CARIA, ALESSANDRO
CARIA, ALESSANDRO
Dipartimento di Ingegneria dell'Informazione - DEI
Carrier generation and recombination dynamics and reliability of InGaN-based photodetectors for high power densities
2017 De Santi, C.; Meneghini, M.; Caria, A.; Dogmus, E.; Zegaoui, M.; Medjdoub, F.; Meneghesso, G.; Zanoni, E.
Degradation of InGaN-based solar cells under monochromatic photoexcitation
2017 De Santi, C.; Meneghini, M.; Dogmus, E.; Zegaoui, M.; Medjdoub, F.; Caria, A.; Meneghesso, G.; Zanoni, E.
Degradation of InGaN-based MQW solar cells under 405 nm laser excitation
2017 De Santi, C.; Meneghini, M.; Caria, Alessandro; Dogmus, E.; Zegaoui, M.; Medjdoub, F.; Zanoni, E.; Meneghesso, G.
Degradation processes and origin in InGaN-based high-power photodetectors
2018 De Santi, Carlo; Meneghini, M.; Caria, Alessandro; Dogmus, E.; Zegaoui, M.; Medjdoub, Farid; Zanoni, E.; Meneghesso, G.
Degradation of InGaN-based optoelectronic devices under electrical and optical stress
2018 De Santi, C.; Meneghini, M.; Caria, A.; Renso, N.; Dogmus, E.; Zegaoui, M.; Medjdoub, F.; Zanoni, E.; Meneghesso, G.
Evidence for recombination-induced degradation processes in InGaN-based optoelectronic devices
2018 De Santi, C.; Meneghini, M.; Caria, Alessandro; Renso, N.; Dogmus, E.; Zegaoui, M.; Medjdoub, Farid; Zanoni, E.; Meneghesso, G.
Electrically- and Optically-driven Degradation Processes in InGaN-based Photodetectors
2018 De Santi, C.; Meneghini, M.; Caria, A.; Renso, N.; Dogmus, E.; Zegaoui, M.; Medjdoub, F.; Zanoni, E.; Meneghesso, G.
GaN-based laser wireless power transfer system
2018 De Santi, Carlo; Meneghini, Matteo; Caria, Alessandro; Dogmus, Ezgi; Zegaoui, Malek; Medjdoub, Farid; Kalinic, Boris; Cesca, Tiziana; Meneghesso, Gaudenzio; Zanoni, Enrico
Evidence of optically induced degradation in gallium nitride optoelectronic devices
2018 De Santi, Carlo; Caria, Alessandro; Renso, Nicola; Dogmus, Ezgi; Zegaoui, Malek; Medjdoub, Farid; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Challenges for highly reliable GaN-based LEDs
2019 Zanoni, E.; De Santi, C.; Trivellin, N.; Renso, N.; Buffolo, M.; Monti, D.; Caria, A.; Piva, F.; Meneghesso, G.; Meneghini, M.
Photon-driven degradation processes in GaN-based optoelectronic devices
2019 De Santi, C.; Caria, A.; Renso, N.; Dogmus, E.; Zegaoui, M.; Medjdoub, F.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Avalanche capability and recoverable breakdown walkout in polarization-doped vertical GaN pn diodes
2019 Fabris, E.; De Santi, C.; Caria, A.; Nomoto, K.; Hu, Z.; Li, W.; Gao, X.; Jena, D.; Xing, H. G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Breakdown Walkout in Polarization-Doped Vertical GaN Diodes
2019 Fabris, E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.; De Santi, C.; Caria, A.; Nomoto, K.; Hu, Z.; Li, W.; Gao, X.; Jena, D.; Xing, H. G.
GaN-based high-periodicity multiple quantum well solar cells: Degradation under optical and electrical stress
2020 Caria, A.; De Santi, C.; Zamperetti, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Neviani, A.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction
2020 Fabris, Elena; De Santi, Carlo; Caria, Alessandro; Mukherjee, Kalparupa; Nomoto, Kazuki; Hu, Zongyang; Li, Wenshen; Gao, Xiang; Marchand, Hugues; Jena, Debdeep; Xing, Huili Grace; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Degradation and recovery of high-periodicity InGaN/GaN MQWs under optical stress in short-circuit condition
2020 Caria, A.; De Santi, C.; Zamperetti, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Degradation of InGaN-based LEDs: Demonstration of a recombination-dependent defect-generation process
2020 Renso, N; De Santi, C; Caria, A; Dalla Torre, F; Zecchin, L; Meneghesso, G; Zanoni, E; Meneghini, M
Trapping and Detrapping Mechanisms in β-GaO Vertical FinFETs Investigated by Electro-Optical Measurements
2020 Fabris, E.; De Santi, C.; Caria, A.; Li, W.; Nomoto, K.; Hu, Z.; Jena, D.; Xing, H. G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Excitation intensity and temperature-dependent performance of ingan/gan multiple quantum wells photodetectors
2020 Caria, A.; De Santi, C.; Dogmus, E.; Medjdoub, F.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
Dependence of degradation on InGaN quantum well position: A study based on color coded structures
2020 Caria, A.; Renso, N.; De Santi, C.; Dalla Torre, F.; Zecchin, L.; Meneghesso, G.; Zanoni, E.; Meneghini, M.