We present the results of a characterization and stability study conducted on semi-transparent/bifacial FAPbBr3 perovskite mini-modules. Standard dark/light I-V characterization measurements were performed under 1 sun irradiance via a white LED array illuminator. Stability under illumination was probed in indoor conditions at 1 sun irradiance with the same LED-based illuminator for a series of 40 ks experiments, each followed with a 40 ks recovery monitoring phase; during each experiment the DUT was operated in MPPT (Maximum Power Point Tracking) conditions, and the recovery was tested both in open-circuit and in short-circuit conditions. The results trace a clear degradation in the performance of the device, mainly due to a fill-factor reduction. Changing the recovery conditions did not change the recovery dynamics, with degradation continuing also during the recovery monitoring phase, after illumination had ceased. A possible correlation was traced between the degradation onset during each experiment (occurring after approximately 1000 s) and the temperature of the device, which increases rapidly at the beginning of the experiment before eventually stabilizing around approximately 50 °C. With the aim of discerning the role and impact of temperature in the observed degradation, dark/light I-V and OCVD (Open-Circuit Voltage Decay) characterization measurements were performed on a comparable device at varying temperatures from -20 °C up to 75 °C, with a step of 5 °C; subsequently, a thermal constant-stress was performed on the device at 50 °C for an equivalent time duration relative to each MTTP experiment (40 ks). Little-to-no impact was observed on the performance of the device, leading to the assessment that the degradation observed during the experiments under illumination in MPPT conditions, while possibly accelerated by temperature, is not directly caused by it; other degradation factors (light, current, voltage) are currently under ongoing investigation.
Stability of Perovskite-Based Mini-Modules: Experimental Analysis and Interpretation
Noah Tormena;Alessandro Caria;Matteo Buffolo;Carlo De Santi;Andrea Cester;Gaudenzio Meneghesso;Enrico Zanoni;Nicola Trivellin;Matteo Meneghini
2025
Abstract
We present the results of a characterization and stability study conducted on semi-transparent/bifacial FAPbBr3 perovskite mini-modules. Standard dark/light I-V characterization measurements were performed under 1 sun irradiance via a white LED array illuminator. Stability under illumination was probed in indoor conditions at 1 sun irradiance with the same LED-based illuminator for a series of 40 ks experiments, each followed with a 40 ks recovery monitoring phase; during each experiment the DUT was operated in MPPT (Maximum Power Point Tracking) conditions, and the recovery was tested both in open-circuit and in short-circuit conditions. The results trace a clear degradation in the performance of the device, mainly due to a fill-factor reduction. Changing the recovery conditions did not change the recovery dynamics, with degradation continuing also during the recovery monitoring phase, after illumination had ceased. A possible correlation was traced between the degradation onset during each experiment (occurring after approximately 1000 s) and the temperature of the device, which increases rapidly at the beginning of the experiment before eventually stabilizing around approximately 50 °C. With the aim of discerning the role and impact of temperature in the observed degradation, dark/light I-V and OCVD (Open-Circuit Voltage Decay) characterization measurements were performed on a comparable device at varying temperatures from -20 °C up to 75 °C, with a step of 5 °C; subsequently, a thermal constant-stress was performed on the device at 50 °C for an equivalent time duration relative to each MTTP experiment (40 ks). Little-to-no impact was observed on the performance of the device, leading to the assessment that the degradation observed during the experiments under illumination in MPPT conditions, while possibly accelerated by temperature, is not directly caused by it; other degradation factors (light, current, voltage) are currently under ongoing investigation.
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