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MONTI, DESIREE

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Pubblicazioni (Tutti)

Risultati 1 - 19 di 19 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autori	Rivista	Serie	Titolo libro
1	Reliability of Ultraviolet Light-Emitting Diodes	2019	DE SANTI, CARLO ; MONTI, DESIREE ; Dalapati, Pradip ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Solid State Lighting Technology and Application Series
2	Challenges for highly reliable GaN-based LEDs	2019	ZANONI, ENRICO ; DE SANTI, CARLO ; TRIVELLIN, NICOLA ; RENSO, NICOLA ; BUFFOLO, MATTEO ; MONTI, DESIREE ; CARIA, ALESSANDRO ; PIVA, FRANCESCO ; MENEGHESSO, GAUDENZIO ; MENEGHINI, MATTEO		PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING	Proceedings of SPIE - The International Society for Optical Engineering
3	Evidence for avalanche generation in reverse-biased InGaN LEDs	2019	RENSO, NICOLA ; DE SANTI, CARLO ; Dalapati, Pradip ; MONTI, DESIREE ; Binder M.; Galler B.; Zeisel R.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; MENEGHINI, MATTEO		PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING	Proceedings of SPIE - The International Society for Optical Engineering
4	High-Current Stress of UV-B (In)AlGaN-Based LEDs: Defect-Generation and Diffusion Processes	2019	MONTI, DESIREE ; DE SANTI, CARLO ; DA RUOS, SARA ; PIVA, FRANCESCO ; Glaab J.; Rass J.; Einfeldt S.; Mehnke F.; Enslin J.; Wernicke T.; Kneissl M.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; MENEGHINI, MATTEO	IEEE TRANSACTIONS ON ELECTRON DEVICES
5	Defect-generation and diffusion in (In)AlGaN-based UV-B LEDs submitted to constant current stress	2018	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; DA RUOS, SILVIA ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; Glaab, J.; Rass, J.; Einfeldt, S.; Mehnke, F.; Enslin, J.; Wernicke, T.; Kneissl, M.	PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING		Proceedings of SPIE - The International Society for Optical Engineering
6	Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes	2018	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; Bojarska, A.; Perlin, P.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY
7	Current induced degradation study on state of the art DUV LEDs	2018	TRIVELLIN, NICOLA ; MONTI, DESIREE ; DE SANTI, CARLO ; BUFFOLO, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; MENEGHINI, MATTEO	MICROELECTRONICS RELIABILITY
8	Investigation of the Thermal Droop in InGaN-based Layers and UVA LEDs	2018	DE SANTI, CARLO ; MENEGHINI, MATTEO ; MONTI, DESIREE ; H. Koch; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Proceedings of the 2018 International Symposium on Growth of III-Nitrides (ISGN-7)
9	Performances and reliability analysis of 280nm High Power DUV LEDs	2018	TRIVELLIN, NICOLA ; MONTI, DESIREE ; BUFFOLO, MATTEO ; DE SANTI, CARLO ; MENEGHINI, MATTEO ; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO			Proceedings of the 2018 International Workshop on Nitride Semiconductors (IWN 2018)
10	Recombination mechanisms and thermal droop in ALGaN-based UV-B LEDs	2017	DE SANTI, CARLO ; MENEGHINI, MATTEO ; MONTI, DESIREE ; Glaab, Johannes; Guttmann, Martin; Rass, Jens; Einfeldt, Sven; Mehnke, Frank; Enslin, Johannes; Wernicke, Tim; Kneissl, Michael; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	PHOTONICS RESEARCH
11	Long-term degradation of InGaN-based laser diodes: Role of defects	2017	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; Bojarska, A.; Perlin, P.	MICROELECTRONICS RELIABILITY
12	Defect generation in deep-UV AlGaN-based LEDs investigated by electrical and spectroscopic characterisation	2017	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; Glaab, Johannes; Rass, Jens; Einfeldt, Sven; Mehnke, Frank; Wernicke, Tim; Kneissl, Michael	PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING		Proceedings of SPIE - The International Society for Optical Engineering
13	Defect-Related Degradation of AlGaN-Based UV-B LEDs	2017	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; Glaab, Johannes; Rass, Jens; Einfeldt, Sven; Mehnke, Frank; Enslin, Johannes; Wernicke, Tim; Kneissl, Michael	IEEE TRANSACTIONS ON ELECTRON DEVICES
14	Defect-related degradation in InGaN laser diodes	2017	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; Agata Bojarska; Piotr Perlin			Proceedings of the 19th Convegno Italiano delle Tecnologie Fotoniche (FOTONICA2017)
15	Defect generation during constant current stress of InGaN laser diodes	2017	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO ; Agata Bojarska; Piotr Perlin			Proceedings of the Compound Semiconductor Week 2017
16	Aging behavior, reliability, and failure physics of GaN-based optoelectronic components	2016	ZANONI, ENRICO ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; DE SANTI, CARLO ; LA GRASSA, MARCO ; BUFFOLO, MATTEO ; TRIVELLIN, NICOLA ; MONTI, DESIREE			Proc. SPIE 9768, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX
17	Analysis of degradation processes of UV‐A light emitting diodes stressed at constant current	2016	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Proc. of 40th WOCSDICE ‐ Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe
18	Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions	2016	MONTI, DESIREE ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
19	Failure causes and mechanisms of retrofit LED lamps	2015	DE SANTI, CARLO ; DAL LAGO, MATTEO ; BUFFOLO, MATTEO ; MONTI, DESIREE ; MENEGHINI, MATTEO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	MICROELECTRONICS RELIABILITY

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MONTI, DESIREE

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Università di Padova