between positive and negative constant current stress on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Comparison Between Uniform and CHC Stress on III-V MOSFETs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 21st European Workshop on Heterostructure Technology - HETECH 2012
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects 2015 CESTER, ANDREAWRACHIEN, NICOLABON, MASSIMILIANOMENEGHESSO, GAUDENZIOBERTANI, ROBERTA + - - Proceedings of International Reliability Physics Symposium
Degradation mechanisms of Dye-Sensitized Solar Cells: Light, Bias and Temperature Effects 2015 WRACHIEN, NICOLABON, MASSIMILIANOMENEGHESSO, GAUDENZIOBERTANI, ROBERTADI CARLO, ALDO + - - IEEE International Reliability physics Symposium Proceedings
Degradation of III-V inversion-type enhancement-mode MOSFETs 2010 WRACHIEN, NICOLACESTER, ANDREAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium.
Drift-diffusion and analytical modeling of the recombination mechanisms in organic solar cells: Effect of the nonconstant charge distribution inside the active layer 2018 Torto, LorenzoCester, AndreaWrachien, Nicola + IEEE JOURNAL OF PHOTOVOLTAICS - -
Effects of Channel Hot Carrier Stress on III-V Bulk Planar MOSFETs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - IEEE IRPS2012, International Reliability Physics Symposium
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells 2015 CESTER, ANDREARIZZO, ANTONIOLAGO, NICOLO'BARBATO, MARCOWRACHIEN, NICOLA + MICROELECTRONICS RELIABILITY - -
Effects of constant voltage stress on organic complementary logic inverters 2014 WRACHIEN, NICOLACESTER, ANDREALAGO, NICOLO'MENEGHESSO, GAUDENZIO + PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE - proc. of 44th European Solid State Device Research Conference (ESSDERC)
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -