PIEROBON, ROBERTO

PIEROBON, ROBERTO  

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Titolo Data di pubblicazione Autore(i) Rivista Serie Titolo libro
Characterization of Schottky SiC Diodes for Power Applications 2001 PIEROBON, ROBERTOBUSO, SIMONECITRON, MASSIMILIANOMENEGHESSO, GAUDENZIOSPIAZZI, GIORGIOZANONI, ENRICO - - Proceedings of HETEC 2001
Schottky SiC Diodes in Power Switching Applications 2002 PIEROBON, ROBERTOBUSO, SIMONECITRON, MASSIMILIANOMENEGHESSO, GAUDENZIOSPIAZZI, GIORGIOZANONI, ENRICO - - Proc. of III Silicon Workshop
Performance evaluation of a Shottcky SiC power diode in a boost PFC application 2002 Spiazzi G.Buso S.Corradin M.Pierobon R. - - PESC Record - IEEE Annual Power Electronics Specialists Conference
Schottky SiC Diodes in Power Applications 2002 PIEROBON, ROBERTOMENEGHESSO, GAUDENZIOBUSO, SIMONECITRON, MASSIMILIANOSPIAZZI, GIORGIOZANONI, ENRICO - - Proceedings of the II WORKSHOP SiC
Degradation mechanisms of GaN-based LEDs after accelerated DC current aging 2002 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
Experimental/Numerical Investigation on Current Collapse in AlGaN/GaN HEMT's 2002 PIEROBON, ROBERTORAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOCHINI, ALESSANDROBUTTARI, DARIOZANONI, ENRICO + - - -
Reliability analysis of Gan-Based LEDs for solid state illumination 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
Reliability aspects of GaN microwave devices 2003 MENEGHESSO, GAUDENZIOPIEROBON, ROBERTORAMPAZZO, FABIANACHINI, ALESSANDROZANONI, ENRICO + - - -
Performance Evaluation of a Schottky SiC Power Diode in a Boost PFC Application 2003 SPIAZZI, GIORGIOBUSO, SIMONEPIEROBON, ROBERTO + IEEE TRANSACTIONS ON POWER ELECTRONICS - -
Current Collapse in AlGaN/GaN HEMT's analyzed by means of 2D device simulation 2003 MENEGHESSO, GAUDENZIOPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
RF Frequency dispersion and frequency dependence of breakdown phenomena in InAlAs/InGaAs/InP HEMTs 2003 PIEROBON, ROBERTORAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Frequency transconductance and Gate-Lag dispersion in InAlAs/InGaAs/InP HEMTs 2003 MENEGHESSO, GAUDENZIORAMPAZZO, FABIANAPIEROBON, ROBERTOZANONI, ENRICO + - - -
Defect diagnostics of degradation mechanisms of GaN-based LEDs after accelerated DC current ageing 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
Reliability analysis of GaN-Based LEDs for solid state illumination 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS, COMMUNICATIONS AND COMPUTER SCIENCES - -
Instabilities and degradation in GaN-based devices 2003 MENEGHESSO, GAUDENZIOPIEROBON, ROBERTORAMPAZZO, FABIANACHINI, ALESSANDROZANONI, ENRICO + - - -
Reliability aspects of GaN microwave devices 2004 MENEGHESSO, GAUDENZIOPIEROBON, ROBERTORAMPAZZO, FABIANACHINI, ALESSANDROZANONI, ENRICO + - - -
Unpassivated GaN/AlGaN/GaN HEMTs with very low DC to RF drain current dispersion 2004 PIEROBON, ROBERTORAMPAZZO, FABIANACORRADINI, LUCAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Study of breakdown dynamics in InAlAs/InGaAs/InP HEMTs with gate length scaling down to 80 nm 2004 PIEROBON, ROBERTORAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Hot carrier aging degradation phenomena in GaN based MESFETs 2004 RAMPAZZO, FABIANAPIEROBON, ROBERTOPACETTA, DOMENICOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Surface Related Drain Current Dispersion Effects in AlGaN/GaN HEMTs 2004 MENEGHESSO, GAUDENZIOPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -