MONTI, DESIREE

MONTI, DESIREE  

Università di Padova  

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Risultati 1 - 20 di 25 (tempo di esecuzione: 0.055 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Aging behavior, reliability, and failure physics of GaN-based optoelectronic components 2016 ZANONI, ENRICOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIODE SANTI, CARLOLA GRASSA, MARCOBUFFOLO, MATTEOTRIVELLIN, NICOLAMONTI, DESIREE - - Proc. SPIE 9768, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX
Analysis of degradation processes of UV‐A light emitting diodes stressed at constant current 2016 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proc. of 40th WOCSDICE ‐ Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe
Challenges for highly reliable GaN-based LEDs 2019 Zanoni E.De Santi C.Trivellin N.Renso N.Buffolo M.Monti D.Caria A.Piva F.Meneghesso G.Meneghini M. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Changes in circulating B cells and immunoglobulin classes and subclasses in a healthy aged population 1992 Fagiolo U.Ortolani C.Cozzi E.Monti D. + CLINICAL AND EXPERIMENTAL IMMUNOLOGY - -
Current induced degradation study on state of the art DUV LEDs 2018 Trivellin, N.Monti, D.De Santi, C.Buffolo, M.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Defect generation during constant current stress of InGaN laser diodes 2017 Desiree MontiMatteo MeneghiniCarlo De SantiGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the Compound Semiconductor Week 2017
Defect generation in deep-UV AlGaN-based LEDs investigated by electrical and spectroscopic characterisation 2017 Monti, DesireeMeneghini, MatteoDe Santi, CarloMeneghesso, GaudenzioZanoni, Enrico + PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering
Defect-generation and diffusion in (In)AlGaN-based UV-B LEDs submitted to constant current stress 2018 Monti, D.Meneghini, M.De Santi, C.DA RUOS, SILVIAMeneghesso, G.Zanoni, E. + PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering
Defect-related degradation in InGaN laser diodes 2017 Desiree MontiMatteo MeneghiniCarlo De SantiGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the 19th Convegno Italiano delle Tecnologie Fotoniche (FOTONICA2017)
Defect-Related Degradation of AlGaN-Based UV-B LEDs 2017 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions 2016 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Degradation processes of 280 nm high power DUV LEDs: Impact on parasitic luminescence 2019 Trivellin N.Monti D.Piva F.Buffolo M.De Santi C.Zanoni E.Meneghesso G.Meneghini M. JAPANESE JOURNAL OF APPLIED PHYSICS - -
Demonstration of band-to-band tunneling and avalanche regime in InGaN LEDs 2019 N. RensoC. De SantiP. DalapatiD. MontiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Evidence for avalanche generation in reverse-biased InGaN LEDs 2019 Renso N.De Santi C.Dalapati P.Monti D.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Failure causes and mechanisms of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMONTI, DESIREEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
High-Current Stress of UV-B (In)AlGaN-Based LEDs: Defect-Generation and Diffusion Processes 2019 Monti D.De Santi C.DA RUOS, SARAPIVA, FRANCESCOMeneghesso G.Zanoni E.Meneghini M. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes 2018 Monti, D.Meneghini, M.De Santi, C.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Increased cytokine production in mononuclear cells of healthy elderly people 1993 Fagiolo U.Ortolani C.Cozzi E.Monti D. + EUROPEAN JOURNAL OF IMMUNOLOGY - -
Investigation of the Thermal Droop in InGaN-based Layers and UVA LEDs 2018 C. De SantiM. MeneghiniD. MontiG. MeneghessoE. Zanoni + - - Proceedings of the 2018 International Symposium on Growth of III-Nitrides (ISGN-7)
Long-term degradation of InGaN-based laser diodes: Role of defects 2017 Monti, D.Meneghini, M.De Santi, C.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -