DANESIN, FRANCESCA

DANESIN, FRANCESCA  

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Risultati 1 - 7 di 7 (tempo di esecuzione: 0.013 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Characterization and Analysis of Trap-Related Effects in AlGaN-GaN HEMTs 2007 DANESIN, FRANCESCARAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Degradation induced by 2-MeV alpha particles on AlGaN/GaN High Electron Mobility Transistors 2006 DANESIN, FRANCESCAZANON, FRANCOGERARDIN, SIMONERAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICOPACCAGNELLA, ALESSANDRO MICROELECTRONICS RELIABILITY - -
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields 2008 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANON, FRANCODANESIN, FRANCESCAZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing 2009 ZANONI, ENRICODANESIN, FRANCESCAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIO + IEEE ELECTRON DEVICE LETTERS - -
Mechanisms of RF current collapse in AlGaN-GaN high electron mobility transistors 2008 DANESIN, FRANCESCAMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives 2008 MENEGHESSO, GAUDENZIODANESIN, FRANCESCARAMPAZZO, FABIANAZANON, FRANCOTAZZOLI, AUGUSTOMENEGHINI, MATTEOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Thermal storage effects on AlGaN/GaN HEMT 2008 DANESIN, FRANCESCATAZZOLI, AUGUSTOZANON, FRANCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -