LEVADA, SIMONE

LEVADA, SIMONE  

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Risultati 1 - 20 di 20 (tempo di esecuzione: 0.034 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Failure modes and mechanisms of DC-aged GaN LEDs 2002 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICOZANONI, ENRICO + PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH - -
Degradation mechanisms of GaN-based LEDs after accelerated DC current aging 2002 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
Reliability analysis of Gan-Based LEDs for solid state illumination 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
Defect diagnostics of degradation mechanisms of GaN-based LEDs after accelerated DC current ageing 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + - - -
Reliability analysis of GaN-Based LEDs for solid state illumination 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEPIEROBON, ROBERTORAMPAZZO, FABIANAZANONI, ENRICO + IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS, COMMUNICATIONS AND COMPUTER SCIENCES - -
Luminescence properties of GaN LEDs after DC-aging 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICO + - - -
Reliability of visible GaN LEDs in plastic package 2003 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Failure Mechanisms of GaN-based LEDs related with instabilities in Doping Profile and Deep Levels 2004 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICO + - - -
Characterization of power LEDs for general lighting application 2004 LEVADA, SIMONEMENEGHESSO, GAUDENZIOSPIAZZI, GIORGIOBUSO, SIMONEFIORENTIN, PIETROZANONI, ENRICO + - - -
Optical evidence of an electrothermal degradation of InGaN-based light-emitting diodes during electrical stress 2004 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICO + APPLIED PHYSICS LETTERS - -
Reliability of GaN-based LEDs 2004 MENEGHESSO, GAUDENZIOLEVADA, SIMONEMENEGHINI, MATTEOZANONI, ENRICO - - -
Degradation effects in InGaN/GaN light emitting diodes 2004 LEVADA, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
The role of Mg complexes in the degradation of InGaN-based LEDs 2004 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICO + SUPERLATTICES AND MICROSTRUCTURES - -
Study of short-term instabilities in InGaN/GaN light-emitting diodes by means of capacitance voltage measurements and deep-level transient spectroscopy 2004 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOLEVADA, SIMONEZANONI, ENRICO + - - -
Factors limiting the High Brightness InGaN LEDs performance at high injection current bias 2005 LEVADA, SIMONEMENEGHINI, MATTEOTAZZOLI, AUGUSTOBUSO, SIMONESPIAZZI, GIORGIOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Analysis of DC Current Accelerated Life Tests of GaN LEDs Using a Weibull-Based Statistical Model 2005 LEVADA, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Failure mechanisms of gallium nitride LEDs related with passivation 2005 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOLEVADA, SIMONEMENEGHESSO, GAUDENZIOTAMIAZZO, GIANLUCAZANONI, ENRICO + - - -
Accelerated aging of GaN light emitting diodes studied by 1/f and RTS noise 2005 MENEGHESSO, GAUDENZIOLEVADA, SIMONEZANONI, ENRICO + - - -
Short-term instabilities of InGaN/GaN light-emitting diodes by capacitance-voltage characteristics and junction spectroscopy 2005 MENEGHINI, MATTEOLEVADA, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + PHYSICA STATUS SOLIDI C - -
Role of deep levels in DC current aging of GaN/InGaN Light-Emitting Diodes studied by Capacitance and Photocurrent Spectroscopy 2005 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOLEVADA, SIMONEZANONI, ENRICO + - - -