CARIA, ALESSANDRO

CARIA, ALESSANDRO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Avalanche capability and recoverable breakdown walkout in polarization-doped vertical GaN pn diodes 2019 E. FabrisC. De SantiA. CariaG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode 2023 Casu, C.Buffolo, M.Caria, A.Piva, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Breakdown Walkout in Polarization-Doped Vertical GaN Diodes 2019 Fabris E.Meneghesso G.Zanoni E.Meneghini M.De Santi C.Caria A. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Carrier generation and recombination dynamics and reliability of InGaN-based photodetectors for high power densities 2017 C. De SantiM. MeneghiniA. CariaG. MeneghessoE. Zanoni + - - Proceedings of the 12th International Conference on Nitride Semiconductors (ICNS-12)
Challenges for highly reliable GaN-based LEDs 2019 Zanoni E.De Santi C.Trivellin N.Renso N.Buffolo M.Monti D.Caria A.Piva F.Meneghesso G.Meneghini M. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Characterization and C-DLTS analysis of antimony selenide solar cells 2023 Jessica Jazmine Nicole BarrantesCarlo De SantiFrancesco PivaMatteo BuffoloAlessandro CariaNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
Characterization and Modeling of quantum efficiency InGaN-GaN Multi-Quantum Well (MQW) solar cells 2022 M. NicolettoA. CariaC. De SantiM. BuffoloG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of WOCSDICE-EXMATEC 2022, Ponta Delgada, Azores, Portugal
Comparison between Cu(In,Ga)Se2 solar cells with different back contacts submitted to current stress 2022 Caria, ABuffolo, MDe Santi, CTrivellin, NVogrig, DZanoni, EMeneghesso, GMeneghini, M + MICROELECTRONICS RELIABILITY - -
Defect incorporation in In-containing layers and quantum wells: Experimental analysis via deep level profiling and optical spectroscopy 2021 Piva F.De Santi C.Caria A.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics 2022 Buffolo, MRoccato, NPiva, FDe Santi, CCasu, CCaria, AMukherjee, KMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Degradation and recovery of high-periodicity InGaN/GaN MQWs under optical stress in short-circuit condition 2020 Caria A.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs 2021 De Santi C.Caria A.Piva F.Meneghesso G.Zanoni E.Meneghini M. - - Reliability of Semiconductor Lasers and Optoelectronic Devices
Degradation of GaN-based InGaN-GaN MQWs solar cells caused by Thermally-Activated Diffusion 2023 Nicoletto M.Caria A.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance 2023 Caria, ADe Santi, CBuffolo, MNicoletto, MMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation of InGaN-based LEDs: Demonstration of a recombination-dependent defect-generation process 2020 Renso, NDe Santi, CCaria, AMeneghesso, GZanoni, EMeneghini, M + JOURNAL OF APPLIED PHYSICS - -
Degradation of InGaN-based MQW solar cells under 405 nm laser excitation 2017 De Santi, C.Meneghini, M.CARIA, ALESSANDROZanoni, E.Meneghesso, G. + MICROELECTRONICS RELIABILITY - -
Degradation of InGaN-based optoelectronic devices under electrical and optical stress 2018 C. De SantiM. MeneghiniA. CariaN. RensoE. ZanoniG. Meneghesso + - - Proceedings of the 50th Annual Meeting of the Associazione Società Italiana di Elettronica (SIE 2018)
Degradation of InGaN-based solar cells under monochromatic photoexcitation 2017 C. De SantiM. MeneghiniA. CariaG. MeneghessoE. Zanoni + - - Proceedings of the Compound Semiconductor Week 2017
Degradation processes and origin in InGaN-based high-power photodetectors 2018 De Santi, CarloMeneghini, M.CARIA, ALESSANDROMEDJDOUB, FARIDZanoni, E.Meneghesso, G. + PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering