MONTI, DESIREE

MONTI, DESIREE  

Università di Padova  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.015 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Changes in circulating B cells and immunoglobulin classes and subclasses in a healthy aged population 1992 Fagiolo U.Ortolani C.Cozzi E.Monti D. + CLINICAL AND EXPERIMENTAL IMMUNOLOGY - -
Current induced degradation study on state of the art DUV LEDs 2018 Trivellin, N.Monti, D.De Santi, C.Buffolo, M.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Defect-Related Degradation of AlGaN-Based UV-B LEDs 2017 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions 2016 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Degradation processes of 280 nm high power DUV LEDs: Impact on parasitic luminescence 2019 Trivellin N.Monti D.Piva F.Buffolo M.De Santi C.Zanoni E.Meneghesso G.Meneghini M. JAPANESE JOURNAL OF APPLIED PHYSICS - -
Failure causes and mechanisms of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMONTI, DESIREEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
High-Current Stress of UV-B (In)AlGaN-Based LEDs: Defect-Generation and Diffusion Processes 2019 Monti D.De Santi C.DA RUOS, SARAPIVA, FRANCESCOMeneghesso G.Zanoni E.Meneghini M. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes 2018 Monti, D.Meneghini, M.De Santi, C.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Increased cytokine production in mononuclear cells of healthy elderly people 1993 Fagiolo U.Ortolani C.Cozzi E.Monti D. + EUROPEAN JOURNAL OF IMMUNOLOGY - -
Long-term degradation of InGaN-based laser diodes: Role of defects 2017 Monti, D.Meneghini, M.De Santi, C.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Recombination mechanisms and thermal droop in ALGaN-based UV-B LEDs 2017 DE SANTI, CARLOMENEGHINI, MATTEOMONTI, DESIREEMENEGHESSO, GAUDENZIOZANONI, ENRICO + PHOTONICS RESEARCH - -