VACCARI, SIMONE

VACCARI, SIMONE  

Risultati 1 - 18 di 18 (tempo di esecuzione: 0.03 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Serie Titolo libro
Degradation analysis of Violet high power LEDs 2010 TRIVELLIN, NICOLAMENEGHINI, MATTEODE SANTI, CARLOVACCARI, SIMONEZANONI, ENRICOMENEGHESSO, GAUDENZIO - - HETECH 2010
Extensive electroluminescence analysis of InGaN-based Light-Emitting Diodes: temperature and current-dependent effects 2011 VACCARI, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 20th European Heterostructure Technology meeting (HeTech 2011)
Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency 2011 TRIVELLIN, NICOLAMENEGHINI, MATTEODE SANTI, CARLOVACCARI, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Current and temperature dependence of electroluminescence in InGaN-based LEDs with multi-wavelength emission 2012 VACCARI, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - ISSLED 2012 9th International Symposium on, Semiconductor Light Emitting Devices
Extensive Study Of Luminescence Processes Related To Localized Defects In InGaN-Based Light Emitting Diodes 2012 VACCARI, SIMONEMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Electroluminescence analysis and simulation of the effects of injection and temperature on carrier distribution in InGaN-based LEDs with color-coded quantum wells 2012 MENEGHINI, MATTEOVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - IWN2012 International Workshop on Nitride Semiconductors
Electrical, spectral and thermal analysis of yellow luminescent dots in InGaN green LEDs 2012 TRIVELLIN, NICOLAMENEGHINI, MATTEOVACCARI, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - IWN2012 International Workshop on Nitride Semiconductors
Analysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs 2012 MENEGHINI, MATTEOVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Electroluminescence Analysis and Simulation of the Effects of Injection and Temperature on Carrier Distribution in InGaN-Based Light-Emitting Diodes with Color-Coded Quantum Wells 2013 MENEGHINI, MATTEOVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + JAPANESE JOURNAL OF APPLIED PHYSICS. PART 1, REGULAR PAPERS & SHORT NOTES - -
A combined µ-Cathodoluminescence and µ-Photoluminescence Investigation of the Degradation of InGaN/GaN Laser Diodes 2013 MENEGHINI, MATTEOCARRARO, SIMONEVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 10th International Conference on Nitride Semiconductors (online abstract)
Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes 2013 DE SANTI, CARLOMENEGHINI, MATTEOCARRARO, SIMONEVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
ESD characterization of multi-chip RGB LEDs 2013 VACCARI, SIMONEMENEGHINI, MATTEOBARBISAN, DAVIDEBARBATO, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
SRH non-radiative recombination in GaN-based LEDs: a study based on lifetime and DLTS measurements 2014 LA GRASSA, MARCOMENEGHINI, MATTEOVACCARI, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. of 38th Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2014
Analysis of the deep levels related to non-radiative recombination in GaN-on-Si LEDs: a study based on deep level transient spectroscopy 2014 MENEGHINI, MATTEOLA GRASSA, MARCOVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. of the International Workshop on Nitride Semiconductors IWN-2014
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements 2014 MENEGHINI, MATTEOVACCARI, SIMONEDAL LAGO, MATTEOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Characterization of the deep levels responsible for non-radiative recombination in InGaN/GaN light-emitting diodes 2014 MENEGHINI, MATTEOLA GRASSA, MARCOVACCARI, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + APPLIED PHYSICS LETTERS - -
Analysis of defects and physical mechanisms that limit the ESD robustness of Light Emitting Diodes 2014 Vaccari, Simone - - -
Anastomotic leak following oesophagectomy: research priorities from an international Delphi consensus study 2021 Bekele, ABennett, JBernardi, DCiprian, BKelly, MMigliore, MRahman, SSaadeh, LVaccari, SValmasoni, MVickers, J + BRITISH JOURNAL OF SURGERY - -