PIVA, FRANCESCO

PIVA, FRANCESCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 26 (tempo di esecuzione: 0.059 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Challenges for highly reliable GaN-based LEDs 2019 Zanoni E.De Santi C.Trivellin N.Renso N.Buffolo M.Monti D.Caria A.Piva F.Meneghesso G.Meneghini M. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Stability and degradation of AlGaN-based UV-B LEDs: Role of doping and semiconductor defects 2019 Piva F.De Santi C.Amano H.Shibata N.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
High-Current Stress of UV-B (In)AlGaN-Based LEDs: Defect-Generation and Diffusion Processes 2019 Monti D.De Santi C.DA RUOS, SARAPIVA, FRANCESCOMeneghesso G.Zanoni E.Meneghini M. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation processes of 280 nm high power DUV LEDs: Impact on parasitic luminescence 2019 Trivellin N.Monti D.Piva F.Buffolo M.De Santi C.Zanoni E.Meneghesso G.Meneghini M. JAPANESE JOURNAL OF APPLIED PHYSICS - -
Modeling the degradation mechanisms of AlGaN-based UV-C LEDs: From injection efficiency to mid-gap state generation 2020 PIVA F.DE SANTI C.AMANO H.MENEGHESSO G.ZANONI E.MENEGHINI M. + PHOTONICS RESEARCH - -
Degradation mechanisms of 1.6 W blue semiconductor lasers: Effect on subthreshold optical power and power spectral density 2020 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Role of defects in the mid-term degradation of UV-B LEDs investigated by optical and DLTS measurements 2020 Piva F.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements 2020 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Effects of quantum-well indium content on deep defects and reliability of InGaN/GaN light-emitting diodes with under layer 2021 Roccato N.Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Defect incorporation in In-containing layers and quantum wells: Experimental analysis via deep level profiling and optical spectroscopy 2021 Piva F.De Santi C.Caria A.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs 2021 De Santi C.Caria A.Piva F.Meneghesso G.Zanoni E.Meneghini M. - - Reliability of Semiconductor Lasers and Optoelectronic Devices
Review on the degradation of GaN-based lateral power transistors 2021 De Santi, C.Buffolo, M.Caria, A.Chiocchetta, F.Favero, D.Fregolent, M.Masin, F.Modolo, N.Nardo, A.Piva, F.Rampazzo, F.Trivellin, N.Gao, Z.Meneghini, M.Zanoni, E.Meneghesso, G. + E-PRIME, ADVANCES IN ELECTRICAL ENGINEERING, ELECTRONICS AND ENERGY - -
Modeling the electrical characteristics of InGaN/GaN LED structures based on experimentally-measured defect characteristics 2021 Roccato N.Piva F.Santi C. D.Mukherjee K.Buffolo M.Verzellesi G.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Decrease in the injection efficiency and generation of midgap states in UV-C LEDs: A model based on rate equations 2021 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE - The International Society for Optical Engineering Volume 11686
Uv-based technologies for sars-cov2 inactivation: Status and perspectives 2021 Trivellin N.Piva F.Fiorimonte D.Buffolo M.De Santi C.Dughiero F.Meneghesso G.Zanoni E.Meneghini M. + ELECTRONICS - -
How does an In-containing underlayer prevent the propagation of defects in InGaN QW LEDs? identification of SRH centers and modeling of trap profile 2021 Piva F.De Santi C.Caria A.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Discriminating the effects of deep-levels in InGaN/GaN LEDs: impact on forward leakage current 2022 M. BuffoloN. RoccatoF. PivaC. De SantiN. GrandjeanG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of E-MRS fall 2022
DLTS-based defect analysis in UV-C single QW LEDs during a constant current stress 2022 F. PivaM. BuffoloC. De SantiN. RoccatoG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of E-MRS fall 2022
Reliability of Commercial UVC LEDs: 2022 State-of-the-Art 2022 Trivellin N.Fiorimonte D.Piva F.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. ELECTRONICS - -
On the performance and reliability of state-of-the-art commercial UV-C LEDs for disinfection purposes 2022 Piva, FFiorimonte, DTrivellin, NDe Santi, CBuffolo, MMeneghesso, GZanoni, EMeneghini, M - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12001, Gallium Nitride Materials and Devices XVII