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BUFFOLO, MATTEO

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 29 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autori	Rivista	Titolo libro
1	White-light sources based on GaN laser diodes: Analysis and application study	2018	TRIVELLIN, NICOLA ; YUSHCHENKO, MAKSYM ; BUFFOLO, MATTEO ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING	Proceedings of SPIE - The International Society for Optical Engineering
2	Understanding the degradation processes of GaN based LEDs submitted to extremely high current density	2017	RENSO, NICOLA ; MENEGHINI, MATTEO ; BUFFOLO, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY
3	Towards high reliability GaN LEDs: Understanding the physical origin of gradual and catastrophic failure	2015	MENEGHINI, MATTEO ; DE SANTI, CARLO ; BUFFOLO, MATTEO ; Andrea, Munaretto; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		Proc. of 12th China International Forum on Solid State Lighting, SSLCHINA 2015
4	Time-Dependent Breakdown in GaN-Based LEDs—Description and Physical Origin	2016	DE SANTI, CARLO ; MENEGHINI, MATTEO ; BUFFOLO, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		International Workshop on Nitride Semiconductors IWN2016
5	Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage	2014	DE SANTI, CARLO ; MENEGHINI, MATTEO ; MARIOLI, MICHAEL SIMONE ; BUFFOLO, MATTEO ; TRIVELLIN, NICOLA ; T. Weig; K. Holc; K. Koehler; J. Wagner; U. T. Schwarz; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY
6	Temperature and Chip Size Dependance of Carrier Recombination Dynamics and Droop Behavior on High Power COTS-LEDs	2017	TRIVELLIN, NICOLA ; BUFFOLO, MATTEO ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		Proceedings of the 11th International Symposium on Semiconductor Light Emitting Devices (ISSLED 2017)
7	SSL Solutions for Human Centric Lighting	2015	TRIVELLIN, NICOLA ; MENEGHINI, MATTEO ; BARBISAN, DIEGO ; FERRETTI, MARCO ; DAL LAGO, MATTEO ; DE SANTI, CARLO ; BUFFOLO, MATTEO ; Munaretto, A.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		Proceedings of the 5th International LED professional Symposium, LpS 2015
8	Reliability of High Power LEDs: from gradual to catastrophic failure	2015	MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; DE SANTI, CARLO ; BUFFOLO, MATTEO ; Munaretto, A.; BARBISAN, DIEGO ; FERRETTI, MARCO ; TRIVELLIN, NICOLA ; DAL LAGO, MATTEO		Proceedings of the 5th International LED professional Symposium, LpS 2015
9	Reliability of blue-emitting Eu2+-doped phosphors for laser-lighting applications	2018	BUFFOLO, MATTEO ; DE SANTI, CARLO ; ALBERTINI, MARCO ; CARBONERA, DONATELLA ; RIZZI, GIAN-ANDREA ; GRANOZZI, GAETANO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; MENEGHINI, MATTEO	MATERIALS
10	Performances and reliability analysis of 280nm High Power DUV LEDs	2018	TRIVELLIN, NICOLA ; MONTI, DESIREE ; BUFFOLO, MATTEO ; DE SANTI, CARLO ; MENEGHINI, MATTEO ; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO		Proceedings of the 2018 International Workshop on Nitride Semiconductors (IWN 2018)
11	Mid-power LEDs for lighting applications: degradation mechanisms and kinetics	2015	BUFFOLO, MATTEO ; DE SANTI, CARLO ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		Proceedings of the 39th Workshop on Compound Semiconductor Devices and Integrated Circuits WOCSDICE 2015
12	Long-term degradation mechanisms of mid-power LEDs for lighting applications	2015	BUFFOLO, MATTEO ; DE SANTI, CARLO ; MENEGHINI, MATTEO ; Rigon, D.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY
13	Laser-based lighting: Experimental analysis and perspectives	2017	TRIVELLIN, NICOLA ; YUSHCHENKO, MAKSYM ; BUFFOLO, MATTEO ; DE SANTI, CARLO ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MATERIALS
14	Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress	2017	DE SANTI, CARLO ; MENEGHINI, MATTEO ; RENSO, NICOLA ; BUFFOLO, MATTEO ; TRIVELLIN, NICOLA ; Mura, Giovanna; Vanzi, Massimo; Migliori, Andrea; Morandi, Vittorio; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING	Proceedings of SPIE - The International Society for Optical Engineering
15	Failures of LEDs in Real-World Applications: A Review	2018	TRIVELLIN, NICOLA ; MENEGHINI, MATTEO ; BUFFOLO, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
16	Failure of high power LEDs submitted to EOS: Dependence on device layout and pulse properties	2017	BUFFOLO, MATTEO ; MENEGHINI, MATTEO ; Munaretto, Andrea; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
17	Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress	2018	RENSO, NICOLA ; BUFFOLO, MATTEO ; DE SANTI, CARLO ; Ronzani, M.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; MENEGHINI, MATTEO	MICROELECTRONICS RELIABILITY
18	Failure causes and mechanisms of retrofit LED lamps	2015	DE SANTI, CARLO ; DAL LAGO, MATTEO ; BUFFOLO, MATTEO ; MONTI, DESIREE ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY
19	Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs	2016	BUFFOLO, MATTEO ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; FELBER, HENRY ; RENSO, NICOLA ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY
20	Experimental Demonstration of Time-Dependent Breakdown in GaN-Based Light Emitting Diodes	2016	DE SANTI, CARLO ; MENEGHINI, MATTEO ; BUFFOLO, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	IEEE ELECTRON DEVICE LETTERS

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BUFFOLO, MATTEO