DAL LAGO, MATTEO

DAL LAGO, MATTEO  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.029 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Failure causes and mechanisms of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMONTI, DESIREEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
Degradation Mechanisms of High Power LEDs for Lighting Applications: an overview 2014 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements 2014 MENEGHINI, MATTEOVACCARI, SIMONEDAL LAGO, MATTEOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms 2014 DAL LAGO, MATTEOMENEGHINI, MATTEODE SANTI, CARLOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
"Hot-plugging" of LED modules: Electrical characterization and device degradation 2013 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Reliability oriented design of LED-based light sources 2013 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICODAL LAGO, MATTEOTRIVELLIN, NICOLA LED PROFESSIONAL REVIEW - -
Thermally Activated Degradation of Remote Phosphors for Application in LED Lighting 2013 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Chip and package-related degradation of high power white LEDs 2012 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Phosphors for LED-based light sources: Thermal properties and reliability issues 2012 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress 2012 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Degradation mechanisms of high-power white LEDs activated by current and temperature 2011 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -