BUFFOLO, MATTEO

BUFFOLO, MATTEO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 78 (tempo di esecuzione: 0.069 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Serie Titolo libro
Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage 2014 DE SANTI, CARLOMENEGHINI, MATTEOMARIOLI, MICHAEL SIMONEBUFFOLO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Analysis of the mechanisms limiting the reliability of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - 2015 IEEE 1st International Forum on Research and Technologies for Society and Industry, RTSI 2015 - Proceedings
Reliability of High Power LEDs: from gradual to catastrophic failure 2015 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICODE SANTI, CARLOBUFFOLO, MATTEOBARBISAN, DIEGOFERRETTI, MARCOTRIVELLIN, NICOLADAL LAGO, MATTEO + - - Proceedings of the 5th International LED professional Symposium, LpS 2015
Mid-power LEDs for lighting applications: degradation mechanisms and kinetics 2015 BUFFOLO, MATTEODE SANTI, CARLOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proceedings of the 39th Workshop on Compound Semiconductor Devices and Integrated Circuits WOCSDICE 2015
SSL Solutions for Human Centric Lighting 2015 TRIVELLIN, NICOLAMENEGHINI, MATTEOBARBISAN, DIEGOFERRETTI, MARCODAL LAGO, MATTEODE SANTI, CARLOBUFFOLO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proceedings of the 5th International LED professional Symposium, LpS 2015
Failure causes and mechanisms of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMONTI, DESIREEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
High-Temperature Reliability of Retrofit LED Bulbs 2015 M. Dal LagoM. BuffoloC. De SantiN. TrivellinM. MeneghiniG. MeneghessoE. Zanoni - - Proceedings of the 5th International LED professional Symposium, LpS 2015
Long-term degradation mechanisms of mid-power LEDs for lighting applications 2015 BUFFOLO, MATTEODE SANTI, CARLOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Towards high reliability GaN LEDs: Understanding the physical origin of gradual and catastrophic failure 2015 MENEGHINI, MATTEODE SANTI, CARLOBUFFOLO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. of 12th China International Forum on Solid State Lighting, SSLCHINA 2015
Time-Dependent Breakdown in GaN-Based LEDs—Description and Physical Origin 2016 DE SANTI, CARLOMENEGHINI, MATTEOBUFFOLO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - International Workshop on Nitride Semiconductors IWN2016
EOS-related failures of modern high-brightness white LEDs: failure limits and correlation with device structure 2016 BUFFOLO, MATTEOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proceedings of the 15th International Symposium on the Science and Technology of Lighting LS15
Electrical overstress robustness of latest generation LEDs for general lighting 2016 BUFFOLO, MATTEOTRIVELLIN, NICOLAMENEGHINI, MATTEOBARBISAN, DIEGOFERRETTI, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proc. of LED Professional Symposium LpS 2016
Aging behavior, reliability, and failure physics of GaN-based optoelectronic components 2016 ZANONI, ENRICOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIODE SANTI, CARLOLA GRASSA, MARCOBUFFOLO, MATTEOTRIVELLIN, NICOLAMONTI, DESIREE - - Proc. SPIE 9768, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX
Reliability of mid-power LEDs for lighting applications 2016 M. BuffoloC. De SantiM. MeneghiniG. MeneghessoE. Zanoni - - Proceedings of FOTONICA 2016
Experimental Demonstration of Time-Dependent Breakdown in GaN-Based Light Emitting Diodes 2016 DE SANTI, CARLOMENEGHINI, MATTEOBUFFOLO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE ELECTRON DEVICE LETTERS - -
LED lighting: nuove piattaforme tecnologiche per l’illuminazione ad alta efficienza 2016 E. ZanoniN. TrivellinM. MeneghiniG. MeneghessoD. BarbisanC. De SantiM. FerrettiM. Buffolo LUCE E DESIGN - -
Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs 2016 BUFFOLO, MATTEOMENEGHINI, MATTEODE SANTI, CARLOFELBER, HENRYRENSO, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress 2017 De Santi, CarloMeneghini, MatteoRenso, NicolaBuffolo, MatteoTrivellin, NicolaMeneghesso, GaudenzioZanoni, Enrico + PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering
Understanding the degradation processes of GaN based LEDs submitted to extremely high current density 2017 Renso, N.Meneghini, M.Buffolo, M.De Santi, C.Meneghesso, G.Zanoni, E. MICROELECTRONICS RELIABILITY - -
Laser-based lighting: Experimental analysis and perspectives 2017 Trivellin, NicolaYUSHCHENKO, MAKSYMBuffolo, MatteoDe Santi, CarloMeneghini, MatteoMeneghesso, GaudenzioZanoni, Enrico MATERIALS - -