NICOLETTO, MARCO

NICOLETTO, MARCO  

Università di Padova  

Mostra records
Risultati 1 - 15 di 15 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Characterization and Modeling of quantum efficiency InGaN-GaN Multi-Quantum Well (MQW) solar cells 2022 M. NicolettoA. CariaC. De SantiM. BuffoloG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of WOCSDICE-EXMATEC 2022, Ponta Delgada, Azores, Portugal
Degradation of GaN-based InGaN-GaN MQWs solar cells caused by Thermally-Activated Diffusion 2023 Nicoletto M.Caria A.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance 2023 Caria, ADe Santi, CBuffolo, MNicoletto, MMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Experimental analysis of degradation of Multi-Quantum Well GaN-based solar cells under current stress 2023 Caria A.De Santi C.Nicoletto M.Buffolo M.Chen H.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
GaN-based InGaN/GaN MQWs solar cells for innovative applications: performance and modeling 2023 Marco NicolettoAlessandro CariaCarlo De SantiMatteo BuffoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
GaN-based solar cells degradation kinetics investigated at high temperature under high-intensity 405 nm optical stress 2022 Caria, ADe Santi, CNicoletto, MBuffolo, MMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12001, Gallium Nitride Materials and Devices XVII
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 2024 Nicoletto, MarcoCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING PROCEEDINGS OF SPIE PHOTONICS WEST 2024
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 2023 Nicoletto, MCaria, ARampazzo, FDe Santi, CBuffolo, MMeneghesso, GZanoni, EMeneghini, M + IEEE JOURNAL OF PHOTOVOLTAICS - -
InGaN/GaN Multiple Quantum Wells solar cells: a trade-off in p-GaN thickness, to optimize reliability and quantum efficiency 2023 Marco NicolettoAlessandro CariaCarlo De SantiMatteo BuffoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of WOCSDICE 2023 conference
Modeling the EQE spectral shape of InGaN-GaN Multi-Quantum Wells Solar Cells 2022 A. CariaC. De SantiM. NicolettoM. BuffoloG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride semiconductors
Optically Induced Degradation Due to Thermally Activated Diffusion in GaN-Based InGaN/GaN MQW Solar Cells 2023 Nicoletto, MarcoCaria, AlessandroSanti, Carlo DeBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Quantum efficiency of InGaN-GaN multi-quantum well solar cells: Experimental characterization and modeling 2022 Caria A.Nicoletto M.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Role of p-GaN layer thickness in the degradation of InGaN-GaN MQW solar cells under 405 nm laser excitation 2022 Nicoletto M.Caria A.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
TCAD Modeling and Simulation of Dark Current-Voltage Characteristics in High-Periodicity InGaN/GaN Multiple-Quantum-Wells (MQWs) Solar Cells 2024 Nicoletto, MarcoCaria, AlessandroDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE JOURNAL OF PHOTOVOLTAICS - -
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis 2024 Nicoletto, MarcoCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoGasparotto, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -